Spice Models Of Fluorineionirradiated Cmos Devices

• doi: 10.1109/TED.2007.901240
• title: SPICE Models of Fluorine-Ion-Irradiated CMOS Devices
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 3493
• access_type: LOCKED
• content_type: Journals
• abstract: CMOS image sensors are attractive for space applications due to their low-power and system-on-chip features. The typical active pixel sensor (APS) is composed of a photodiode and several transistors. Using Fluorine +7 ions with an energy of 17 MeV, the effects of radiation are investigated on photodiodes and transistors manufactured using a standard 0.35-mum CMOS process. Simulation results show that the range of these ions overlaps with the active region of the device. Thus, the proximity effect of the ions on the performance of the device can be important. The tested photodiode showed a leakage current increase after it was irradiated with fluorine ions. The ideality factor of recombination current is observed to increase up to 4. Moreover, an increase in leakage current and absolute threshold voltage was observed in fluorine-ion-irradiated nMOS and pMOS transistors. In this paper, behavioral SPICE models are developed to analyze the contribution of these components to an overall increase in dark current of a CMOS APS.
• article_number: 4277968
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4277968
• html_url: https://ieeexplore.ieee.org/document/4277968/
• abstract_url: https://ieeexplore.ieee.org/document/4277968/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 4277948
• publication_year: 2007
• publication_date: Aug. 2007
• start_page: 1963
• end_page: 1971
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 256
• insert_date: 20070723
• index_terms:
  • ieee_terms:
    • Ions
    • Photodiodes
    • Semiconductor device modeling
    • CMOS integrated circuits
    • Transistors
    • MOSFETs
    • Radiation effects
  • author_terms:
    • CMOS images sensors
    • heavy ion
    • MOS transistor
    • photodiode
    • radiation effects
    • SPICE model
  • dynamic_index_terms:
    • SPICE Model
    • Effects Of Radiation
    • Effects Of Radiotherapy
    • Effect Of Irradiation
    • Current Voltage
    • Effect Of Ions
    • Image Sensor
    • Camera Sensor
    • Threshold Voltage
    • Dark Current
    • CMOS Process
    • Ideality Factor
    • Absolute Voltage
    • Leakage Current Increases
    • High Voltage
    • Higher Tendency
    • Voltage-gated
    • Gate Voltage
    • Energy Range
    • Heavy Ions
    • Heavy-ion Collisions
    • Metal Layer
    • Dielectric Layer
    • Insulation Layer
    • Gating Function
    • Box Function
    • Rectangular Function
    • Pulse Function
    • P-n Junction
    • Oxide Capacitance
    • Threshold Voltage Shift
    • Linear Energy Transfer
    • Decrease In Mobility
    • Diode Characteristics
    • Carrier Generation
    • Multiple Exciton Generation
    • Carrier Multiplication
    • Range Of Ions
    • Stopping And Range Of Ions In Matter
    • Neutron Irradiation
    • Neutron Radiation
    • Faraday Cup
    • Incident Ions
• authors:
  • Author Name: Henok T. Mebrahtu
    Affiliation: Department of Physics, Duke University, Durham, NC, USA
    Author URL: https://ieeexplore.ieee.org/author/37938138400
    ID: 37938138400
    Order: 1
    Author Affiliations:
    • Department of Physics, Duke University, Durham, NC, USA
  • Author Name: Wei Gao
    Affiliation: Computer Science and Engineering Department, York University, Toronto, ONT, Canada
    Author URL: https://ieeexplore.ieee.org/author/37401574600
    ID: 37401574600
    Order: 2
    Author Affiliations:
    • Computer Science and Engineering Department, York University, Toronto, ONT, Canada
  • Author Name: William E. Kieser
    Affiliation: Iso Trace Laboratory, University of Toronto, Toronto, ONT, Canada
    Author URL: https://ieeexplore.ieee.org/author/37938135300
    ID: 37938135300
    Order: 3
    Author Affiliations:
    • Iso Trace Laboratory, University of Toronto, Toronto, ONT, Canada
  • Author Name: Xiaolei L. Zhao
    Affiliation: Iso Trace Laboratory, University of Toronto, Toronto, ONT, Canada
    Author URL: https://ieeexplore.ieee.org/author/37935276900
    ID: 37935276900
    Order: 4
    Author Affiliations:
    • Iso Trace Laboratory, University of Toronto, Toronto, ONT, Canada
  • Author Name: Paul J. Thomas
    Affiliation: Topaz Technology, Inc., Toronto, ONT, Canada
    Author URL: https://ieeexplore.ieee.org/author/37274648500
    ID: 37274648500
    Order: 5
    Author Affiliations:
    • Topaz Technology, Inc., Toronto, ONT, Canada
  • Author Name: Richard I. Hornsey
    Affiliation: School of Engineering, York University, Toronto, ONT, Canada
    Author URL: https://ieeexplore.ieee.org/author/37273160700
    ID: 37273160700
    Order: 6
    Author Affiliations:
    • School of Engineering, York University, Toronto, ONT, Canada

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: increased by an order of magnitude after irradiation, specific value not provided

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• noise: increased due to leakage current in photodiodes and MOS transistors, specific value not provided

Applications & Benefits

• cell_imaging: CMOS image sensors are attractive for space applications due to their low-power features, on-chip integration of analog and digital components, and lower cost.
• benefits: Effective for a variety of applications including smartphones, medical devices, and automotive systems.

Supporting Organizations

• supported_by: Topaz Technology Inc., Center for Research in Earth and Space Technology

Manuscript Details

• publication_date: Aug. 2007

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_798b4b83-7095-4d9b-bc6b-48445d901851-spice_models_of_fluorineionirradiated_cmos_devices.json