Subthz High Gain Wideband Low Noise Amplifiers In 90Nm Rf Cmos Technology
- doi: 10.1109/ICECS.2010.5724482
-
title: Sub-THz high gain wide-band low noise amplifiers
in 90nm RF CMOS technology
- publisher: IEEE
- isbn: 978-1-4244-8156-9
- issn:
- partnum: 10EX4661
- rank: 3664
- access_type: LOCKED
- content_type: Conferences
-
abstract: In the future, CMOS technology is expected to
enable low-cost sub-THz applications such as high data-rate
communication links, passive and active imaging and sensor systems, and
instrumentation and measurements equipment. This paper presents key
design techniques for different CMOS LNA topologies with over 20 GHz
bandwidth ranging from 90 GHz to 110 GHz. The proposed LNA topologies
are, the three-stage cascode RF NMOS configuration and four-stage Common
Gate followed by Common Source configuration. Simulation results show
that the first topology can achieve a peak gain of 23.5 dB at 92.1 GHz
with a 3-dB bandwidth of 25 GHz, and a noise figure less than 5.5 dB
over the entire bandwidth. The achieved peak gain from the second
topology is 23.2 dB at 105 GHz with a 3-dB bandwidth of 15 GHz and a
noise figure less than 6.1 dB over the entire bandwidth. The LNAs are
designed in 90 nm RF CMOS and consume 27 mW/40 mW for topology
I/topology II respectively.
- article_number: 5724482
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5724482
-
html_url:
https://ieeexplore.ieee.org/document/5724482/
-
abstract_url:
https://ieeexplore.ieee.org/document/5724482/
-
publication_title: 2010 17th IEEE International
Conference on Electronics, Circuits and Systems
- conference_location: Athens, Greece
- conference_dates: 12-15 Dec. 2010
- publication_number: 5720492
- is_number: 5724436
- publication_year: 2010
- publication_date: 12-15 Dec. 2010
- start_page: 174
- end_page: 177
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 666
- insert_date: 20110307
-
index_terms:
-
ieee_terms:
- CMOS integrated circuits
- Voltage-controlled oscillators
- CMOS technology
- Logic gates
-
dynamic_index_terms:
- CMOS Technology
- 90-nm CMOS
- 90-nm CMOS Technology
- Simulation Results
- Noise Figure
- Peak Gain
- GHz Bandwidth
- Entire Bandwidth
- Frequency Band
- Transmission Line
- Cadence
- Circuit Design
- Active Devices
- Device Size
- Electromagnetic Simulation
- CMOS Process
- Output Impedance
- Entire Band
- Input Matching
- Transistor Size
- Transistor Count
- Output Matching
-
isbn_formats:
-
format: CD,
value: 978-1-4244-8156-9,
isbnType: New-2005
-
format: Print ISBN,
value: 978-1-4244-8155-2,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-4244-8157-6,
isbnType: New-2005
-
authors:
-
Author Name: Amneh Akour
Affiliation: ElectroScience Lab/VLSI Laboratory,
Ohio State Uinversity, Columbus, OH, USA
Author URL:
https://ieeexplore.ieee.org/author/37541169800
ID: 37541169800
Order: 1
Author Affiliations:
-
ElectroScience Lab/VLSI Laboratory, Ohio State Uinversity,
Columbus, OH, USA
-
Author Name: Waleed Khalil
Affiliation: ElectroScience Lab/VLSI Laboratory,
Ohio State Uinversity, Columbus, OH, USA
Author URL:
https://ieeexplore.ieee.org/author/37278870600
ID: 37278870600
Order: 2
Author Affiliations:
-
ElectroScience Lab/VLSI Laboratory, Ohio State Uinversity,
Columbus, OH, USA
-
Author Name: Mohammed Ismail
Affiliation: ElectroScience Lab/VLSI Laboratory,
Ohio State Uinversity, Columbus, OH, USA
Author URL:
https://ieeexplore.ieee.org/author/37276742100
ID: 37276742100
Order: 3
Author Affiliations:
-
ElectroScience Lab/VLSI Laboratory, Ohio State Uinversity,
Columbus, OH, USA
Image Sensor
- sensor_type: CMOS
- resolution: Not specified
- dynamic_range: Not specified
- pixel_size: Not specified
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
-
power_consumption: 27mW/40mW for different topologies
Applications & Benefits
- cell_imaging: Not specified
- benefits: Not specified
Supporting Organizations
-
supported_by: The Ohio State University, ElectroScience
Lab, VLSI Lab
Manuscript Details
- publication_date: 12-15 Dec. 2010
Relevancy Score
- score: 3
-
missing_fields:
- resolution
- dynamic_range
- pixel_size
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- noise
- cell_imaging
- benefits
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