Study On Low Noise Cmos Image Sensor

• doi: 10.1109/CISP.2010.5646698
• title: Study on low noise CMOS image sensor
• publisher: IEEE
• isbn: 978-1-4244-6515-6
• issn:
• partnum: 10EX4286
• rank: 3653
• access_type: LOCKED
• content_type: Conferences
• abstract: With the advance of semiconductor technology and the development of multimedia techniques, CMOS image sensor is extensively applied in medical and other industrial areas. Integrator array is the front-end processing circuit of CMOS image sensor, whose performance directly determines the image quality generated by image sensor. Currently, integrator array has become one research hot spot. The main works of this paper are focused on the low noise image sensor design and implement. The test results show that the expected performance of the chip can be fulfilled.
• article_number: 5646698
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5646698
• html_url: https://ieeexplore.ieee.org/document/5646698/
• abstract_url: https://ieeexplore.ieee.org/document/5646698/
• publication_title: 2010 3rd International Congress on Image and Signal Processing
• conference_location: Yantai, China
• conference_dates: 16-18 Oct. 2010
• publication_number: 5623876
• is_number: 5646187
• publication_year: 2010
• publication_date: 16-18 Oct. 2010
• start_page: 2062
• end_page: 2065
• citing_paper_count: 4
• citing_patent_count: 0
• download_count: 926
• insert_date: 20101129
• index_terms:
  • ieee_terms:
    • Noise
    • Arrays
    • CMOS image sensors
    • Analog circuits
    • Photodiodes
    • Charge coupled devices
  • author_terms:
    • CMOS image sensor
    • Integrator array
    • Noise transfer
    • CDS
  • dynamic_index_terms:
    • Low Noise
    • Image Sensor
    • Camera Sensor
    • Processing Circuit
    • Signal Processing
    • Food Safety
    • CCD Camera
    • Charge-coupled Device
    • Digital Images
    • Photocurrent
    • Photodiode Array
    • Digital Signal
    • Metal Oxide Semiconductor
    • Thermal Noise
    • Current Noise
    • Circuit Design
    • Mixed Signals
    • Control Circuit
    • Digital Circuits
    • Digital Circuitry
    • Layout Design
    • System-on-chip
    • Total Noise
    • Analog Circuits
    • Complete Integration
    • Voltage Noise
    • Driver Circuit
    • Virtual Ground
    • Amplifier Input
    • Standard CMOS
    • Random Noise
    • Channel Noise
    • Offset Voltage
    • Processor Chip
    • Digital Image Processing
    • Image Optimization
    • Boundary Extraction
    • Computer Image Processing
• isbn_formats:
  • format: CD, value: 978-1-4244-6515-6, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-6513-2, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4244-6516-3, isbnType: New-2005
• authors:
  • Author Name: Xu Wang
    Affiliation: VLSI and System Laboratory, Beijing University of Technology, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/38553967300
    ID: 38553967300
    Order: 1
    Author Affiliations:
    • VLSI and System Laboratory, Beijing University of Technology, Beijing, China
  • Author Name: Hongyan Yang
    Affiliation: VLSI and System Laboratory, Beijing University of Technology, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37596712700
    ID: 37596712700
    Order: 2
    Author Affiliations:
    • VLSI and System Laboratory, Beijing University of Technology, Beijing, China
  • Author Name: Wuchen Wu
    Affiliation: VLSI and System Laboratory, Beijing University of Technology, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37292827600
    ID: 37292827600
    Order: 3
    Author Affiliations:
    • VLSI and System Laboratory, Beijing University of Technology, Beijing, China

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 1MHz
• noise: 830uV-230uV at Cint from 0.5pF to 3.5pF

Applications & Benefits

• cell_imaging: Used in medical imaging, safety inspection, quality monitoring, military reconnaissance.
• benefits: Lower power, lower noise, wider dynamic range, lower cost.

Supporting Organizations

• supported_by: Detection Technology, Inc.

Manuscript Details

• publication_date: 16-18 Oct. 2010

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_7b2d7e05-dad1-40b7-b6ca-bd58c2d89edd-study_on_low_noise_cmos_image_sensor.json