Yield Analysis For A Largearea Analog Xray Sensor Array

• doi: 10.1109/UGIM.1991.148140
• title: Yield analysis for a large-area analog X-ray sensor array
• publisher: IEEE
• isbn: 0-7803-0109-9
• issn: 0749-6877
• rank: 4029
• access_type: LOCKED
• content_type: Conferences
• abstract: A small-scale CMOS-based radiographic X-ray image sensor array has been developed for nondestructive test and medical imaging. The authors present an analysis of tradeoffs between yield and area of a scaled up large-area X-ray sensor design. The X-ray sensor array can tolerate a low level of faults in the individual pixel cells and these faults can be corrected by imaging software. However, global signal line faults cause X-ray sensor failures. This work models X-ray sensor yield in a 12-layer analog CMOS process for three possible overall defect densities, 1.5 defects/cm, 1.0 defects/cm, and 0.75 defects/cm. It is shown that the X-ray sensor is more manufacturable than a charge coupled device (CCD) array of the same area.<>
• article_number: 148140
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=148140
• html_url: https://ieeexplore.ieee.org/document/148140/
• abstract_url: https://ieeexplore.ieee.org/document/148140/
• publication_title: Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium
• conference_location: Melbourne, FL, USA
• conference_dates: 12-14 June 1991
• publication_number: 572
• is_number: 3924
• publication_year: 1991
• publication_date: 12-14 June 1991
• start_page: 149
• end_page: 152
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 55
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Sensor arrays
    • X-ray imaging
    • Image sensors
    • Radiography
    • Medical tests
    • Nondestructive testing
    • Biomedical imaging
    • Pixel
    • Optical imaging
    • Semiconductor device modeling
  • dynamic_index_terms:
    • Sensor Array
    • X-ray Sensor
    • Medical Imaging
    • Clinical Imaging
    • Diagnostic Imaging
    • CCD Camera
    • Charge-coupled Device
    • Defect Density
    • Poisson Distribution
    • Poissonian
    • Yield Losses
    • Metal Layer
    • Fault Location
    • Local Defects
    • Critical Areas
    • Defect Size
    • Yield Estimation
    • Output Estimation
    • Distribution Of Defects
    • Distribution Of Faults
    • Defect Rate
    • Fault Rate
    • Sensor Area
    • Physical Layout
    • Peripheral Circuits
    • Grounding Line
    • Metal Lines
    • Defect Clusters
    • Electrically Short
    • Electrical Short Circuit
• isbn_formats:
  • format: Print ISBN, value: 0-7803-0109-9, isbnType: Historical
• authors:
  • Author Name: W.R. Einsenstadt
    Affiliation: Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
    Author URL: https://ieeexplore.ieee.org/author/37086973052
    ID: 37086973052
    Order: 1
    Author Affiliations:
    • Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
  • Author Name: S.S. Potluri
    Affiliation: Department of Electrical Engineering, University of Florida, Gainesville, FL, USA
    Author URL: https://ieeexplore.ieee.org/author/38227295500
    ID: 38227295500
    Order: 2
    Author Affiliations:
    • Department of Electrical Engineering, University of Florida, Gainesville, FL, USA
  • Author Name: K.J. Rambo
    Affiliation: Department of Electrical Engineering, University of Florida, Gainesville, FL, USA
    Author URL: https://ieeexplore.ieee.org/author/37271770700
    ID: 37271770700
    Order: 3
    Author Affiliations:
    • Department of Electrical Engineering, University of Florida, Gainesville, FL, USA
  • Author Name: R.M. Fox
    Affiliation: Department of Electrical Engineering, University of Florida, Gainesville, FL, USA
    Author URL: https://ieeexplore.ieee.org/author/37270187500
    ID: 37270187500
    Order: 4
    Author Affiliations:
    • Department of Electrical Engineering, University of Florida, Gainesville, FL, USA

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• noise: Includes temporal noise and fixed-pattern noise.

Applications & Benefits

• cell_imaging: Used in medical devices for imaging applications.
• benefits: Enable digital imaging in a variety of applications such as smartphones, medical devices, and automotive systems.

Supporting Organizations

• supported_by: Not specified

Manuscript Details

• publication_date: 12-14 June 1991

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • supported_by
  • publication_date
  • authors

Processed JSON Filename

request_3aaa8ebf-33ae-4b48-8067-3e29b064866b-yield_analysis_for_a_largearea_analog_xray_sensor_array.json