Vlsi Designers Interface

• doi: 10.1109/MCD.2002.994832
• title: VLSI designer's interface
• publisher: IEEE
• isbn:
• issn: 1558-1888
• rank: 3946
• access_type: LOCKED
• content_type: Magazines
• abstract: This presentation discusses the availability of a standard-cell library targeting the TSMC-0.25 μm, 2.5 V CMOS process; IBM's development of a new "Double-Gate" transistor fabricated in an SOI process and Intel's "TetraHertz Transistor," which it claims is the world's smallest transistor with a gate length of only 15 nm; Modu-Lab, a Web site dedicated to illustrating microfabrication techniques for the basic process steps of deposit, pattern, etch, and repeat; OpenCores' free open-source 33/66 MHz 32-bit PCI Bridge Soft Core, a complete synthesizable RTL (Verilog) code that provides bridging between the PCI and a WISHBONE (system-on-chip) bus; Foveon's development of a full-color image sensor chip that uses three layers of photodetectors embedded in silicon; Aldec and Synplicity design entry and simulation tools for universities and students; a new set of system-on-chip test benchmark circuits; and takes a look at nanotechnology initiatives.
• article_number: 994832
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=994832
• html_url: https://ieeexplore.ieee.org/document/994832/
• abstract_url: https://ieeexplore.ieee.org/document/994832/
• publication_title: IEEE Circuits and Devices Magazine
• conference_location:
• conference_dates:
• publication_number: 101
• is_number: 21453
• publication_year: 2002
• publication_date: March 2002
• start_page: 5
• end_page: 6
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 291
• insert_date: 20020807
• index_terms:
  • ieee_terms:
    • Very large scale integration
    • System-on-a-chip
    • Circuit testing
    • Libraries
    • CMOS process
    • Etching
    • Open source software
    • Bridge circuits
    • Hardware design languages
    • Image sensors
  • dynamic_index_terms:
    • Ionizing Radiation
    • Ion Irradiation
    • Ion Implantation
    • Integrated Circuit
    • Cosmic Rays
    • Cosmic Radiation
    • Nucleon
    • Low Earth Orbit
    • Low Earth Orbit Satellite
    • Trapped Particles
    • Penning Trap
    • Military System
    • Solar Events
    • Solar Effects
    • Nuclear Explosion
    • Nuclear Detonation
    • High-energy Protons
    • CCD Camera
    • Charge-coupled Device
    • Fabrication Process
    • Effects Of Radiation
    • Effects Of Radiotherapy
    • Effect Of Irradiation
    • Dose Concentration
    • Absorbed Dose
    • Total Ionizing Dose
    • Forward Error Correction
    • Channel Coding
    • Error-correcting Codes
    • South Atlantic
    • Circuit Dynamics
• authors:
  • Author Name: D. Bouldin
    Affiliation:
    Author URL: https://ieeexplore.ieee.org/author/37267927700
    ID: 37267927700
    Order: 1
    

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: CMOS image sensors are used in a variety of applications such as smartphones, medical devices, and automotive systems.
• benefits: Enable digital imaging and enhanced sensitivity and resolution.

Supporting Organizations

• supported_by: Not specified

Manuscript Details

• publication_date: March 2002

Relevancy Score

• score: 5
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • supported_by
  • authors
  • publication_date

Processed JSON Filename

request_3fa846e2-f3c1-4b4f-81cb-bc3804dac23b-vlsi_designers_interface.json