Study Of Limitations On Pixel Size Of Very High Resolution Image Sensors

• doi: 10.1109/NRSC.2001.929154
• title: Study of limitations on pixel size of very high resolution image sensors
• publisher: IEEE
• isbn: 977-5031-68-0
• issn:
• partnum: 01EX462
• rank: 3647
• access_type: LOCKED
• content_type: Conferences
• abstract: The employment of small pixel size is very crucial to the physical implementation of very high resolution CMOS APS image sensors. This is because of the restriction imposed by the required lithography method utilized in modern sub-micron CMOS fabrication processes on the size of the image sensor chip. Furthermore, the cost of a CMOS active pixel sensor (APS) image sensor chip substantially goes down as the pixel size goes down, whether the image sensor chip is very high resolution or not. However, there exist several optical limitations on the pixel size that make it imprudent to further reduce the pixel size beyond those limitations. A major limitation on the reduction of pixel size is that pixel sensitivity is significantly reduced as pixel size goes down. One may take refuge in using low f-number optics to allow more photons into the pixel to compensate for the reduced sensitivity of the small pixel. However, the employment of low f-number optics is associated with high cost, which may offset the low cost advantage of image sensor chips that have small pixels. Additionally, low f-number optics may introduce undesirable aberrations. Another major limitation on the reduction of pixel size is that cross-talk is considerably increased as the pixel size is decreased. Keeping cross-talk low is very critical to the proper operation of an image sensor, particularly color image sensors.
• article_number: 929154
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=929154
• html_url: https://ieeexplore.ieee.org/document/929154/
• abstract_url: https://ieeexplore.ieee.org/document/929154/
• publication_title: Proceedings of the Eighteenth National Radio Science Conference. NRSC'2001 (IEEE Cat. No.01EX462)
• conference_location: Mansoura, Egypt
• conference_dates: 27-29 March 2001
• publication_number: 7390
• is_number: 20086
• publication_year: 2001
• publication_date: 27-29 March 2001
• start_page: 15
• end_page: 28 vol.1
• citing_paper_count: 4
• citing_patent_count: 1
• download_count: 808
• insert_date: 20020807
• index_terms:
  • ieee_terms:
    • Pixel
    • Image resolution
    • Image sensors
    • CMOS image sensors
    • Optical crosstalk
    • Optical sensors
    • Costs
    • Employment
    • Lithography
    • CMOS process
  • dynamic_index_terms:
    • Pixel Size
    • Image Sensor
    • Camera Sensor
    • Major Limitation
    • Reduction In Size
    • Fabrication Process
    • Small Pixel
    • Optical Limiting
    • Active Area
    • CCD Camera
    • Charge-coupled Device
    • Maximum Size
    • Focal Length
    • Focal Distance
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Metal Layer
    • Pixel Area
    • Sensor Array
    • Fill Factor
    • Neighboring Pixels
    • Neighborhood Pixels
    • Central Pixel
    • Pixel Pitch
    • External Angle
    • Pixel Of Interest
    • Fraction Of Signal
    • Lithography Process
    • Sensor Pixel
    • Pixel Array
    • Edge Pixels
    • Reflective Objects
    • Chip Area
• isbn_formats:
  • format: Print ISBN, value: 977-5031-68-0, isbnType: Historical
• authors:
  • Author Name: E.-S. Eid
    Affiliation: Alexandria University, Alexandria, Egypt
    Author URL: https://ieeexplore.ieee.org/author/37338875800
    ID: 37338875800
    Order: 1
    Author Affiliations:
    • Alexandria University, Alexandria, Egypt

Image Sensor

• sensor_type: CMOS Active Pixel Sensor (APS)
• resolution: 4K x 2K
• dynamic_range: not specified
• pixel_size: 3.87 pm to 6.71 pm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: Cost reduction compared to CCDs, high level of circuit integration, and significant functionality advantage.

Supporting Organizations

• supported_by: Photobit Technology Corporation

Manuscript Details

• publication_date: 27-29 March 2001

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging

Processed JSON Filename

request_25ae2418-2bd5-45c9-b15e-171a9655fb62-study_of_limitations_on_pixel_size_of_very_high_resolution_image_sensors.json