Timedelay Integration Readout With Adjacent Pixel Signal Transfer For Cmos Image Sensor

• doi: 10.1109/VLSI-DAT.2012.6212600
• title: Time-delay integration readout with adjacent pixel signal transfer for CMOS image sensor
• publisher: IEEE
• isbn: 978-1-4577-2079-6
• issn:
• partnum: 12TH9246
• rank: 3858
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a time delay and integration (TDI) structure for CMOS image sensor (CIS) with adjacent pixel signal transfer (APST). The CCD-like TDI function is achieved in CIS by proposed APST without additional in-pixel device and minimum routing effort. The in-pixel integrated signal is transferred to adjacent pixel and summed up by an off-pixel column-shared unity-gain buffer. A 128×6 pixel array with 6×6µm2 pixel size has been designed and fabricated in TSMC0.18µm 1P6M CIS technology providing 6 TDI stages with fill factor of 23.1%. It achieves a signal to noise ratio (SNR) improvement of 13dB, a transfer efficiency of 99.6%, and a total power dissipation of 4.43 µW per column at 1.6K fps.
• article_number: 6212600
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6212600
• html_url: https://ieeexplore.ieee.org/document/6212600/
• abstract_url: https://ieeexplore.ieee.org/document/6212600/
• publication_title: Proceedings of Technical Program of 2012 VLSI Design, Automation and Test
• conference_location: Hsinchu, Taiwan
• conference_dates: 23-25 April 2012
• publication_number: 6204369
• is_number: 6212573
• publication_year: 2012
• publication_date: 23-25 April 2012
• start_page: 1
• end_page: 4
• citing_paper_count: 1
• citing_patent_count: 4
• download_count: 650
• insert_date: 20120607
• index_terms:
  • ieee_terms:
    • Signal to noise ratio
    • Arrays
    • Linearity
    • Routing
    • CMOS integrated circuits
    • Power demand
    • Semiconductor device measurement
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Significant Transfer
    • Adjacent Pixels
    • Adjacent Signals
    • Time Delay Integration
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Pixel Size
    • Fill Factor
    • Pixel Array
    • Power Consumption
    • Low Power Consumption
    • Environmental Noise
    • Chip Area
    • Transfer Cycles
    • Linear Sensor
    • High Transfer Efficiency
• isbn_formats:
  • format: CD, value: 978-1-4577-2079-6, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4577-2080-2, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4577-2081-9, isbnType: New-2005
• authors:
  • Author Name: Kuo-Wei Cheng
    Affiliation: Signal Sensing and Application Laboratory, Department of Electrical Engineering, National Tsinghua University, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087262378
    ID: 37087262378
    Order: 1
    Author Affiliations:
    • Signal Sensing and Application Laboratory, Department of Electrical Engineering, National Tsinghua University, Hsinchu, Taiwan
  • Author Name: Chin Yin
    Affiliation: Signal Sensing and Application Laboratory, Department of Electrical Engineering, National Tsinghua University, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087263801
    ID: 37087263801
    Order: 2
    Author Affiliations:
    • Signal Sensing and Application Laboratory, Department of Electrical Engineering, National Tsinghua University, Hsinchu, Taiwan
  • Author Name: Chih-Cheng Hsieh
    Affiliation: Signal Sensing and Application Laboratory, Department of Electrical Engineering, National Tsinghua University, Hsinchu, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37086988609
    ID: 37086988609
    Order: 3
    Author Affiliations:
    • Signal Sensing and Application Laboratory, Department of Electrical Engineering, National Tsinghua University, Hsinchu, Taiwan
  • Author Name: Wen-Hsu Chang
    Affiliation: National Chip Implementation Center, National Applied Research Laboratories, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087263046
    ID: 37087263046
    Order: 4
    Author Affiliations:
    • National Chip Implementation Center, National Applied Research Laboratories, Taiwan
  • Author Name: Hann-Huei Tsai
    Affiliation: National Chip Implementation Center, National Applied Research Laboratories, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087262127
    ID: 37087262127
    Order: 5
    Author Affiliations:
    • National Chip Implementation Center, National Applied Research Laboratories, Taiwan
  • Author Name: Chin-Fong Chiu
    Affiliation: National Chip Implementation Center, National Applied Research Laboratories, Taiwan
    Author URL: https://ieeexplore.ieee.org/author/37087262997
    ID: 37087262997
    Order: 6
    Author Affiliations:
    • National Chip Implementation Center, National Applied Research Laboratories, Taiwan

Image Sensor

• sensor_type: CMOS
• resolution: 128x6 pixels
• dynamic_range:
• pixel_size: 6x6 µm²
• dark_current:

Optical Data

• focal_length:
• aperture:
• field_of_view:
• distortion:

Performance Metrics

• frame_rate: 1.6K fps
• signal_to_noise_ratio: 39 dB
• sensitivity:
• shutter_speed:
• power_consumption: 4.43 µW per column
• noise:

Applications & Benefits

• cell_imaging:
• benefits: Optimized solution for remote sensing.

Supporting Organizations

• supported_by: National Science Council (NSC) 100-2221-E-007-063, Chip Implementation Center (CIC)

Manuscript Details

• publication_date: 23-25 April 2012

Relevancy Score

• score: 10
• missing_fields:
  • quantum_efficiency
  • readout_speed
  • temporal_noise
  • fixed_pattern_noise
  • analog_to_digital_conversion
  • microlenses
  • on_chip_colour_filters
  • global_or_rolling_shutters
  • backside_illumination

Processed JSON Filename

request_17a42c7c-593f-494c-b2d6-9438eb24f92f-timedelay_integration_readout_with_adjacent_pixel_signal_transfer_for_cmos_image_sensor.json