Study On The Tracking Pointing Accuracy Degeneration Of Optical Communication System For Cmos Sensor Irradiation Damage

• doi: 10.1109/ICREED.2018.8905073
• title: Study on the Tracking & Pointing Accuracy Degeneration of Optical Communication System for CMOS Sensor Irradiation Damage
• publisher: IEEE
• isbn: 978-1-5386-4136-1
• issn:
• rank: 3656
• access_type: LOCKED
• content_type: Conferences
• abstract: The CMOS sensor in space optical communication system may generate irradiation-induced noise, leading to deviation of image centroid. Based on test data, simulated defect spots have been used for calculating the value by grey-level centroid algorithm. It shows that both the amount and position of defect pixels contribute to deviation of image centroid and the accuracy decreasing.
• article_number: 8905073
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8905073
• html_url: https://ieeexplore.ieee.org/document/8905073/
• abstract_url: https://ieeexplore.ieee.org/document/8905073/
• publication_title: 2018 International Conference on Radiation Effects of Electronic Devices (ICREED)
• conference_location: Beijing, China
• conference_dates: 16-18 May 2018
• publication_number: 8896805
• is_number: 8905046
• publication_year: 2018
• publication_date: 16-18 May 2018
• start_page: 1
• end_page: 3
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 57
• insert_date: 20191121
• index_terms:
  • author_terms:
    • CMOS sensor
    • gray centroid algorithm
    • irradiation damage
    • optical communication
    • tracking & pointing accuracy
  • dynamic_index_terms:
    • Optical System
    • Optical Devices
    • Optical Communication
    • Optical Communication Systems
    • Image Quality
    • Total Effect
    • Blue Dots
    • Radiation Resistance
    • Radiation-resistant
    • Radiotherapy Resistance
    • Dark Current
    • Displacement Effect
    • Displacement Events
    • Total Displacement
    • Centroid Values
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5386-4136-1, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5386-4135-4, isbnType: New-2005
• authors:
  • Author Name: Xiaoliang Li
    Affiliation: China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37087099310
    ID: 37087099310
    Order: 1
    Author Affiliations:
    • China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
  • Author Name: Pengwei Li
    Affiliation: China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/38238238000
    ID: 38238238000
    Order: 2
    Author Affiliations:
    • China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
  • Author Name: Qingkui Yu
    Affiliation: China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/38239215500
    ID: 38239215500
    Order: 3
    Author Affiliations:
    • China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
  • Author Name: Lei Luo
    Affiliation: China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37577441000
    ID: 37577441000
    Order: 4
    Author Affiliations:
    • China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
  • Author Name: Bo Mei
    Affiliation: China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/38134312900
    ID: 38134312900
    Order: 5
    Author Affiliations:
    • China Academy of Space Technology, National Innovation Center of Radiation Application, Beijing, China

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: 6.7 μm×6.7 μm
• dark_current: 15.3 times increase at 2×1011 p/cm2 (proton), 56.6 times increase at 100 krad (Si)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Not specified
• benefits: Not specified

Supporting Organizations

• supported_by: National Natural Science Foundation of China (Grant No.11475256, Grant No.61634008)

Manuscript Details

• publication_date: 16-18 May 2018

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits

Processed JSON Filename

request_d5123521-eeea-4455-bd52-64329f19d06c-study_on_the_tracking__pointing_accuracy_degeneration_of_optical_communication_system_for_cmos_sensor_irradiation_damage.json