Thz Measurements And Calibration Based On A Blackbody Source
- doi: 10.1109/TTHZ.2014.2309003
-
title: THz Measurements and Calibration Based on a
Blackbody Source
- publisher: IEEE
- isbn:
- issn: 2156-3446
- rank: 3701
- access_type: LOCKED
- content_type: Journals
-
abstract: This paper presents a low-cost measurement
setup for THz applications, based on a blackbody source, which is a
commercial off-the-shelf (COTS) component. This measurement approach
resembles the natural operating conditions of passive imaging systems
and hence is more adequate in the characterization of the operation of
THz sensors and filters for passive systems than narrowband THz sources.
The calibration methodology of mesh filters that may block the unwanted
IR radiation as well as that of THz thermal sensors is discussed. The
components for uncooled passive thermal imaging: the innovative
CMOS-SOI-NEMS thermal sensor (the TeraMOS) as well as mesh filters are
characterized in the measurement setup presented here. The TeraMOS
sensor reported here is a small array of 4 ×4 pixels, each 100 ×100
(μm)2, with CMOS transistors with W/L=2/40, which are electrically
connected but are thermally isolated. The NEP is of the order of
NEP/√Hz|1 Hz=10 pW/√Hz, when viewing blackbodies at T=1300 K. The values
of D* and NETD, obtained from this NEP, are 0.2·1010 cm√Hz/W and ~ 0.2
K. The corresponding NETD of a single pixel is ~ 0.8 K, indicating that
this uncooled THz sensor in standard CMOS-SOI technology may enable
monolithic uncooled passive THz imagers.
- article_number: 6774490
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6774490
-
html_url:
https://ieeexplore.ieee.org/document/6774490/
-
abstract_url:
https://ieeexplore.ieee.org/document/6774490/
-
publication_title: IEEE Transactions on Terahertz
Science and Technology
- conference_location:
- conference_dates:
- publication_number: 5503871
- is_number: 6807840
- publication_year: 2014
- publication_date: May 2014
- start_page: 347
- end_page: 359
- citing_paper_count: 18
- citing_patent_count: 0
- download_count: 957
- insert_date: 20140317
-
index_terms:
-
ieee_terms:
- Temperature sensors
- Temperature measurement
- Choppers (circuits)
- Wavelength measurement
- Imaging
-
author_terms:
- CMOS
- MOS transistors
- NEMS
- passive THz imaging
- SOI
- THz filters
- THz sensors
-
dynamic_index_terms:
- Blackbody Source
- THz Measurements
- Irradiation
- Imaging System
- Infrared Imaging
- Infrared Camera
- Thermal Imaging
- Thermal Camera
- Measurement Setup
- Measurement Apparatus
- Single Pixel
- Passive System
- Mesh Filter
- Thermal Sensors
- Sensor Operation
- Commercial Off-the-shelf
- Passive Imaging
- High Temperature
- Short Wavelength
- Shorter Wavelengths
- Square Wave
- Sensitivity Of The Sensor
- Current Response
- Types Of Sensors
- Commercial Sensors
- Planck’s Law
- Planck Distribution
- Planck Function
- Optical Window
- Broadband Source
- Bolometer
- Stefan Boltzmann
- High-density Polyethylene
- HDPE
- Stefan Boltzmann Constant
- Stefan Boltzmann Law
- THz Range
- Power Meter
-
authors:
-
Author Name: Alex Svetlitza
Affiliation: Department of Electrical Engineering,
Technion, IIT and Kinneret Academic College
Author URL:
https://ieeexplore.ieee.org/author/38233010800
ID: 38233010800
Order: 1
Author Affiliations:
-
Department of Electrical Engineering, Technion, IIT and Kinneret
Academic College
-
Author Name: Michael Slavenko
Affiliation: Department of Electrical Engineering,
Technion, IIT and Kinneret Academic College
Author URL:
https://ieeexplore.ieee.org/author/37086629540
ID: 37086629540
Order: 2
Author Affiliations:
-
Department of Electrical Engineering, Technion, IIT and Kinneret
Academic College
-
Author Name: Tatiana Blank
Affiliation: Department of Electrical Engineering,
Technion, IIT and Kinneret Academic College
Author URL:
https://ieeexplore.ieee.org/author/38235306900
ID: 38235306900
Order: 3
Author Affiliations:
-
Department of Electrical Engineering, Technion, IIT and Kinneret
Academic College
-
Author Name: Igor Brouk
Affiliation: Department of Electrical Engineering,
Technion, IIT and Kinneret Academic College
Author URL:
https://ieeexplore.ieee.org/author/37294090800
ID: 37294090800
Order: 4
Author Affiliations:
-
Department of Electrical Engineering, Technion, IIT and Kinneret
Academic College
-
Author Name: Sara Stolyarova
Affiliation: Department of Electrical Engineering,
Technion, IIT and Kinneret Academic College
Author URL:
https://ieeexplore.ieee.org/author/37442993800
ID: 37442993800
Order: 5
Author Affiliations:
-
Department of Electrical Engineering, Technion, IIT and Kinneret
Academic College
-
Author Name: Yael Nemirovsky
Affiliation: Department of Electrical Engineering,
Technion, IIT and Kinneret Academic College
Author URL:
https://ieeexplore.ieee.org/author/37283695600
ID: 37283695600
Order: 6
Author Affiliations:
-
Department of Electrical Engineering, Technion, IIT and Kinneret
Academic College
Image Sensor
- sensor_type: CMOS
- resolution: 4x4 pixels (100x100 µm each)
- dynamic_range: Not explicitly mentioned
- pixel_size: 100 µm
- dark_current: Not explicitly mentioned
Optical Data
- focal_length: Not mentioned
- aperture: Not mentioned
- field_of_view: Not mentioned
- distortion: Not mentioned
Performance Metrics
- frame_rate: Not mentioned
- signal_to_noise_ratio: Not mentioned
- sensitivity: Not mentioned
- shutter_speed: Not mentioned
- power_consumption: Not explicitly mentioned
-
noise: 40 pW and 10 pW for NEP at different
temperatures
Applications & Benefits
-
cell_imaging: Used for passive uncooled imaging in
terahertz range with the TeraMOS sensor.
-
benefits: Monolithic integration of uncooled passive
THz imagers.
Supporting Organizations
-
supported_by: European Union Seventh Framework
Programme (FP7/2007-2013) under Grant 288442
Manuscript Details
- publication_date: May 2014
Relevancy Score
- score: 8
-
missing_fields:
- fill factor
- quantum efficiency
- readout speed
- temporal noise
- fixed-pattern noise
- analog-to-digital conversion techniques
- microlenses
- on-chip colour filters
- global rolling shutters
- backside illumination
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