Variable Resolution Cmos Current Mode Active Pixel Sensor

• doi: 10.1109/ISCAS.2000.856319
• title: Variable resolution CMOS current mode active pixel sensor
• publisher: IEEE
• isbn: 0-7803-5482-6
• issn:
• partnum: 00CH36353
• rank: 3952
• access_type: LOCKED
• content_type: Conferences
• abstract: We present in this paper a current mediated active pixel sensor (APS) with variable image size and resolution for power saving, electronic zooming, and data reduction at the sensor level. The circuit can perform averaging of output signals in blocks of adjacent pixels (kernels) of size 1/spl times/1, 2/spl times/2 and 4/spl times/4, allowing data reduction without aliasing effects. To achieve this, a current approach is used, thus enabling high speed operation and low power supply capacity. A novel fixed pattern noise (FPN) reduction scheme using a compact circuitry is presented. The circuit compensates for pixel transconductance mismatch in addition to offset error via analog to digital conversion reference current scaling. Hspice simulations using parameters of a 0.35 /spl mu/m CMOS process illustrate the advantage of the new technique over usual correlated double sampling (CDS) in current mode sensors. Parallel integrated analog to digital converters (ADC), a data line-buffer and digital control complete the circuit making data transmission easy and simplifying hardware needed for using the image sensor.
• article_number: 856319
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=856319
• html_url: https://ieeexplore.ieee.org/document/856319/
• abstract_url: https://ieeexplore.ieee.org/document/856319/
• publication_title: 2000 IEEE International Symposium on Circuits and Systems (ISCAS)
• conference_location: Geneva, Switzerland
• conference_dates: 28-31 May 2000
• publication_number: 6910
• is_number: 18592
• publication_year: 2000
• publication_date: 28-31 May 2000
• start_page: 293
• end_page: 296 vol.2
• citing_paper_count: 21
• citing_patent_count: 11
• download_count: 374
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Circuits
    • Image sensors
    • Signal resolution
    • Analog-digital conversion
    • CMOS image sensors
    • Pixel
    • Image resolution
    • Kernel
    • Power supplies
    • Noise reduction
  • dynamic_index_terms:
    • Current Sensor
    • Current Pixel
    • Active Pixel Sensor
    • Output Signal
    • Data Reduction
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Image Sensor
    • Camera Sensor
    • Low Supply
    • Transconductance
    • Conductive Transfer
    • High-speed Operation
    • High Power Supply
    • Offset Error
    • Light Intensity
    • Photodiode
    • Low Voltage
    • Control Signal
    • High Light
    • High Light Intensity
    • Current Source
    • Current Regulations
    • Photodetector
    • Output Current
    • Current Mirror
    • Integration Period
    • Large Dynamic Range
    • Usual Techniques
    • Absolute Scale
    • Image Lines
    • Group Of Pixels
• isbn_formats:
  • format: Print ISBN, value: 0-7803-5482-6, isbnType: Historical
• authors:
  • Author Name: J. Coulombe
    Affiliation: Electr. & Comput. Eng. Dept., Ecole Polytech. de Montreal, Que., Canada
    Author URL: https://ieeexplore.ieee.org/author/37427728400
    ID: 37427728400
    Order: 1
    Author Affiliations:
    • Electr. & Comput. Eng. Dept., Ecole Polytech. de Montreal, Que., Canada
  • Author Name: M. Sawan
    Affiliation: Electrical and Computer Engineering Department, Ecole Polytechnique de Montreal, Montreal, Canada
    Author URL: https://ieeexplore.ieee.org/author/37276702600
    ID: 37276702600
    Order: 2
    Author Affiliations:
    • Electrical and Computer Engineering Department, Ecole Polytechnique de Montreal, Montreal, Canada
  • Author Name: C. Wang
    Affiliation: Electrical and Computer Engineering Department, Concordia University, Montreal, Canada
    Author URL: https://ieeexplore.ieee.org/author/37280017300
    ID: 37280017300
    Order: 3
    Author Affiliations:
    • Electrical and Computer Engineering Department, Concordia University, Montreal, Canada

Image Sensor

• sensor_type: CMOS
• resolution: 128x128
• dynamic_range: High
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• power_consumption: Low power supply capacity
• noise: Fixed Pattern Noise (FPN) reduction indicated

Applications & Benefits

• cell_imaging: Applications in robotics, target tracking algorithms, biological vision
• benefits: Power saving, electronic zooming, data reduction at the sensor level, enhances light sensitivity

Supporting Organizations

• supported_by: NSERC, GRIAO, CMC

Manuscript Details

• publication_date: 28-31 May 2000

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_f11f1c43-02a3-4a94-bfda-74986b838e92-variable_resolution_cmos_current_mode_active_pixel_sensor.json