Status Counting Double Edge Slope Adc For Cmos Image Sensors

• doi: 10.1109/ICSICT.2018.8564845
• title: Status Counting Double Edge Slope ADC for CMOS Image Sensors
• publisher: IEEE
• isbn: 978-1-5386-4442-3
• issn:
• rank: 3632
• access_type: LOCKED
• content_type: Conferences
• abstract: Compared with single edge slope ADC used in CMOS image sensors, double edge counting can half the conversion time without increase the counting clock frequency. In this paper, we present a power and area improved status counting double edge concept. It can be implemented together with double clock counting architecture we presented before, which is very suitable for low power and small pixel pitch column ADCs of CMOS image sensors. A fabricated 43M CMOS image sensor is used to verify this ADC. Only 2.8μs is needed for the 12-bit conversion with 1GHz/31.25MHz clock counting. More than 67.5dB dynamic range is achieved.
• article_number: 8564845
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8564845
• html_url: https://ieeexplore.ieee.org/document/8564845/
• abstract_url: https://ieeexplore.ieee.org/document/8564845/
• publication_title: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
• conference_location: Qingdao, China
• conference_dates: 31 Oct.-3 Nov. 2018
• publication_number: 8540788
• is_number: 8564801
• publication_year: 2018
• publication_date: 31 Oct.-3 Nov. 2018
• start_page: 1
• end_page: 3
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 321
• insert_date: 20181206
• index_terms:
  • ieee_terms:
    • Clocks
    • CMOS image sensors
    • Image edge detection
    • Dynamic range
    • Power demand
    • Conferences
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Double Edge
    • Double Slope
    • Double Counting
    • Conversion Time
    • Clock Frequency
    • Single Edge
    • Pixel Pitch
    • Single Slope
    • Power Consumption
    • Memory Cells
    • Single Counting
    • Extra Bits
    • Extra Memory
    • Rising Edge
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5386-4442-3, isbnType: New-2005
  • format: CD, value: 978-1-5386-4439-3, isbnType: New-2005
  • format: Print ISBN, value: 978-1-5386-4440-9, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5386-4441-6, isbnType: New-2005
• authors:
  • Author Name: Cheng Ma
    Affiliation: Gpixel Inc, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37085845232
    ID: 37085845232
    Order: 1
    Author Affiliations:
    • Gpixel Inc, Changchun, China
  • Author Name: Guo-Song Xin
    Affiliation: Gpixel Inc, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37086538286
    ID: 37086538286
    Order: 2
    Author Affiliations:
    • Gpixel Inc, Changchun, China
  • Author Name: Jing Li
    Affiliation: Gpixel Inc, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37085582419
    ID: 37085582419
    Order: 3
    Author Affiliations:
    • Gpixel Inc, Changchun, China
  • Author Name: Yang Li
    Affiliation: Gpixel Inc, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37086111183
    ID: 37086111183
    Order: 4
    Author Affiliations:
    • Gpixel Inc, Changchun, China
  • Author Name: Yang Liu
    Affiliation: Gpixel Inc, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37086116984
    ID: 37086116984
    Order: 5
    Author Affiliations:
    • Gpixel Inc, Changchun, China
  • Author Name: Quan Zhou
    Affiliation: Gpixel Inc, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37086112513
    ID: 37086112513
    Order: 6
    Author Affiliations:
    • Gpixel Inc, Changchun, China
  • Author Name: Xin-Yang Wang
    Affiliation: Gpixel Inc, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37293620200
    ID: 37293620200
    Order: 7
    Author Affiliations:
    • Gpixel Inc, Changchun, China
  • Author Name: Yu-Chun Chang
    Affiliation: State Key Laboratory on Integrated Optoelectronics, College of Electrical Science and Engineering, Jilin University, Changchun, China
    Author URL: https://ieeexplore.ieee.org/author/37405389100
    ID: 37405389100
    Order: 8
    Author Affiliations:
    • State Key Laboratory on Integrated Optoelectronics, College of Electrical Science and Engineering, Jilin University, Changchun, China

Image Sensor

• sensor_type: CMOS
• resolution: 43M pixels
• dynamic_range: 67.5 dB
• pixel_size: 2.8µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• power_consumption: 31.6 µA at 1.2 V

Applications & Benefits

• cell_imaging: Cell imaging applications are supported through the CMOS image sensor capabilities.
• benefits: The design optimizes for low power consumption and high dynamic range, suitable for various applications.

Supporting Organizations

• supported_by: National Natural Science Foundation of China, Development and Reform Commission of Jilin Province, Science and Technology Department of Jilin Province

Manuscript Details

• publication_date: 31 Oct.-3 Nov. 2018

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • noise

Processed JSON Filename

request_3cf71b63-58a5-41e7-b388-ab7bcf4ab3d8-status_counting_double_edge_slope_adc_for_cmos_image_sensors.json