Spacevariant Nonorthogonal Structure Cmos Image Sensor Design

• doi: 10.1109/4.678644
• title: Space-variant nonorthogonal structure CMOS image sensor design
• publisher: IEEE
• isbn:
• issn: 1558-173X
• rank: 3613
• access_type: LOCKED
• content_type: Journals
• abstract: A CMOS log-polar image sensor has been designed and fabricated. As a result, a systematic approach has been proposed to design space-variant sensors and layouts. The pixels in this sensor are distributed in a polar fashion; the image plane consists of concentric rings containing the elementary sensing cells. Such a structure, where polygons use any space orientation, does not match very well with current design tools and CMOS fabrication processes. An approach to design nonorthogonal repetitive structures using standard fabrication processes and computer-aided design (CAD) tools is presented. The result of this work is an image sensor, with log-polar structure, suitable for image processing since the log-polar mapping has interesting mathematical and image data reduction properties.
• article_number: 678644
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=678644
• html_url: https://ieeexplore.ieee.org/document/678644/
• abstract_url: https://ieeexplore.ieee.org/document/678644/
• publication_title: IEEE Journal of Solid-State Circuits
• conference_location:
• conference_dates:
• publication_number: 4
• is_number: 14931
• publication_year: 1998
• publication_date: June 1998
• start_page: 842
• end_page: 849
• citing_paper_count: 31
• citing_patent_count: 4
• download_count: 274
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Image sensors
    • Image processing
    • Humans
    • Pixel
    • Sensor systems
    • Fabrication
    • Design automation
    • Sensor arrays
    • Cameras
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Image Processing
    • Design Tool
    • Ideal Tool
    • Image Plane
    • Data Reduction
    • Concentric Rings
    • Mathematical Properties
    • Image Quality
    • Horizontal Axis
    • Regular Grid
    • Cartesian Grid
    • Rectangular Grid
    • Grid Structure
    • Scale Of The Problem
    • Spectral Response
    • Channel Length
    • Random Access
    • Single Pixel
    • Rule Violations
    • CMOS Technology
    • polySia
    • Polysilicon
    • Polycrystalline Silicon
    • Weak Region
    • Central Sensor
    • Horizontal Reference
    • Vertical Reference
    • Transistor Channel
    • Integrated Circuit Design
    • IC Design
    • Microchip Design
    • Weak Inverse
    • Pixel Selection
    • Light Intensity
• authors:
  • Author Name: F. Pardo
    Affiliation: Computer Science and Electrical Engineering Department, University of Valencia, Valencia, Spain
    Author URL: https://ieeexplore.ieee.org/author/37289150900
    ID: 37289150900
    Order: 1
    Author Affiliations:
    • Computer Science and Electrical Engineering Department, University of Valencia, Valencia, Spain
    • Inter University Micro Electronics Center, Belgium
  • Author Name: B. Dierickx
    Affiliation: Inter University Micro Electronics Center, Leuven, Belgium
    Author URL: https://ieeexplore.ieee.org/author/37331682800
    ID: 37331682800
    Order: 2
    Author Affiliations:
    • Inter University Micro Electronics Center, Leuven, Belgium
  • Author Name: D. Scheffer
    Affiliation: Inter University Micro Electronics Center, Leuven, Belgium
    Author URL: https://ieeexplore.ieee.org/author/37442311300
    ID: 37442311300
    Order: 3
    Author Affiliations:
    • Inter University Micro Electronics Center, Leuven, Belgium

Image Sensor

• sensor_type: CMOS
• resolution: 56 rings with 128 pixels each
• dynamic_range: Not specified
• pixel_size: Approx. 14 µm (minimum pixel pitch)
• dark_current: Low currents involved (exact value not specified)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: Up to 200 images per second
• sensitivity: ISO not specified
• noise: Fixed Pattern Noise (FPN) present due to transistor mismatching

Applications & Benefits

• cell_imaging: Suitable for real-time image processing, active vision, dynamic environment understanding, compressed image transmission
• benefits: Log-polar mapping, higher resolution, solution to scaling problem, continuous retina and fovea structure

Supporting Organizations

• supported_by: TIDE IBIDEM project, Human Capital & Mobility program of the European Community

Manuscript Details

• publication_date: June 1998

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_919435c1-5b49-46b5-bcca-91c9373c5c41-spacevariant_nonorthogonal_structure_cmos_image_sensor_design.json