Towards Highresolution Xray Imaging Using A Structured Scintillator

• doi: 10.1109/TNS.2011.2177477
• title: Towards High-Resolution X-Ray Imaging Using a Structured Scintillator
• publisher: IEEE
• isbn:
• issn: 1558-1578
• rank: 3880
• access_type: LOCKED
• content_type: Journals
• abstract: Structured scintillators, by light-guiding secondary emitted visible photons to a pixel in a CCD or CMOS image sensor, improve the lateral resolution of X-ray imaging detectors. In this work we have fabricated pore arrays in a silicon wafer and subsequently filled them with CsI(Tl) by a melting process. The goal was to down-scale the pore geometry for increased resolution. The results show that although pore depth must be reduced to comply with achievable aspect ratio of the Inductively Coupled Plasma (ICP) etching, melting into the pores is possible. The time and temperature has, however, to be optimized to prevent thallium loss during the melting. By correlating light yield measurements with the X-ray absorption in samples of various geometries, we find that the efficiency is slightly reduced for pore diameters approaching one micron. Nevertheless, the increased absorption in deep pores will lead to a significantly improved quantum efficiency compared to thin films currently used to achieve the same lateral resolution.
• article_number: 6125227
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6125227
• html_url: https://ieeexplore.ieee.org/document/6125227/
• abstract_url: https://ieeexplore.ieee.org/document/6125227/
• publication_title: IEEE Transactions on Nuclear Science
• conference_location:
• conference_dates:
• publication_number: 23
• is_number: 6146807
• publication_year: 2012
• publication_date: Feb. 2012
• start_page: 19
• end_page: 23
• citing_paper_count: 9
• citing_patent_count: 2
• download_count: 640
• insert_date: 20120106
• index_terms:
  • ieee_terms:
    • X-ray imaging
    • Absorption
    • Detectors
    • Silicon
    • Arrays
    • Photonics
    • Temperature measurement
  • author_terms:
    • Scintillation detectors
    • waveguides
    • X-ray imaging technologies
  • dynamic_index_terms:
    • High-resolution
    • High-resolution X-ray Imaging
    • High-resolution X-ray Tomography
    • CCD Camera
    • Charge-coupled Device
    • Inductively Coupled Plasma
    • ICP-MS
    • Inductively Coupled Plasma Mass Spectrometry
    • Aspect Ratio
    • Silicon Wafer
    • Downscaling
    • X-ray Absorption
    • Lateral Resolution
    • Light Output
    • Light Yield
    • Absorption Of Samples
    • Visible Photons
    • Porous Arrays
    • Array Of Pores
    • Scanning Electron Microscopy
    • Layer Thickness
    • Visible Light
    • Visible Region
    • Visible Spectrum
    • Low Efficiency
    • Fabrication Process
    • High Aspect Ratio
    • Charge-coupled Device Detector
    • Electrochemical Etching
    • Cesium Iodide
    • Pore Walls
    • Porous Wall
    • Indirect Detection
    • Thick Oxide Layer
    • Hexagonal Array
• authors:
  • Author Name: Yashar Hormozan
    Affiliation: Royal Institute of Technology, Stockholm, Sweden
    Author URL: https://ieeexplore.ieee.org/author/38234487600
    ID: 38234487600
    Order: 1
    Author Affiliations:
    • Royal Institute of Technology, Stockholm, Sweden
  • Author Name: Sang-Ho Yun
    Affiliation: Royal Institute of Technology, Stockholm, Sweden
    Author URL: https://ieeexplore.ieee.org/author/37609852800
    ID: 37609852800
    Order: 2
    Author Affiliations:
    • Royal Institute of Technology, Stockholm, Sweden
  • Author Name: Olof Svenonius
    Affiliation: Scint-X AB, Stockholm, Sweden
    Author URL: https://ieeexplore.ieee.org/author/38234487900
    ID: 38234487900
    Order: 3
    Author Affiliations:
    • Scint-X AB, Stockholm, Sweden
  • Author Name: Jan Linnros
    Affiliation: Royal Institute of Technology, Stockholm, Sweden
    Author URL: https://ieeexplore.ieee.org/author/37272260000
    ID: 37272260000
    Order: 4
    Author Affiliations:
    • Royal Institute of Technology, Stockholm, Sweden

Image Sensor

• sensor_type: CCD/CMOS
• resolution: unknown
• dynamic_range: unknown
• pixel_size: 3-20 µm
• dark_current: unknown

Optical Data

• focal_length: unknown
• aperture: f/2.8
• field_of_view: unknown
• distortion: unknown

Performance Metrics

• frame_rate: unknown
• signal_to_noise_ratio: unknown
• sensitivity: ISO
• shutter_speed: unknown
• power_consumption: unknown
• noise: unknown

Applications & Benefits

• cell_imaging: unknown
• benefits: Improved lateral resolution in X-ray imaging and materials analysis.

Supporting Organizations

• supported_by: Swedish Strategic Research Council (SSF)

Manuscript Details

• publication_date: Feb. 2012

Relevancy Score

• score: 6
• missing_fields:
  • resolution
  • dynamic_range
  • dark_current
  • focal_length
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_acbb505e-2bad-45e1-8c2c-695fb4ce6615-towards_highresolution_xray_imaging_using_a_structured_scintillator.json