Study And Design Of An Integrated Cmos Laser Diode Driver For An Itofbased 3D Image Sensor

• doi:
• title: Study and Design of an Integrated CMOS Laser Diode Driver for an iToF-based 3D Image Sensor
• publisher: VDE
• isbn: 978-3-8007-5225-6
• issn:
• rank: 3642
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a study of two architectures for designing an integrated CMOS Laser Diode Driver (LDD) intended for a 3D image sensor used in mobile applications and based on the indirect Time-of-Flight (iToF) measurement. Architectures are focused on two different driving topologies: series and shunt which means the laser diode is connected either in series or parallel with a switching element in order to provide laser pulses. Two LDD prototypes implemented in a 130 nm CMOS technology are able to provide programmable current pulses up to 3 A with a 2.5 ns pulse width at a maximum 200 MHz Pulse Repetition Frequency (PRF).
• article_number: 9097700
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9097700
• html_url: https://ieeexplore.ieee.org/document/9097700/
• abstract_url: https://ieeexplore.ieee.org/document/9097700/
• publication_title: CIPS 2020; 11th International Conference on Integrated Power Electronics Systems
• conference_location: Berlin, Germany
• conference_dates: 24-26 March 2020
• publication_number: 9097645
• is_number: 9097646
• publication_year: 2020
• publication_date: 24-26 March 2020
• start_page: 1
• end_page: 6
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 288
• insert_date: 20200521
• index_terms:
  • dynamic_index_terms:
    • Diode Laser
    • Image Sensor
    • Camera Sensor
    • Laser Diode Driver
    • Mobile App
    • Smartphone App
    • Smartphone Application
    • Mobile Application
    • Laser Pulse
    • Pulse Width
    • Pulsewidth Modulation
    • Current Pulse
    • Repetition Frequency
    • Pulse Repetition Frequency
    • High Voltage
    • Higher Tendency
    • Low Voltage
    • Current Source
    • Current Regulations
    • Duty Cycle
    • Peak Current
    • Input Voltage
    • Short Pulse
    • Primary Results
    • Current Sensor
    • Test Bench
    • Overvoltage
    • Vertical-cavity Surface-emitting Lasers
    • Digital Features
    • Parasitic Inductance
    • Gate Driver
    • Power Stage
    • Test Board
    • Silicon Area
    • Output Capacitor
    • Voltage Spikes
    • Current Spike
    • Voltage Drop
    • Potential Drop
    • IR Drop
• isbn_formats:
  • format: Print ISBN, value: 978-3-8007-5225-6, isbnType: New-2005
• authors:
  • Author Name: Romain David
    Affiliation:
    Author URL:
    ID:
    Order: 1
    
  • Author Name: Bruno Allard
    Affiliation:
    Author URL:
    ID:
    Order: 2
    
  • Author Name: Xavier Branca
    Affiliation:
    Author URL:
    ID:
    Order: 3
    
  • Author Name: Charles Joubert
    Affiliation:
    Author URL:
    ID:
    Order: 4
    

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: not specified

Supporting Organizations

• supported_by: University of Lyon, STMicroelectronics, CNRS

Manuscript Details

• publication_date: 24-26 March 2020

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • publication_date

Processed JSON Filename

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