Spectroscopic Imaging Of Xrays A New Look

• doi: 10.1109/NSSMIC.2003.1352036
• title: Spectroscopic imaging of x-rays : a new look
• publisher: IEEE
• isbn: 0-7803-8257-9
• issn: 1082-3654
• partnum: 03CH37515
• rank: 3620
• access_type: LOCKED
• content_type: Conferences
• abstract: In recent hybrid imaging devices a segmented (50-100/spl mu/m) semiconductor sensor matrix is matched to a separate readout chip made in some standard silicon CMOS technology. The large number of contacts are made by high-density bump bonding interconnect technology. Extended functionality with hundreds of transistors in each electronics cell can serve a variety of purposes. Fluctuations in the response of the sensor matrix ran be compensated in real-time. A single photon processing circuit in each pixel can achieve spectroscopic imaging by energy measurement even at high rates. However, it is necessary to take into account the distribution of the signals over adjacent pixels. Another possibility is the discrimination by energy of photon conversions in stacked layers with increasing absorption.
• article_number: 1352036
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1352036
• html_url: https://ieeexplore.ieee.org/document/1352036/
• abstract_url: https://ieeexplore.ieee.org/document/1352036/
• publication_title: 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515)
• conference_location: Portland, OR, USA
• conference_dates: 19-25 Oct. 2003
• publication_number: 9356
• is_number: 29714
• publication_year: 2003
• publication_date: 19-25 Oct. 2003
• start_page: 228
• end_page: 231 Vol.1
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 31
• insert_date: 20041122
• index_terms:
  • ieee_terms:
    • Spectroscopy
    • Optical imaging
    • X-rays
    • CMOS technology
    • CMOS image sensors
    • Optoelectronic and photonic sensors
    • Image segmentation
    • Silicon
    • Bonding
    • Integrated circuit interconnections
  • dynamic_index_terms:
    • Silicon
    • Imaging Device
    • CMOS Technology
    • Fluctuations In Response
    • Large Number Of Contacts
    • Semiconductor Sensors
    • Sensor Matrix
    • Sensor Matrices
    • Medical Applications
    • Photon Counting
    • Single Pixel
    • Double Hit
• isbn_formats:
  • format: Print ISBN, value: 0-7803-8257-9, isbnType: Historical
• authors:
  • Author Name: E.H.M. Heijne
    Affiliation: EP-Division, CERN, Geneva, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37268858400
    ID: 37268858400
    Order: 1
    Author Affiliations:
    • EP-Division, CERN, Geneva, Switzerland

Image Sensor

• sensor_type: CMOS
• resolution: 256x256 pixels
• dynamic_range: Not explicitly stated
• pixel_size: 55µm x 55µm
• dark_current: Not specified in detail, but high currents up to 100µA/cm² mentioned as manageable without contributing noise in counting imagers.

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: MHz speed (exact fps not specified)
• signal_to_noise_ratio: Not explicitly stated, comparator precision mentioned with r.m.s. values from <100 electrons to 2500 electrons
• power_consumption: Low power for pulse processing electronics is emphasized, but specific values not provided.
• noise: Equivalent noise charge (ENC) for a pixel can be of the order of 100 electrons r.m.s. or less.

Applications & Benefits

• cell_imaging: Applicable for medical imaging and industrial applications, particularly in the X-ray photon window.
• benefits: High rate capability, real-time fluctuations compensation, single photon processing, and ability for energy discrimination.

Supporting Organizations

• supported_by: CERN, EP-Division

Manuscript Details

• publication_date: 19-25 Oct. 2003

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • sensitivity
  • shutter_speed

Processed JSON Filename

request_1706bbd3-3be2-4014-bd50-9d4827f75f19-spectroscopic_imaging_of_xrays__a_new_look.json