The Hole Role
- doi: 10.1109/IEDM.2005.1609476
- title: The hole role
- publisher: IEEE
- isbn: 0-7803-9268-X
- issn: 2156-017X
- partnum: 05CH37703C
- rank: 3808
- access_type: LOCKED
- content_type: Conferences
-
abstract: The importance of holes in solid-state image
sensors is described. Today's success of digital imaging is based on the
positive effect of an accumulation layer that reduces the
interface-related dark current and dark current fixed-pattern noise.
This superb imaging feature is applied in CCD as well as in CMOS
devices, in consumer as well as in professional equipment. Holes are not
only used to improve the dark performance of imagers, other examples are
fixing electrostatic potentials, creating gate structures, draining
photon-generated charges and constructing output-amplifier stages
- article_number: 1609476
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1609476
-
html_url:
https://ieeexplore.ieee.org/document/1609476/
-
abstract_url:
https://ieeexplore.ieee.org/document/1609476/
-
publication_title: IEEE InternationalElectron Devices
Meeting, 2005. IEDM Technical Digest.
- conference_location: Washington, DC, USA
- conference_dates: 5-5 Dec. 2005
- publication_number: 10701
- is_number: 33791
- publication_year: 2005
- publication_date: 5-5 Dec. 2005
- start_page: 799
- end_page: 802
- citing_paper_count: 6
- citing_patent_count: 0
- download_count: 175
- insert_date: 20060403
-
index_terms:
-
ieee_terms:
- Charge coupled devices
- Image sensors
- Dark current
- Electrostatics
- Clocks
- Pixel
- Implants
- Digital images
- Solid state circuits
- Noise reduction
-
dynamic_index_terms:
- Electrostatic Potential
- Electric Potential
- Image Sensor
- Camera Sensor
- Thermal Noise
- Current Noise
- Dark Current
- Dark Noise
- Solid-state Sensors
- Silicon
- Denoising
- Noise Reduction
- Open Areas
- Voltage Drop
- Potential Drop
- IR Drop
- Electron Hole Pairs
- Doping Level
- Current Reduction
- Interface States
- Interface Conditions
- Video Signal
- Amplifier Output
- Charge Pump
- P-type Substrate
-
isbn_formats:
-
format: Print ISBN,
value: 0-7803-9268-X,
isbnType: Historical
-
authors:
-
Author Name: A.J.P. Theuwissen
Affiliation: DALSA Digital Imaging, Eindhoven,
Netherlands
Author URL:
https://ieeexplore.ieee.org/author/37282956500
ID: 37282956500
Order: 1
Author Affiliations:
- DALSA Digital Imaging, Eindhoven, Netherlands
-
Author Name: J.T. Bosiers
Affiliation: DALSA Digital Imaging, Eindhoven,
Netherlands
Author URL:
https://ieeexplore.ieee.org/author/37346909100
ID: 37346909100
Order: 2
Author Affiliations:
- DALSA Digital Imaging, Eindhoven, Netherlands
-
Author Name: E. Roks
Affiliation: DALSA Digital Imaging, Eindhoven,
Netherlands
Author URL:
https://ieeexplore.ieee.org/author/37346914400
ID: 37346914400
Order: 3
Author Affiliations:
- DALSA Digital Imaging, Eindhoven, Netherlands
Image Sensor
- sensor_type: CMOS
- resolution: not specified
- dynamic_range: not specified
- pixel_size: not specified
-
dark_current: 0.15 nA/cm² at room temperature (PPD in
CMOS)
Optical Data
- focal_length: not specified
- aperture: not specified
- field_of_view: not specified
- distortion: not specified
Performance Metrics
Applications & Benefits
-
cell_imaging: Cell imaging applications are likely
related to the medical devices mentioned, but not specified in detail.
-
benefits: Key benefits of using CMOS image sensors
include reduced dark current and dark-current fixed-pattern noise due to
the use of holes, which improve overall image quality.
Supporting Organizations
- supported_by: Philips, DALSA
Manuscript Details
- publication_date: 5-5 Dec. 2005
Relevancy Score
- score: 8
-
missing_fields:
- resolution
- dynamic_range
- pixel_size
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
request_ddb811db-fa59-4693-a3fe-f3b241249b0c-the_hole_role.json