Superresolution Line Scan Image Sensor For Multimodal Microscopy

• doi: 10.1109/TBCAS.2018.2840831
• title: Superresolution Line Scan Image Sensor for Multimodal Microscopy
• publisher: IEEE
• isbn:
• issn: 1940-9990
• rank: 3678
• access_type: LOCKED
• content_type: Journals
• abstract: A low-cost contact scanning microscope is presented which performs optical imaging of millimeter-scale samples with multiple sensory modalities at a spatial resolution better than the pixel size in both x and y dimensions. The 7.5 mm × 3.2 mm 0.35 μm CMOS image sensor is comprised of 214 scanning lines of 256 pixels, each line horizontally shifted by 300 nm with respect to the adjacent lines. When scanning in they dimension, this results in a staircase-like staggered-pixels organization with an effective spatial resolution in the x dimension of less than the pixel size, with a theoretical limit of 300 nm, subject to the light diffraction limit and to photodiode size-dependent spatial aliasing. The height of the resulting pixel “staircases” is capped at 2.5 mm by wrapping the 215th row back to the first row, yielding an approximately 2 mm × 2.5 mm instantaneous scanning window size. The spatial resolution in they dimension is set by the sample scanning rate and the frame rate, subject to the same limitations. Integration of multiple scanning lines naturally lends itself to the inclusion of multiple sensory modalities, with five modalities included as an example: High-resolution (up to 300 nm), fluorescence-sensitive, and triple-orientation light polarization-sensitive pixels. The resulting modified scanning pattern is digitized by on-chip column-parallel 2nd order Delta-Sigma ADCs with ENOB of 9.1 and is reconstructed into a full-resolution image in software. Experimental measurements, where contact-scanning is emulated by the sample image moving on an LCD monitor and projected through a lens, support the validity of the presented concept.
• article_number: 8411178
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8411178
• html_url: https://ieeexplore.ieee.org/document/8411178/
• abstract_url: https://ieeexplore.ieee.org/document/8411178/
• publication_title: IEEE Transactions on Biomedical Circuits and Systems
• conference_location:
• conference_dates:
• publication_number: 4156126
• is_number: 8500778
• publication_year: 2018
• publication_date: Oct. 2018
• start_page: 1165
• end_page: 1176
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 475
• insert_date: 20180716
• index_terms:
  • ieee_terms:
    • Microscopy
    • Spatial resolution
    • Apertures
    • CMOS image sensors
  • author_terms:
    • Contact imaging
    • biosensors
    • fluorescence imaging
    • super-resolution and high-resolution imaging
    • CMOS image sensors
    • lens-free imaging
    • line scanning imagers
    • multi-modal imaging
    • photodiode
    • polarization
    • integrated circuits
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Line Scan
    • Spatial Resolution
    • Scan Rate
    • Pixel Size
    • Images Of Samples
    • Frame Rate
    • Sensory Modalities
    • LCD Monitor
    • Horizontal Shift
    • Illumination
    • Lighting
    • Field Of View
    • Field-of-view
    • High-resolution Images
    • Imaging Modalities
    • Single Image
    • Wavelength Of Light
    • Wavelengths Of Light
    • Multiple Images
    • Vertical Dimension
    • Horizontal Dimension
    • Small Aperture
    • Sub-pixel Resolution
    • Commercial Imaging
    • Image Shift
    • Super-resolution Algorithms
    • Pixel Array
    • Pixel Column
    • Pixel Width
    • Polarizing Filter
    • Pixel Line
    • Effective Pixel Size
• authors:
  • Author Name: Chengzhi Winston Liu
    Affiliation: Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/37086488008
    ID: 37086488008
    Order: 1
    Author Affiliations:
    • Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
  • Author Name: Arshya Feizi
    Affiliation: Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/37086487793
    ID: 37086487793
    Order: 2
    Author Affiliations:
    • Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
  • Author Name: Navid Sarhangnejad
    Affiliation: Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/38233403900
    ID: 38233403900
    Order: 3
    Author Affiliations:
    • Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
  • Author Name: Glenn Gulak
    Affiliation: Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/38556845900
    ID: 38556845900
    Order: 4
    Author Affiliations:
    • Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
  • Author Name: Roman Genov
    Affiliation: Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada
    Author URL: https://ieeexplore.ieee.org/author/37270856200
    ID: 37270856200
    Order: 5
    Author Affiliations:
    • Department of Electrical and Computer Engineering, University of Toronto, Toronto, ON, Canada

Image Sensor

• sensor_type: CMOS
• resolution: 214 scanning lines of 256 pixels
• dynamic_range: not explicitly stated
• pixel_size: 300 nm x 1200 nm for high-resolution pixels, 5 µm for other pixels
• dark_current: not explicitly stated

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: 2 mm x 2.5 mm (scanning window size)
• distortion: not specified

Performance Metrics

• frame_rate: approximately 18 scans per second (15 full scans per second), with effective Nyquist sampling rate of 7.8 ksps
• signal_to_noise_ratio: not specified but SNDR measured at 56.6 dB
• sensitivity: not explicitly stated but mentioned SNR is affected by small photodiode
• power_consumption: not specified but mentions efficiencies in the multiplexing process.
• noise: not explicitly stated but mentions fixed pattern noise reduction techniques such as median filtering.

Applications & Benefits

• cell_imaging: Used for imaging bubbles in microfluidic channels, daphnia pulex, and mouse embryonic stem cells.
• benefits: Low-cost, compact, multimodal imaging for biomedical applications.

Supporting Organizations

• supported_by: Natural Sciences and Engineering Research Council of Canada (NSERC), Canadian Microelectronics Corporation (CMC)

Manuscript Details

• publication_date: Oct. 2018

Relevancy Score

• score: 10

Processed JSON Filename

request_468d694d-c9fa-4c81-90a2-cb559eb979d6-superresolution_line_scan_image_sensor_for_multimodal_microscopy.json