Superresolution Imaging Beyond The Pixel Size Limit

• doi: 10.1109/CICC.2008.4672135
• title: Super-resolution: Imaging beyond the pixel size limit
• publisher: IEEE
• isbn: 978-1-4244-2019-3
• issn: 2152-3630
• partnum: 08CH37987
• rank: 3675
• access_type: LOCKED
• content_type: Conferences
• abstract: We have implemented a new high resolution imaging system independent of the image sensorpsilas pixel size. This super-resolution is achieved by integrating a nano-aperture patterned in the first metal layer within the pixel using a standard CMOS process. The image sensorpsilas focal plane is scanned with a sub-micron step to obtain the super-resolution image. To experimentally verify the operation of our technique, we have fabricated a standard 3-Transistors (3T) active pixel sensors with integrated nano-apertures in a 0.13 mum CMOS technology. Here, we describe the concept of our super-resolution imaging and elaborate on our fabricated design and experimental setup.
• article_number: 4672135
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4672135
• html_url: https://ieeexplore.ieee.org/document/4672135/
• abstract_url: https://ieeexplore.ieee.org/document/4672135/
• publication_title: 2008 IEEE Custom Integrated Circuits Conference
• conference_location: San Jose, CA, USA
• conference_dates: 21-24 Sept. 2008
• publication_number: 4665385
• is_number: 4671999
• publication_year: 2008
• publication_date: 21-24 Sept. 2008
• start_page: 515
• end_page: 518
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 425
• insert_date: 20081117
• index_terms:
  • ieee_terms:
    • Image resolution
    • Pixel
    • Signal resolution
    • Image sensors
    • CMOS technology
    • Optical sensors
    • High-resolution imaging
    • Lenses
    • Optical imaging
    • Digital images
  • dynamic_index_terms:
    • Pixel Size
    • High-resolution
    • High-resolution Images
    • Focal Plane
    • Back Focal Plane
    • Image Sensor
    • Camera Sensor
    • Metal Layer
    • CMOS Technology
    • CMOS Process
    • Sensor Pixel
    • Standard CMOS
    • Numerical Simulations
    • Numerical Model
    • Image Processing
    • Image Resolution
    • Digital Images
    • Separation Distance
    • Amount Of Light
    • Light Quantity
    • Good Image
    • Aperture Size
    • Illumination Intensity
    • Need For Processing
    • Optical Lens
    • Optical Lenses
    • Optical Aberrations
    • Lens Aberrations
    • Monochromatic Aberrations
    • Diffraction Rings
    • Airy Disk
    • Airy Pattern
    • Adjacent Pixels
    • Equivalent Size
    • Sensor Size
• isbn_formats:
  • format: CD, value: 978-1-4244-2019-3, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-2018-6, isbnType: New-2005
• authors:
  • Author Name: Tamer A. Elkhatib
    Affiliation: Electrical, Computers and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, USA
    Author URL: https://ieeexplore.ieee.org/author/37584953900
    ID: 37584953900
    Order: 1
    Author Affiliations:
    • Electrical, Computers and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, USA
  • Author Name: Khaled N. Salama
    Affiliation: Electrical, Computers and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, USA
    Author URL: https://ieeexplore.ieee.org/author/37543500500
    ID: 37543500500
    Order: 2
    Author Affiliations:
    • Electrical, Computers and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY, USA

Image Sensor

• sensor_type: CMOS
• resolution: 1 megapixel
• dynamic_range: Not specified
• pixel_size: 5 µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• signal_to_noise_ratio: 30 dB (minimum for good quality imaging)
• sensitivity: 300 Lux for illumination intensity

Applications & Benefits

• cell_imaging: Enables very high resolution imaging for applications such as near-field in vivo imaging and digital microscopy.
• benefits: Allows for super-resolution imaging independent of pixel size, good dynamic range, and low crosstalks between adjacent pixels.

Supporting Organizations

• supported_by: George Soliman at Rensselaer Polytechnic Institute

Manuscript Details

• publication_date: 21-24 Sept. 2008

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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