Xray Micrographic Imaging System Based On Cots Cmos Sensors
- doi: 10.1109/CAMTA.2017.8058131
-
title: X-ray micrographic imaging system based on COTS
CMOS sensors
- publisher: IEEE
- isbn: 978-1-5090-6672-8
- issn:
- rank: 4025
- access_type: LOCKED
- content_type: Conferences
-
abstract: This paper presents the use of Commercial Off
The Shelf CMOS image sensors for the acquisition of X-ray images with
high spatial resolution. The X-ray images, with application in biology,
electronic components inspection or paleontology research, are obtained
with 8 keV photons from a Cu tube. The quantum efficiency of the
detector is estimated using attenuation lengths of photons in the
sensor, and compared to traditional scintillator conversion layers.
- article_number: 8058131
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8058131
-
html_url:
https://ieeexplore.ieee.org/document/8058131/
-
abstract_url:
https://ieeexplore.ieee.org/document/8058131/
-
publication_title: 2017 Argentine Conference of
Micro-Nanoelectronics, Technology and Applications (CAMTA)
- conference_location: Buenos Aires, Argentina
- conference_dates: 27-28 July 2017
- publication_number: 8051030
- is_number: 8058122
- publication_year: 2017
- publication_date: 27-28 July 2017
- start_page: 1
- end_page: 4
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 159
- insert_date: 20171005
-
index_terms:
-
ieee_terms:
- Photonics
- X-ray imaging
- Silicon
- Attenuation
- Detectors
- Image sensors
-
author_terms:
- CMOS
- VLSI
- X-ray applications
- Biomedical imaging
- CMOS image sensors
-
dynamic_index_terms:
- Commercial Off-the-shelf
- High-resolution
- Spatial Resolution
- Image Acquisition
- High Spatial Resolution
- Detection Efficiency
- Image Sensor
- Camera Sensor
- Scintillator
- Attenuation Length
- Absorption Lengths
- keV Photon
- Visible Light
- Visible Region
- Visible Spectrum
- Intense Activity
- Poisson Distribution
- Poissonian
- Ionizing Radiation
- Ion Irradiation
- Ion Implantation
- Effects Of Radiation
- Effects Of Radiotherapy
- Effect Of Irradiation
- Integration Time
- Image Object
- Error Propagation
- Cumulative Error
- Uncertainty Propagation
- Object Of Interest
- Incoming Photons
- Photoemission
- Photoelectric Effect
- Compton Scattering
- Compton Effect
- Shot Noise
- Poisson Noise
- X-ray Detector
- Probability Of Interaction
- Fly Body
- Sensor Layer
- Si Layer
-
isbn_formats:
-
format: Print on Demand(PoD) ISBN,
value: 978-1-5090-6672-8,
isbnType: New-2005
-
format: CD,
value: 978-1-5090-6670-4,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-5090-6671-1,
isbnType: New-2005
-
authors:
-
Author Name: F. Alcalde Bessia
Affiliation: Centro Atómico Bariloche, Instituto
Balseiro and CONICET, Bariloche, RÃo Negro, AR
Author URL:
https://ieeexplore.ieee.org/author/37086515647
ID: 37086515647
Order: 1
Author Affiliations:
-
Centro Atómico Bariloche, Instituto Balseiro and CONICET,
Bariloche, RÃo Negro, AR
-
Author Name: M. Pérez
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37085622162
ID: 37085622162
Order: 2
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: M. Gomez Berisso
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37086515140
ID: 37086515140
Order: 3
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: N. Piunno
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37088353636
ID: 37088353636
Order: 4
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: H. Mateos
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37086029046
ID: 37086029046
Order: 5
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: F.J. Pomiro
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37088353247
ID: 37088353247
Order: 6
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: I. Sidelnik
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37085632022
ID: 37085632022
Order: 7
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: J.J. Blostein
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37085619472
ID: 37085619472
Order: 8
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: M. Sofo Haro
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37085793021
ID: 37085793021
Order: 9
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
-
Author Name: J. Lipovetzky
Affiliation: Comision Nacional de Energia Atómica,
Centro Atomico Bariloche, San Carlos de Bariloche, Argentina
Author URL:
https://ieeexplore.ieee.org/author/37399599700
ID: 37399599700
Order: 10
Author Affiliations:
-
Comision Nacional de Energia Atómica, Centro Atomico Bariloche,
San Carlos de Bariloche, Argentina
Image Sensor
- sensor_type: CMOS
- resolution: 2592 x 1944
- dynamic_range: Not specified
- pixel_size: 1.4µm x 1.4µm
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
Applications & Benefits
-
cell_imaging: Potential applications include biology,
electronic components inspection, or paleontology.
-
benefits: Allows for high spatial resolution imaging
and potential use in various fields such as medical and materials
analysis.
Supporting Organizations
-
supported_by: ANPCyT (Argentina), CONICET (Argentina)
Manuscript Details
- publication_date: 27-28 July 2017
Relevancy Score
- score: 10
-
missing_fields:
- dynamic_range
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
request_28772a71-c955-42f7-ad62-3cc4756b0ffd-xray_micrographic_imaging_system_based_on_cots_cmos_sensors.json