Total Ionizing Dose Radiationinduced Dark Current Random Telegraph Signal In Pinned Photodiode Cmos Image Sensors

• doi: 10.1109/TNS.2017.2779979
• title: Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors
• publisher: IEEE
• isbn:
• issn: 1558-1578
• rank: 3868
• access_type: LOCKED
• content_type: Journals
• abstract: In this paper, several studies on total ionizing dose effects on pinned photodiode CMOS images sensors are presented. More precisely, the evolution of a parasitic signal called random telegraph signal (RTS) is analyzed through several photodiode designs. It is shown that the population of pixels exhibiting this fluctuation depends on the design variants. This population also increases in a different way with the dose: the effects are not the same considering a low or high X-rays irradiation. Moreover, a statistical analysis is realized in order to better characterize the defects responsible for RTS. It turns out that an electric-field enhancement signature can appear in some specific cases.
• article_number: 8141911
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8141911
• html_url: https://ieeexplore.ieee.org/document/8141911/
• abstract_url: https://ieeexplore.ieee.org/document/8141911/
• publication_title: IEEE Transactions on Nuclear Science
• conference_location:
• conference_dates:
• publication_number: 23
• is_number: 8263287
• publication_year: 2018
• publication_date: Jan. 2018
• start_page: 92
• end_page: 100
• citing_paper_count: 10
• citing_patent_count: 0
• download_count: 762
• insert_date: 20171204
• index_terms:
  • ieee_terms:
    • Logic gates
    • Photodiodes
    • Dark current
    • Sociology
    • Statistics
    • Total ionizing dose
  • author_terms:
    • CMOS image sensor (CIS)
    • fluctuation
    • pinned photodiode (PPD)
    • radiation induced phenomenon
    • random telegraph signal (RTS)
    • total ionizing dose (TID)
    • X-rays
  • dynamic_index_terms:
    • Dose Concentration
    • Absorbed Dose
    • Total Ionizing Dose
    • Dark Current
    • Random Signal
    • PIN Photodiode
    • Telegraph Signal
    • Random Telegraph Signal
    • Irradiation
    • Electric Field Enhancement
    • Low Dose
    • Time Constant
    • Activation Energy
    • Active Center
    • Low Voltage
    • Interface Region
    • Standard Design
    • Depletion Region
    • Space Charge Region
    • Depletion Layer
    • Depletion Zone
    • Moderate Dose
    • Interface States
    • Interface Conditions
    • Potential Step
    • Square Pixels
    • Ratio Of Pixels
    • Oxide Interface
    • Dark Signal
    • Gate Oxide
    • Gate-oxide
    • Percentage Of Pixels
    • Semi-logarithmic
    • Semi-logarithmic Plot
    • Semi-logarithmic Scale
• authors:
  • Author Name: Clémentine Durnez
    Affiliation: Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37085480035
    ID: 37085480035
    Order: 1
    Author Affiliations:
    • Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
  • Author Name: Vincent Goiffon
    Affiliation: Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37593862700
    ID: 37593862700
    Order: 2
    Author Affiliations:
    • Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
  • Author Name: Cédric Virmontois
    Affiliation: Centre National d’Études Spatiales, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/38327725000
    ID: 38327725000
    Order: 3
    Author Affiliations:
    • Centre National d’Études Spatiales, Toulouse, France
  • Author Name: Serena Rizzolo
    Affiliation: Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37085418844
    ID: 37085418844
    Order: 4
    Author Affiliations:
    • Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
  • Author Name: Alexandre Le Roch
    Affiliation: Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37086270369
    ID: 37086270369
    Order: 5
    Author Affiliations:
    • Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
  • Author Name: Pierre Magnan
    Affiliation: Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37400751600
    ID: 37400751600
    Order: 6
    Author Affiliations:
    • Image Sensor Research Team, Institut Supérieur de l’Aeronautique et de l’Espace-SUPAERO, Université de Toulouse, Toulouse, France
  • Author Name: Philippe Paillet
    Affiliation: Commissariat à l’énergie atomique et aux énergies alternatives-Direction des Applications Militaires (DAM), DAM Ile de France, Arpajon, France
    Author URL: https://ieeexplore.ieee.org/author/37283486900
    ID: 37283486900
    Order: 7
    Author Affiliations:
    • Commissariat à l’énergie atomique et aux énergies alternatives-Direction des Applications Militaires (DAM), DAM Ile de France, Arpajon, France
  • Author Name: Claude Marcandella
    Affiliation: Commissariat à l’énergie atomique et aux énergies alternatives-Direction des Applications Militaires (DAM), DAM Ile de France, Arpajon, France
    Author URL: https://ieeexplore.ieee.org/author/37331678900
    ID: 37331678900
    Order: 8
    Author Affiliations:
    • Commissariat à l’énergie atomique et aux énergies alternatives-Direction des Applications Militaires (DAM), DAM Ile de France, Arpajon, France
  • Author Name: Laurent Rubaldo
    Affiliation: SOFRADIR, Veurey-Voroize, France
    Author URL: https://ieeexplore.ieee.org/author/37296445200
    ID: 37296445200
    Order: 9
    Author Affiliations:
    • SOFRADIR, Veurey-Voroize, France

Image Sensor

• sensor_type: CMOS
• resolution: 256x256
• dynamic_range: Not specified
• pixel_size: 7 µm
• dark_current: Modeled impact observed in experiments, specific values not provided in summary, but dark current behavior analyzed through RTS signals.

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• noise: Temporal noise and fixed-pattern noise characteristics discussed.

Applications & Benefits

• cell_imaging: Used in imaging systems for low light capabilities, photon counting mentioned.
• benefits: Enhanced sensitivity and dynamic range, adaptable for various applications in commercial and scientific fields.

Supporting Organizations

• supported_by: Institut Supérieur de l’Aéronautique et de l’Espace-SUPAERO, Commissariat à l’énergie atomique et aux énergies alternatives (CEA), SOFRADIR

Manuscript Details

• publication_date: Jan. 2018

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

request_127d93f1-ab79-4a3c-9602-7e147ae381b4-total_ionizing_dose_radiationinduced_dark_current_random_telegraph_signal_in_pinned_photodiode_cmos_image_sensors.json