The Adaptive Gain Integrating Pixel Detector Agipd A Detector For The
European Xfel Development And Status
- doi: 10.1109/NSSMIC.2009.5402196
-
title: The adaptive gain integrating pixel detector
(AGIPD): A detector for the European XFEL. development and status
- publisher: IEEE
- isbn: 978-1-4244-3962-1
- issn: 1082-3654
- partnum: 09CH38116
- rank: 3788
- access_type: LOCKED
- content_type: Conferences
-
abstract: The European XFEL under construction in
Hamburg will provide fully coherent, 100 fs long X-ray pulses, with 1012
photons at 12 keV. The high intensity per pulse will allow recording
diffraction patterns of single particles or small crystals in a single
shot. As a consequence the 2D detectors have to cope with a large
dynamic range in the images (one to 104 photons/pixel). An additional
challenge is the European XFEL machine: an Electron bunch train with 10
Hz repetition rate, consisting of up to 3,000 bunches with a 200 ns
spacing. This means that recorded images have to be stored inside the
pixel during the bunch trains and read out between bunch trains. In
order to meet these requirements, the European XFEL has launched 3
detector development projects. The AGIPD project is a collaboration
between DESY, PSI and the Universities of Bonn and Hamburg. The goal is
a 1000 ? 1000 pixel detector, with 200 ?m pixel size and a central hole
for the primary beam. The ASIC operates in charge integration mode: the
output of each pixel preamplifier is proportional to the charge from the
sensor generated by the X-rays. The input stage of the pixel cells will
have dynamically adjustable gains. The output signal is stored in an
analogue pipeline, which has to be a compromise between noise
performance and the number of images. 200 to 400 images have to be
readout and digitized in the 99.4 ms long bunch gap. The detector will
be built of 2 ? 8 fully depleted monolithic silicon sensors with a 2 ? 8
array of CMOS readout chips bump-bonded to these. The interface
electronics is designed to process 400 images in 99 msec, without
compromising single photon sensitivity or the full dynamic range. Since
the ASIC is the linchpin of the project, several MPW runs to test the
different aspects in terms of radiation hardness, noise and adaptive
switching are submitted. We will give a general overview and report on
the current status.
- article_number: 5402196
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5402196
-
html_url:
https://ieeexplore.ieee.org/document/5402196/
-
abstract_url:
https://ieeexplore.ieee.org/document/5402196/
-
publication_title: 2009 IEEE Nuclear Science Symposium
Conference Record (NSS/MIC)
- conference_location: Orlando, FL, USA
- conference_dates: 24 Oct.-1 Nov. 2009
- publication_number: 5384532
- is_number: 5401554
- publication_year: 2009
- publication_date: 24 Oct.-1 Nov. 2009
- start_page: 1817
- end_page: 1820
- citing_paper_count: 4
- citing_patent_count: 0
- download_count: 223
- insert_date: 20100129
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index_terms:
-
ieee_terms:
- Detectors
- X-ray imaging
- Dynamic range
- Pixel
- Application specific integrated circuits
- X-ray diffraction
- Photonic crystals
- Electrons
- Collaboration
- Educational institutions
-
author_terms:
- XFEL
- 2D detector
- Hybrid Pixel Detector
-
dynamic_index_terms:
- Pixel Detector
- X-ray Free-electron Laser
- Adaptive Gain
- Dynamic Range
- Additional Challenges
- Single Shot
- Small Crystals
- Large Dynamic Range
- University Of Bonn
- X-ray Pulses
- Electronic Interface
- Charge Density
- Charge Distribution
- Simulation Program
- Detection Head
- Memory Address
- Test Chip
-
isbn_formats:
-
format: CD,
value: 978-1-4244-3962-1,
isbnType: New-2005
-
format: Print ISBN,
value: 978-1-4244-3961-4,
isbnType: New-2005
-
authors:
-
Author Name: P. Göttlicher
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398309900
ID: 37398309900
Order: 1
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: H. Graafsma
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37322637300
ID: 37322637300
Order: 2
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: H. Hirsemann
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398312800
ID: 37398312800
Order: 3
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: S. Jack
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398313500
ID: 37398313500
Order: 4
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: B. Nilsson
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37409989000
ID: 37409989000
Order: 5
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: G. Potdevin
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398313900
ID: 37398313900
Order: 6
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: I. Sheviakov
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398313700
ID: 37398313700
Order: 7
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: F. Tian
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37396955100
ID: 37396955100
Order: 8
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: U. Trunk
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37322962200
ID: 37322962200
Order: 9
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: C. Youngman
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398315100
ID: 37398315100
Order: 10
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: M. Zimmer
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37395538500
ID: 37395538500
Order: 11
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: J. Becker
Affiliation: University of Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37395735800
ID: 37395735800
Order: 12
Author Affiliations:
- University of Hamburg, Germany
-
Author Name: E. Fretwurst
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37277177800
ID: 37277177800
Order: 13
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: R. Klanner
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37376925000
ID: 37376925000
Order: 14
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: H. Perrey
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398333400
ID: 37398333400
Order: 15
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: I. Pintilie
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37312561000
ID: 37312561000
Order: 16
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: A. K. Srivastava
Affiliation: Deutsches Electronen Synchrotron,
DESY, Hamburg, Germany
Author URL:
https://ieeexplore.ieee.org/author/37088607846
ID: 37088607846
Order: 17
Author Affiliations:
- Deutsches Electronen Synchrotron, DESY, Hamburg, Germany
-
Author Name: R. Dinapoli
Affiliation: University of Bonn, Germany
Author URL:
https://ieeexplore.ieee.org/author/37272630900
ID: 37272630900
Order: 18
Author Affiliations:
- University of Bonn, Germany
-
Author Name: B. Henrich
Affiliation: University of Bonn, Germany
Author URL:
https://ieeexplore.ieee.org/author/37394749800
ID: 37394749800
Order: 19
Author Affiliations:
- University of Bonn, Germany
-
Author Name: A. Mozzanica
Affiliation: University of Bonn, Germany
Author URL:
https://ieeexplore.ieee.org/author/37398338000
ID: 37398338000
Order: 20
Author Affiliations:
- University of Bonn, Germany
-
Author Name: B. Schmitt
Affiliation: University of Bonn, Germany
Author URL:
https://ieeexplore.ieee.org/author/37272322500
ID: 37272322500
Order: 21
Author Affiliations:
- University of Bonn, Germany
-
Author Name: X. Shi
Affiliation: University of Bonn, Germany
Author URL:
https://ieeexplore.ieee.org/author/37401245900
ID: 37401245900
Order: 22
Author Affiliations:
- University of Bonn, Germany
-
Author Name: M. Karagounis
Affiliation: University of Bonn, Germany
Author URL:
https://ieeexplore.ieee.org/author/37269244100
ID: 37269244100
Order: 23
Author Affiliations:
- University of Bonn, Germany
-
Author Name: H. Krüger
Affiliation: University of Bonn, Germany
Author URL:
https://ieeexplore.ieee.org/author/37277772000
ID: 37277772000
Order: 24
Author Affiliations:
- University of Bonn, Germany
Image Sensor
- sensor_type: CMOS
- resolution: 1000x1000 pixels
- dynamic_range: 10^4 photons/pixel
- pixel_size: 200 μm
- dark_current: not specified
Optical Data
- focal_length: not specified
- aperture: not specified
- field_of_view: not specified
- distortion: not specified
Performance Metrics
Applications & Benefits
-
cell_imaging: recording diffraction patterns of single
macromolecules or small crystals
-
benefits: allows high dynamic range imaging with single
photon sensitivity and fast readout capabilities
Supporting Organizations
-
supported_by: European XFEL GmbH, Helmholtz
Association, DESY, PSI, University of Bonn, University of Hamburg
Manuscript Details
- publication_date: 24 Oct.-1 Nov. 2009
Relevancy Score
- score: 8
-
missing_fields:
- focal_length
- aperture
- field_of_view
- distortion
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
request_2d2376fd-c92e-488a-8044-800a95f1e944-the_adaptive_gain_integrating_pixel_detector_agipd_a_detector_for_the_european_xfel_development_and_status.json