T2000 Iss Ft Solution Using Cp Light Source

• doi: 10.1109/CSTIC55103.2022.9856924
• title: T2000 ISS FT Solution Using CP Light Source
• publisher: IEEE
• isbn: 978-1-6654-9759-6
• issn:
• rank: 3698
• access_type: LOCKED
• content_type: Conferences
• abstract: We introduce the T2000 ISS final test (FT) solution using a chip probing (CP) light source for high-end image sensor package devices. The image sensor market is expanding day by day due in part to the influence of smartphones. Although charge-coupled devices (CCD) used to be the mainstream, CMOS Image Sensor (CIS) now account for the great majority of the market. While image sensor for smartphones now account for the great majority of shipments, demand for high-performance digital cameras such as single-lens reflex cameras is still alive and well, with higher image quality, faster data rates, and increased output pins. Progress has been made in developing technology that can capture the same or higher level of image quality as such images, and this technology has now matured. C-PHY 3.5Gsps simultaneous testing of up to 64 has been successfully measured in CP on an experimental trial. However, in the mass production of CIS, few tests are using a light source in FT. Or, even if a light source is used, most of the tests are done using a simple light source. In this paper, we introduce an automated test equipment (ATE) developed in cooperation with handler, socket, and light source vendors to meet the demand in the high-end digital camera market for the same level of testing in FT as CP. By using the same light source as that used in CP, there is no difference in performance. The light source is installed inside the test head, CIS need to orientation is the opposite of normal. In terms of temperature control, if the test items are the same as CP, it will take longer to device test and it will be difficult to keep the temperature constant in high temperature test. This solution solves these problems and achieves the same level of testing in FT as CP.
• article_number: 9856924
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9856924
• html_url: https://ieeexplore.ieee.org/document/9856924/
• abstract_url: https://ieeexplore.ieee.org/document/9856924/
• publication_title: 2022 China Semiconductor Technology International Conference (CSTIC)
• conference_location: Shanghai, China
• conference_dates: 20-21 June 2022
• publication_number: 9856647
• is_number: 9856709
• publication_year: 2022
• publication_date: 20-21 June 2022
• start_page: 1
• end_page: 3
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 115
• insert_date: 20220823
• index_terms:
  • ieee_terms:
    • Temperature sensors
    • Performance evaluation
    • Image quality
    • Mass production
    • Sockets
    • Digital cameras
    • Temperature control
  • dynamic_index_terms:
    • Light Source
    • Image Quality
    • Test Level
    • Image Sensor
    • Camera Sensor
    • Device Packaging
    • High-temperature Test
    • Printed Circuit Board
    • Speed Signal
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-6654-9759-6, isbnType: New-2005
  • format: USB ISBN, value: 978-1-6654-9757-2, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-6654-9758-9, isbnType: New-2005
• authors:
  • Author Name: Hiroyuki. Kobayashi
    Affiliation: Advanest (China) Co., Ltd, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37089499268
    ID: 37089499268
    Order: 1
    Author Affiliations:
    • Advanest (China) Co., Ltd, Shanghai, China
  • Author Name: Bin Gong
    Affiliation: Advanest (China) Co., Ltd, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37089499459
    ID: 37089499459
    Order: 2
    Author Affiliations:
    • Advanest (China) Co., Ltd, Shanghai, China
  • Author Name: Senter. Liu
    Affiliation: Advanest (China) Co., Ltd, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37089497974
    ID: 37089497974
    Order: 3
    Author Affiliations:
    • Advanest (China) Co., Ltd, Shanghai, China
  • Author Name: Shenqi. Cai
    Affiliation: Advanest (China) Co., Ltd, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37089497828
    ID: 37089497828
    Order: 4
    Author Affiliations:
    • Advanest (China) Co., Ltd, Shanghai, China

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Not specified
• benefits: Not specified

Supporting Organizations

• supported_by: Advantest (China) Co., Ltd, Shanghai, China

Manuscript Details

• publication_date: 20-21 June 2022

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits

Processed JSON Filename

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