Vertically Integrated Sensors For Advanced Imaging Applications

• doi: 10.1109/4.848201
• title: Vertically integrated sensors for advanced imaging applications
• publisher: IEEE
• isbn:
• issn: 1558-173X
• rank: 3959
• access_type: LOCKED
• content_type: Journals
• abstract: A thin film on ASIC (TFA) image sensor is fabricated depositing an amorphous silicon thin-film detector onto a CMOS ASIC. With regards to advanced imaging systems, TFA provides enhanced performance and more flexibility than conventional technologies. Extensive on-chip signal processing is feasible, as well as small pixels for high resolution imagers. Two new TFA imager prototypes have recently been fabricated. High-resolution image sensor (HIRISE II) with 1024/spl times/128 pixels is an active pixel sensor suited for digital photography. Local autoadaptiver sensor (LARS II) with 368/spl times/256 pixels splits the illumination information into two signals, thereby providing a dynamic range of more than 120 dB, as required by automotive applications. Both prototypes include correlated double sampling and double delta sampling for efficient suppression of fixed pattern noise.
• article_number: 848201
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=848201
• html_url: https://ieeexplore.ieee.org/document/848201/
• abstract_url: https://ieeexplore.ieee.org/document/848201/
• publication_title: IEEE Journal of Solid-State Circuits
• conference_location:
• conference_dates:
• publication_number: 4
• is_number: 18446
• publication_year: 2000
• publication_date: July 2000
• start_page: 939
• end_page: 945
• citing_paper_count: 16
• citing_patent_count: 1
• download_count: 295
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Image sensors
    • Pixel
    • Semiconductor thin films
    • Sputtering
    • Thin film sensors
    • Application specific integrated circuits
    • Prototypes
    • Sampling methods
    • Amorphous silicon
    • Detectors
  • dynamic_index_terms:
    • Vertical Integration
    • Supplier Integration
    • Dynamic Range
    • Image Sensor
    • Camera Sensor
    • Digital Photographs
    • Digital Photos
    • Amorphous Silicon
    • Silicon Thin Film
    • Double Sampling
    • Integration Time
    • Physical Education
    • Physical Teachers
    • High Contrast
    • Inverter
    • Left Corner
    • Photocurrent
    • Electrical Engineering
    • Electric Motor
    • Camera System
    • Integral Value
    • Semiconductor Devices
    • Noise Floor
    • Deep Processing
    • High Dynamic Range
    • Integral Image
    • Automotive Systems
    • Readout Circuit
    • Integration Period
• authors:
  • Author Name: S. Benthien
    Affiliation: Silicon Vision GmbH, Siegen, Germany
    Author URL: https://ieeexplore.ieee.org/author/37426914300
    ID: 37426914300
    Order: 1
    Author Affiliations:
    • Silicon Vision GmbH, Siegen, Germany
  • Author Name: T. Lule
    Affiliation: Silicon Vision GmbH, Siegen, Germany
    Author URL: https://ieeexplore.ieee.org/author/37352114200
    ID: 37352114200
    Order: 2
    Author Affiliations:
    • Silicon Vision GmbH, Siegen, Germany
  • Author Name: B. Schneider
    Affiliation: Institut für Halbleiterelektronik, Universität-GH Siegen, Siegen, Germany
    Author URL: https://ieeexplore.ieee.org/author/37319626700
    ID: 37319626700
    Order: 3
    Author Affiliations:
    • Institut für Halbleiterelektronik, Universität-GH Siegen, Siegen, Germany
  • Author Name: M. Wagner
    Affiliation: Silicon Vision GmbH, Siegen, Germany
    Author URL: https://ieeexplore.ieee.org/author/37416372300
    ID: 37416372300
    Order: 4
    Author Affiliations:
    • Silicon Vision GmbH, Siegen, Germany
  • Author Name: M. Verhoeven
    Affiliation: Silicon Vision GmbH, Siegen, Germany
    Author URL: https://ieeexplore.ieee.org/author/37062596800
    ID: 37062596800
    Order: 5
    Author Affiliations:
    • Silicon Vision GmbH, Siegen, Germany
  • Author Name: M. Bohm
    Affiliation: Institut für Halbleiterelektronik, Universität-GH Siegen, Siegen, Germany
    Author URL: https://ieeexplore.ieee.org/author/37319627000
    ID: 37319627000
    Order: 6
    Author Affiliations:
    • Institut für Halbleiterelektronik, Universität-GH Siegen, Siegen, Germany

Image Sensor

• sensor_type: Thin Film on ASIC (TFA)
• resolution: 1024x128 / 368x256
• dynamic_range: >120 dB
• pixel_size: 10x10 µm (inverter readout) / 10x12 µm (source follower readout)
• dark_current: < 1 pA / cm² at 1000 lx

Optical Data

• focal_length:
• aperture:
• field_of_view:
• distortion:

Performance Metrics

• frame_rate: 130 fps
• signal_to_noise_ratio: 60 dB
• sensitivity: 8.6 V/lx·s
• shutter_speed: 7.6 ms for HIRISE II / 3 ms for LARS II
• power_consumption: 50 mA at 5V for LARS II (total power)
• noise: < 2 mV

Applications & Benefits

• cell_imaging: Not specified.
• benefits: High dynamic range and flexibility in sensor design; suitable for advanced imaging applications including digital photography and automotive systems.

Supporting Organizations

• supported_by: Silicon Vision GmbH, Institut für Halbleiterelektronik, Universität-GH Siegen

Manuscript Details

• publication_date: July 2000

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion

Processed JSON Filename

request_23aaafee-1310-4d03-942e-296cca7e69f0-vertically_integrated_sensors_for_advanced_imaging_applications.json