Twodimensional Cmos Image Sensor Characterization

• doi: 10.1109/ISCAS.2006.1693401
• title: Two-dimensional CMOS image sensor characterization
• publisher: IEEE
• isbn: 0-7803-9389-9
• issn: 2158-1525
• partnum: 06CH37717C
• rank: 3911
• access_type: LOCKED
• content_type: Conferences
• abstract: In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS sub arrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the "neighborhood" condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2D-characterization for sensor performance understanding and improvement are clearly emphasized
• article_number: 1693401
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1693401
• html_url: https://ieeexplore.ieee.org/document/1693401/
• abstract_url: https://ieeexplore.ieee.org/document/1693401/
• publication_title: 2006 IEEE International Symposium on Circuits and Systems
• conference_location: Kos, Greece
• conference_dates: 21-24 May 2006
• publication_number: 11145
• is_number: 35661
• publication_year: 2006
• publication_date: 21-24 May 2006
• start_page: 4 pp.
• end_page:
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 324
• insert_date: 20060911
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Sensor arrays
    • Sensor phenomena and characterization
    • Computational Intelligence Society
    • Optical arrays
    • Two dimensional displays
    • Crosstalk
    • Character generation
    • Topology
    • Wavelength measurement
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Sensor Characteristics
    • Sensor Features
    • Point Spread Function
    • Sensor Resolution
    • Modulation Transfer Function
    • Optical Transfer Function
    • Resolution Ability
    • Active Area
    • Photodiode
    • Geometric Shapes
    • Geometric Figures
    • Figure Of Merit
    • Pixel Area
    • Neighboring Pixels
    • Neighborhood Pixels
    • Signaling Crosstalk
    • Device Data
    • Ideal Profile
    • Conversion Gain
    • Pronounced Asymmetry
• isbn_formats:
  • format: Print ISBN, value: 0-7803-9389-9, isbnType: Historical
• authors:
  • Author Name: I. Shcherback
    Affiliation: The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel
    Author URL: https://ieeexplore.ieee.org/author/38271602200
    ID: 38271602200
    Order: 1
    Author Affiliations:
    • The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel
  • Author Name: R. Segal
    Affiliation: The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel
    Author URL: https://ieeexplore.ieee.org/author/38285278900
    ID: 38285278900
    Order: 2
    Author Affiliations:
    • The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel
  • Author Name: A. Belenky
    Affiliation: The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel
    Author URL: https://ieeexplore.ieee.org/author/38276353100
    ID: 38276353100
    Order: 3
    Author Affiliations:
    • The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel
  • Author Name: O. Yadid-Pecht
    Affiliation: The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel
    Author URL: https://ieeexplore.ieee.org/author/38298354100
    ID: 38298354100
    Order: 4
    Author Affiliations:
    • The VLSI Systems Center, Ben-Gurion University of the Negev, Beersheba, Israel

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: not specified

Supporting Organizations

• supported_by: not specified

Manuscript Details

• publication_date: 21-24 May 2006

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • supported_by

Processed JSON Filename

request_c5f48cc6-aaf5-421a-ab59-ffb7f9e8ad94-twodimensional_cmos_image_sensor_characterization.json