Sensitivity vs Sensor Resolution

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Lan Shi, David Hadlich, Christopher Soell, Thomas Ussmueller, Robert Weigel, “A Tone Mapping algorithm suited for analog-signal real-time image processing,” 2016 12th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), 2016, pp. 1–4, Art. no. 7519457, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7519457
Fei Wang, Albert J. P. Theuwissen, “Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity,” IEEE Transactions on Circuits and Systems I: Regular Papers, 2019, pp. 930–940, Art. no. 8490722, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8490722
K. Itonaga, T. Arimura, K. Matsumoto, G. Kondo, K. Terahata, S. Makimoto, M. Baba, Y. Honda, S. Bori, T. Kai, K. Kasahara, M. Nagano, M. Kimura, Y. Kinoshita, E. Kishida, T. Baba, S. Baba, Y. Nomura, N. Tanabe, N. Kimizuka, Y. Matoba, T. Takachi, E. Takagi, T. Haruta, N. Ikebe, K. Matsuda, T. Niimi, T. Ezaki, T. Hirayama, “A novel curved CMOS image sensor integrated with imaging system,” 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014, pp. 1–2, Art. no. 6894341, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6894341
Valérian Lalucaa, Vincent Goiffon, Pierre Magnan, Cédric Virmontois, Guy Rolland, Sophie Petit, “Single Event Effects in 4T Pinned Photodiode Image Sensors,” IEEE Transactions on Nuclear Science, 2013, pp. 4314–4322, Art. no. 6678273, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6678273
S. Kleinfelder, Y. Chen, K. Kwiatkowski, A. Shah, “Multi-million frames/s sensor circuits for pulsed-source imaging,” 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515), 2003, pp. 1504–1508 Vol.3, Art. no. 1352162, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1352162
T. Akiyama, A. Tonin, H.R. Hidber, J. Brugger, P. Vittiger, U. Staufer, N.F. De Rooij, “Sensor based on a MOS transistor for applications in scanning force microscopy,” Proceedings IEEE The Tenth Annual International Workshop on Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots, 1997, pp. 141–146, Art. no. 581789, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=581789
Adam Quinn, Manuel B. Valentin, Thomas Zimmerman, Davide Braga, Seda Memik, Farah Fahim, “A Cryogenic Readout IC with 100 KSPS in-Pixel ADC for Skipper CCD-in-CMOS Sensors,” 2023 IEEE International Symposium on Circuits and Systems (ISCAS), 2023, pp. 1–5, Art. no. 10182087, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10182087
Marina E. Plissiti, Christoforos Papaioannou, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas, “An efficient adaptive thresholding scheme for signal decoding in NLOS VLC systems,” 2021 IEEE International Mediterranean Conference on Communications and Networking (MeditCom), 2021, pp. 378–382, Art. no. 9647560, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9647560
V. Goiffon, P. Magnan, P. Martin-Gonthier, C. Virmontois, M. Gaillardin, “Evidence of a Novel Source of Random Telegraph Signal in CMOS Image Sensors,” IEEE Electron Device Letters, 2011, pp. 773–775, Art. no. 5752812, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5752812
M.M. Balas, “Adaptive and fast HDR image sensors - resources of the CMOS multiple exposure,” 2012 8th International Conference on Computing Technology and Information Management (NCM and ICNIT), 2012, pp. 643–647, Art. no. 6268578, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6268578
B. Blanco-Filgueira, P. Lopez, D. Cabello, J. Ernst, H. Neubauer, J. Hauer, “Bottom collection of photodiode-based CMOS APS,” 2008 International Conference on Advanced Semiconductor Devices and Microsystems, 2008, pp. 67–70, Art. no. 4743360, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4743360
Gines Domenech-Asensi, Ramón Ruiz-Merino, Juan Zapata-Perez, José A. Díaz-Madrid, “A 12T SRAM in-Memory Computing differential current architecture for CNN implementations,” 2023 IEEE International Symposium on Circuits and Systems (ISCAS), 2023, pp. 1–5, Art. no. 10181992, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10181992
Pai-Hsiang Hsu, Yueh-Ru Lee, Chia-Hung Chen, Chung-Chih Hung, “A Low-Noise Area-Efficient Column-Parallel ADC With an Input Triplet for a 120-dB High Dynamic Range CMOS Image Sensor,” IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023, pp. 1939–1949, Art. no. 10287277, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10287277
V. Goiffon, C. Virmontois, P. Magnan, P. Cervantes, M. Gaillardin, S. Girard, P. Paillet, P. Martin-Gonthier, “Identification of radiation induced dark current sources in Pinned PhotoDiode CMOS Image Sensors,” 2011 12th European Conference on Radiation and Its Effects on Components and Systems, 2011, pp. 321–328, Art. no. 6131311, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6131311
Bo Kyung Cha, Byoung-Jik Kim, Gyuseong Cho, Sung Chae Jeon, Jun Hyung Bae, Yong Ki Chi, Gyu-Ho Lim, Young-Hee Kim, “A Pixelated CsI (Tl) Scintillator for CMOS-based X-ray Image Sensor,” 2006 IEEE Nuclear Science Symposium Conference Record, 2006, pp. 1139–1143, Art. no. 4179200, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4179200
Guangbin Zhang, Tianhong Yang, S. Gregori, Jin Liu, F. Maloberti, “Ultra-low power motion-triggered image sensor for distributed wireless sensor network,” SENSORS, 2003 IEEE, 2003, pp. 1141–1146 Vol.2, Art. no. 1279123, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1279123
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Jing Gao, Yuchen Gong, Zhiyuan Gao, Kaiming Nie, Jiangtao Xu, “Analytical Modeling of Exposure Process in Pinned Photodiode CMOS Image Sensors,” IEEE Journal of the Electron Devices Society, 2020, pp. 1063–1071, Art. no. 9205305, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9205305
Lan Shi, Martin Berger, Bastian Bier, Christopher Soell, Juergen Roeber, Rebecca Fahrig, Bjoern Eskofier, Andreas Maier, Jennifer Maier, “Analog non-linear transformation-based tone mapping for image enhancement in C-arm CT,” 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), 2016, pp. 1–3, Art. no. 8069490, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8069490
Hoang-Nam Nguyen, An-Chen Lee, “Real Time Tracking Multiple YUV 24-Bit Color Objects with 8-Bit MCU-Based Embedded Vision System,” 2009 Fourth International Conference on Innovative Computing, Information and Control (ICICIC), 2009, pp. 160–164, Art. no. 5412714, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5412714
Wai-Chi Fang, Chiu-Kuo Chen, Ericson Chua, Chih-Chung Fu, Shao-Yen Tseng, Shih Kang, “A low power biomedical signal processing system-on-chip design for portable brain-heart monitoring systems,” The 2010 International Conference on Green Circuits and Systems, 2010, pp. 18–23, Art. no. 5543103, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5543103
Xiang Ma, Ningmei Yu, Yuan Fang, Dongfang Wang, “Research on Single-Frame Super-Resolution Reconstruction Algorithm for Low Resolution Cell Images Based on Convolutional Neural Network,” 2018 IEEE 3rd International Conference on Image, Vision and Computing (ICIVC), 2018, pp. 369–373, Art. no. 8492913, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8492913
Abhinav Bhattacharya, Tusha Tanya, Mukul Sarkar, Boyd Fowler, “RTS Noise Reduction in CMOS Image Sensors Using Correlated Extrema Cancellation,” IEEE Transactions on Electron Devices, 2024, pp. 3050–3055, Art. no. 10466729, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10466729
Yu Jiang, Hao Yu, Xiaojian Fu, Chathuranga Hettiarachchi, He Xu, Ye Li, Tien Hoa Nguyen, Longtao Dong, Cuong Dang, Qing Zhang, “A Nano-Filter-Integrated CMOS Image Sensor for Fluorescent Biomedical Imaging,” 2018 IEEE Biomedical Circuits and Systems Conference (BioCAS), 2018, pp. 1–4, Art. no. 8584706, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8584706
Don Barber, Murali Tummala, John McEachen, “Daylight Noise Baseline for Outdoor Visible Light Communication with CMOS Sensors,” 2024 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2024, pp. 1–2, Art. no. 10676443, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10676443
A. Bermak, “A CMOS imager with PFM/PWM based analog-to-digital converter,” 2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353), 2002, pp. IV–IV, Art. no. 1010386, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1010386
Joseph A. Schmitz, Mahir K. Gharzai, Sina Balkır, Michael W. Hoffman, Daniel J. White, Nathan Schemm, “A 1000 frames/s Vision Chip Using Scalable Pixel-Neighborhood-Level Parallel Processing,” IEEE Journal of Solid-State Circuits, 2017, pp. 556–568, Art. no. 7589062, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7589062
S.K. Mendis, S.E. Kemeny, R.C. Gee, B. Pain, C.O. Staller, Quiesup Kim, E.R. Fossum, “CMOS active pixel image sensors for highly integrated imaging systems,” IEEE Journal of Solid-State Circuits, 1997, pp. 187–197, Art. no. 551910, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=551910
Frank Julca-Aguilar, Jason Taylor, Mario Bijelic, Fahim Mannan, Ethan Tseng, Felix Heide, “Gated3D: Monocular 3D Object Detection From Temporal Illumination Cues,” 2021 IEEE/CVF International Conference on Computer Vision (ICCV), 2021, pp. 2918–2928, Art. no. 9710811, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9710811
Minghao Li, Atal A. S. Gill, Anne Vanhoestenberghe, Sara S. Ghoreishizadeh, “An Integrated Circuit for Galvanostatic Electrodeposition of on-chip Electrochemical Sensors,” 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 2022, pp. 1–4, Art. no. 9970881, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9970881
Majid Zarghami, Leonardo Gasparini, David Stoppa, “Optimal readout schemes in SPAD-based time-correlated event detection sensor for quantum imaging applications,” 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME), 2017, pp. 373–376, Art. no. 7974185, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7974185
M. Esposito, J. Newcombe, K. Wells, “Western blotting electrophoretic sequencing: First images with a room temperature CMOS detector,” 2011 IEEE Nuclear Science Symposium Conference Record, 2011, pp. 2491–2494, Art. no. 6152675, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6152675
Min Liu, Ziteng Cai, Shaohua Zhou, Man-Kay Law, Jian Liu, Jianguo Ma, Nanjian Wu, Liyuan Liu, “A 16.4kPixel 3.08-to-3.86THz Digital Real-Time CMOS Image Sensor with 73dB Dynamic Range,” 2023 IEEE International Solid-State Circuits Conference (ISSCC), 2023, pp. 4–6, Art. no. 10067620, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10067620
Zhouyuan Shi, Martin Brooke, “CMOS Digital Pixel Sensor with Multiple Reference, Multiple Sampling Dynamic Range Enhancement,” 2006 49th IEEE International Midwest Symposium on Circuits and Systems, 2006, pp. 694–697, Art. no. 4267234, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4267234
Ho-Ching Chien, Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, C.S. Wang, Chin-Kung Chang, Yu-Kung Hsiao, “Active pixel image sensor scale down in 0.18 /spl mu/m CMOS technology,” Digest. International Electron Devices Meeting,, 2002, pp. 813–816, Art. no. 1175962, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1175962
Tai-Shan Liao, Chi-Chieh Wu, Chih-Chung Chou, Chi-Hung Hwang, Ya-Wen Tang, Din Ping Tsai, Tzung Yuang Chen, “Simplified algorithm of ionizing radiation detecting based on image sensor,” 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings, 2016, pp. 1–5, Art. no. 7520477, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7520477
T. Nezuka, M. Ikeada, K. Asada, “A smart position sensor with row parallel position detection for high speed 3-D measurement,” Proceedings of the 28th European Solid-State Circuits Conference, 2002, pp. 101–104, Art. no. 1471476, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1471476
V. Goiffon, P. Cervantes, C. Virmontois, F. Corbiere, P. Magnan, M. Estribeau, “Generic Radiation Hardened Photodiode Layouts for Deep Submicron CMOS Image Sensor Processes,” IEEE Transactions on Nuclear Science, 2011, pp. 3076–3084, Art. no. 6078446, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6078446
Mingliang Liang, Xinqiang Wang, “The design of intelligent robot based on embedded system,” The 2011 International Conference on Advanced Mechatronic Systems, 2011, pp. 23–28, Art. no. 6024967, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6024967
Mei Zou, Xun Li, Lirong Liu, Yunfen Wei, Dian Liu, Hao Li, “A Preliminary Study on Multi-Wavelength PPG system Based on Digital CMOS Image Sensor and Color Filter,” BIBE 2024; The 7th International Conference on Biological Information and Biomedical Engineering, 2024, pp. 240–244, Art. no. 10830709, VDE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10830709
Jinchen Wang, Mohamed I. Ibrahim, Isaac B. Harris, Nathan M. Monroe, Muhammad Ibrahim Wasiq Khan, Xiang Yi, Dirk R. Englund, Ruonan Han, “34.1 THz Cryo-CMOS Backscatter Transceiver: A Contactless 4 Kelvin-300 Kelvin Data Interface,” 2023 IEEE International Solid-State Circuits Conference (ISSCC), 2023, pp. 504–506, Art. no. 10067445, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10067445
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Byoung-Soo Choi, Sang-Hwan Kim, Jimin Lee, Seunghyuk Chang, JongHo Park, Sang-Jin Lee, Jang-Kyoo Shin, “Extraction of Disparity Information Using Pixels with Integrated Apertures,” 2018 IEEE International Conference on Imaging Systems and Techniques (IST), 2018, pp. 1–5, Art. no. 8577201, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8577201
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Cheng-Ta Chiang, “A CMOS retinal rotational sensor for clockwise/counterclockwise detecting and velocity measuring,” 2011 IEEE Symposium on Industrial Electronics and Applications, 2011, pp. 124–127, Art. no. 6108681, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6108681
Yong Ki Chi, Gyuseong Cho, Seong Kyu Ahn, Young Soo Kim, “Calculation of detective quantum efficiency for CMOS image sensor coupled with micro-channel plate in low energy X-ray imaging,” IEEE Symposium Conference Record Nuclear Science 2004., 2004, pp. 1657–1661 Vol. 3, Art. no. 1462558, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1462558
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Jean-Marc Belloir, Vincent Goiffon, Cedric Virmontois, Melanie Raine, Philippe Paillet, Pierre Magnan, Olivier Gilard, “Dark Current Spectroscopy on Alpha Irradiated CMOS Image Sensors,” 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2015, pp. 1–4, Art. no. 7365597, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7365597
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Jin-Yi Lin, Kwuang-Han Chang, Chen-Che Kao, Shih-Chin Lo, Yan-Jiun Chen, Pei-Chen Lee, Chi-Hui Chen, Chin Yin, Chih-Cheng Hsieh, “An 8-bit column-shared SAR ADC for CMOS image sensor applications,” 2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2015, pp. 301–304, Art. no. 7168630, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7168630
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Jiaju Ma, Dakota Starkey, Arun Rao, Kofi Odame, Eric R. Fossum, “Characterization of Quanta Image Sensor Pump-Gate Jots With Deep Sub-Electron Read Noise,” IEEE Journal of the Electron Devices Society, 2015, pp. 472–480, Art. no. 7273747, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7273747
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Amandeep Kaur, Deepak Mishra, K. M. Amogh, Mukul Sarkar, “On-Array Compressive Acquisition in CMOS Image Sensors Using Accumulated Spatial Gradients,” IEEE Transactions on Circuits and Systems for Video Technology, 2021, pp. 523–532, Art. no. 9075293, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9075293
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Alexandre Le Roch, Cédric Virmontois, Philippe Paillet, Jean-Marc Belloir, Serena Rizzolo, Olivier Marcelot, Hugo Dewitte, Marco Van Uffelen, Laura Mont Casellas, Pierre Magnan, Vincent Goiffon, “Phosphorus Versus Arsenic: Role of the Photodiode Doping Element in CMOS Image Sensor Radiation-Induced Dark Current and Random Telegraph Signal,” IEEE Transactions on Nuclear Science, 2020, pp. 1241–1250, Art. no. 9120078, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9120078
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Chang-shuai Wang, Sang-woo Ahn, Jong-joo Park, Hwa-soo Woo, Jong-wha Chong, “Improved physical-like virtual color filter for color separation of White-RGB CMOS sensor,” TENCON 2014 - 2014 IEEE Region 10 Conference, 2014, pp. 1–4, Art. no. 7022435, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7022435
Taichi Yoshida, Yusuke Matsushita, Naoki Sakaguchi, Yong-Joon Choi, Kazuhiro Takahashi, Kotaro Takayama, Kazuaki Sawada, Toshihiko Noda, “Development of Plant Growth Monitoring Sensor to Visualize Ion Dynamics in Plants and its Functional Validation in Long-Term Measurements,” 2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers), 2023, pp. 725–728, Art. no. 10516897, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10516897
Kuan-Lin Liu, Chih-Cheng Hsieh, Sheng-Yeh Lai, Chin-Fong Chiu, “A time delay multiple integration linear CMOS image sensor for multispectral satellite telemetry,” 2016 IEEE Asian Solid-State Circuits Conference (A-SSCC), 2016, pp. 37–40, Art. no. 7844129, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7844129
H. Dewitte, S. Rizzolo, P. Paillet, P. Magnan, A. Le Roch, F. Corbière, R. Molina, S. Girard, T. Allanche, C. Muller, H. Desjonqueres, J. -R. Macé, J. -P. Baudu, A. Saravia Flores, V. Goiffon, “Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses,” IEEE Transactions on Nuclear Science, 2020, pp. 1284–1292, Art. no. 9115076, IEEE. Available: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9115076
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