Vlsi Implementation Of A Focal Plane Image Processora Realization Of The Nearsensor Image Processing Concept

• doi: 10.1109/92.532033
• title: VLSI implementation of a focal plane image processor-a realization of the near-sensor image processing concept
• publisher: IEEE
• isbn:
• issn: 1557-9999
• rank: 3947
• access_type: LOCKED
• content_type: Journals
• abstract: The near-sensor image processing concept, which has earlier been theoretically described, is here verified with an implementation. The NSIP describes a method to implement a two-dimensional (2-D) image sensor array with processing capacity in every pixel. Traditionally, there is a contradiction between high spatial resolution and complex processor elements, In the NSIP concept we have a nondestructive photodiode readout and we can thereby process binary images without loosing gray-scale information. The global image processing is handled by an asynchronous Global Logical Unit. These two features makes it possible to have efficient image processing in a small processor element. Electrical problems such as power consumption and fixed pattern noise are solved. All design is aimed at a 128/spl times/128 pixels NSIP in a 0.8 /spl mu/m double-metal single-poly CMOS process. We have fabricated and measured a 32/spl times/32 pixels NSIP. We also give examples of image processing tasks such as gradient and maximum detection, histogram equalization, and thresholding with hysteresis. In the NSIP concept automatic light adaptivity within a 160 dB range is possible.
• article_number: 532033
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=532033
• html_url: https://ieeexplore.ieee.org/document/532033/
• abstract_url: https://ieeexplore.ieee.org/document/532033/
• publication_title: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
• conference_location:
• conference_dates:
• publication_number: 92
• is_number: 11225
• publication_year: 1996
• publication_date: Sept. 1996
• start_page: 322
• end_page: 335
• citing_paper_count: 105
• citing_patent_count: 7
• download_count: 942
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Very large scale integration
    • Image processing
    • Sensor arrays
    • Two dimensional displays
    • Image sensors
    • Pixel
    • Spatial resolution
    • Photodiodes
    • Gray-scale
    • Energy consumption
  • dynamic_index_terms:
    • Image Processing
    • Power Consumption
    • Data Reduction
    • Memory Cells
    • Inverter
    • Binary Image
    • Photocurrent
    • Supply Voltage
    • Sensor Array
    • Light Sensitivity
    • Photophobic
    • Dark Current
    • Grayscale Value
    • Greyscale Values
    • Global Operations
    • Histogram Equalization
    • Spots In Images
    • Transistor Size
    • Transistor Count
    • Example Of Operation
    • Test Chip
    • Readout Electronics
    • Local Bus
    • Masked Images
    • Masking Signal
    • Masked Region
    • Microlenses
    • Micro Lens
    • Entire Image
    • Processing Tasks
    • Light Intensity
    • Exposure Time
    • Bitplane
    • Test Circuit
    • Dynamic Range
    • CMOS Process
• authors:
  • Author Name: J.-E. Eklund
    Affiliation: Electronic Devices, Department of Physics, Linköping University, Linkoping, Sweden
    Author URL: https://ieeexplore.ieee.org/author/37338285900
    ID: 37338285900
    Order: 1
    Author Affiliations:
    • Electronic Devices, Department of Physics, Linköping University, Linkoping, Sweden
  • Author Name: C. Svensson
    Affiliation: Electronic Devices, Department of Physics, Linköping University, Linkoping, Sweden
    Author URL: https://ieeexplore.ieee.org/author/37268566200
    ID: 37268566200
    Order: 2
    Author Affiliations:
    • Electronic Devices, Department of Physics, Linköping University, Linkoping, Sweden
  • Author Name: A. Astrom
    Affiliation: Image Processing Laboratory, Department of Electrical Engineering, Linköping University, Linkoping, Sweden
    Author URL: https://ieeexplore.ieee.org/author/37347375800
    ID: 37347375800
    Order: 3
    Author Affiliations:
    • Image Processing Laboratory, Department of Electrical Engineering, Linköping University, Linkoping, Sweden

Image Sensor

• sensor_type: CMOS
• resolution: 128 x 128 pixels
• dynamic_range: 160 dB
• pixel_size: 100 µm x 100 µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 1000 to 100000 Hz
• power_consumption: Low, to keep chip temperature down, specific values not provided
• noise: Includes fixed pattern noise and I/f noise.

Applications & Benefits

• cell_imaging: Applications include robot vision and industrial inspection tasks.
• benefits: Allows efficient image processing without losing gray-scale information.

Supporting Organizations

• supported_by: CENIIT

Manuscript Details

• publication_date: Sept. 1996

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed

Processed JSON Filename

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