Skipperincmos Nondestructive Readout With Subelectron Noise Performance For Pixel Detectors

• doi: 10.1109/TED.2024.3463631
• title: Skipper-in-CMOS: Nondestructive Readout With Subelectron Noise Performance for Pixel Detectors
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 3585
• access_type: LOCKED
• content_type: Journals
• abstract: The Skipper-in-CMOS image sensor integrates the nondestructive readout capability of skipper charge coupled devices (Skipper-CCDs) with the high conversion gain of a pinned photodiode (PPD) in a CMOS imaging process while taking advantage of in-pixel signal processing. This allows both single photon counting as well as high frame rate readout through highly parallel processing. The first results obtained from a ${15} \times {15}~\mu $ m2 pixel cell of a Skipper-in-CMOS sensor fabricated in Tower Semiconductor’s commercial 180-nm CMOS image sensor process are presented. Measurements confirm the expected reduction of the readout noise with the number of samples down to deep subelectron noise of $0.15\text {e}^ - $ , demonstrating the charge transfer operation from the PPD and the single photon counting operation when the sensor is exposed to light. This article also discusses new testing strategies employed for its operation and characterization.
• article_number: 10702470
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10702470
• html_url: https://ieeexplore.ieee.org/document/10702470/
• abstract_url: https://ieeexplore.ieee.org/document/10702470/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 10736243
• publication_year: 2024
• publication_date: Nov. 2024
• start_page: 6843
• end_page: 6849
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 211
• insert_date: 20241001
• index_terms:
  • ieee_terms:
    • Noise
    • Logic gates
    • Charge coupled devices
    • Photonics
    • Charge transfer
    • Electrons
    • Detectors
    • Transmission line matrix methods
    • Silicon
    • Semiconductor device measurement
  • author_terms:
    • Multiple nondestructive readout
    • single photon
    • skipper charge coupled devices (Skipper-CCDs) in CMOS
    • subelectron noise
  • dynamic_index_terms:
    • Noise Performance
    • Non-destructive Readout
    • CCD Camera
    • Charge-coupled Device
    • Denoising
    • Noise Reduction
    • Single Photon
    • Image Sensor
    • Camera Sensor
    • Single Photon Counting
    • Conversion Gain
    • Readout Noise
    • PIN Photodiode
    • Exposure Time
    • Formal Analysis
    • Low Noise
    • Single Electron
    • Dark Matter
    • Single Pixel
    • Single Counting
    • New Physics
    • Physics Beyond The Standard Model
    • Dark Current
    • Output Stage
    • Single-photon Avalanche Diode
    • Non-destructive Sampling
    • Reset Gate
    • Efficient Charge Transfer
    • Charge Collection
    • Readout System
    • Charge Generation
    • Charged Multiplicity
    • Charge Propagation
    • Video Signal
    • Pixel Matrix
    • Pixel Matrices
    • Single-photon Detectors
    • Photon-counting Detector
• authors:
  • Author Name: Agustin J. Lapi
    Affiliation: Instituto de Inv. en Ing. Eléctrica “Alfredo Desages” (IIIE), CONICET, Bahía Blanca, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37089205171
    ID: 37089205171
    Order: 1
    Author Affiliations:
    • Instituto de Inv. en Ing. Eléctrica “Alfredo Desages” (IIIE), CONICET, Bahía Blanca, Argentina
    • Departamento de Ingeniería Eléctrica y Computadoras (DIEC), Universidad Nacional del Sur (UNS), Bahía Blanca, Argentina
    • Fermi National Accelerator Laboratory, Batavia, IL, USA
  • Author Name: Miguel Sofo-Haro
    Affiliation: Universidad Nacional de Córdoba (UNC), Bahía Blanca, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37085619201
    ID: 37085619201
    Order: 2
    Author Affiliations:
    • Universidad Nacional de Córdoba (UNC), Bahía Blanca, Argentina
    • Instituto de Física Enrique Gaviola and Reactor Nuclear RA0 (CNEA-CONICET), Córdoba, Argentina
  • Author Name: Benjamin C. Parpillon
    Affiliation: Fermi National Accelerator Laboratory, Batavia, IL, USA
    Author URL: https://ieeexplore.ieee.org/author/758598764316508
    ID: 758598764316508
    Order: 3
    Author Affiliations:
    • Fermi National Accelerator Laboratory, Batavia, IL, USA
  • Author Name: Adi Birman
    Affiliation: Tower Semiconductor, Migdal Haaemek, Israel
    Author URL: https://ieeexplore.ieee.org/author/329496981024168
    ID: 329496981024168
    Order: 4
    Author Affiliations:
    • Tower Semiconductor, Migdal Haaemek, Israel
  • Author Name: Guillermo Fernandez-Moroni
    Affiliation: Fermi National Accelerator Laboratory, Batavia, IL, USA
    Author URL: https://ieeexplore.ieee.org/author/37085773311
    ID: 37085773311
    Order: 5
    Author Affiliations:
    • Fermi National Accelerator Laboratory, Batavia, IL, USA
    • Department of Astronomy and Astrophysics, University of Chicago, Chicago, IL, USA
  • Author Name: Lorenzo Rota
    Affiliation: SLAC National Accelerator Laboratory, Menlo Park, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37088362423
    ID: 37088362423
    Order: 6
    Author Affiliations:
    • SLAC National Accelerator Laboratory, Menlo Park, CA, USA
  • Author Name: Fabricio Alcalde Bessia
    Affiliation: Instituto de Nanociencia y Nanotecnología (CNEA-CONICET), San Carlos de Bariloche, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37085826019
    ID: 37085826019
    Order: 7
    Author Affiliations:
    • Instituto de Nanociencia y Nanotecnología (CNEA-CONICET), San Carlos de Bariloche, Argentina
  • Author Name: Aseem Gupta
    Affiliation: SLAC National Accelerator Laboratory, Menlo Park, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37088493431
    ID: 37088493431
    Order: 8
    Author Affiliations:
    • SLAC National Accelerator Laboratory, Menlo Park, CA, USA
  • Author Name: Claudio R. Chavez Blanco
    Affiliation: Departamento de Ingeniería Eléctrica y Computadoras (DIEC), Universidad Nacional del Sur (UNS), Bahía Blanca, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37089901934
    ID: 37089901934
    Order: 9
    Author Affiliations:
    • Departamento de Ingeniería Eléctrica y Computadoras (DIEC), Universidad Nacional del Sur (UNS), Bahía Blanca, Argentina
    • Fermi National Accelerator Laboratory, Batavia, IL, USA
    • Facultad de Ingeniería de la Universidad Nacional de Asunción (UNA), San Lorenzo, Paraguay
  • Author Name: Fernando Chierchie
    Affiliation: Instituto de Inv. en Ing. Eléctrica “Alfredo Desages” (IIIE), CONICET, Bahía Blanca, Argentina
    Author URL: https://ieeexplore.ieee.org/author/37598199700
    ID: 37598199700
    Order: 10
    Author Affiliations:
    • Instituto de Inv. en Ing. Eléctrica “Alfredo Desages” (IIIE), CONICET, Bahía Blanca, Argentina
    • Departamento de Ingeniería Eléctrica y Computadoras (DIEC), Universidad Nacional del Sur (UNS), Bahía Blanca, Argentina
  • Author Name: Julie Segal
    Affiliation: SLAC National Accelerator Laboratory, Menlo Park, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37089139867
    ID: 37089139867
    Order: 11
    Author Affiliations:
    • SLAC National Accelerator Laboratory, Menlo Park, CA, USA
  • Author Name: Christopher J. Kenney
    Affiliation: SLAC National Accelerator Laboratory, Menlo Park, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37089051960
    ID: 37089051960
    Order: 12
    Author Affiliations:
    • SLAC National Accelerator Laboratory, Menlo Park, CA, USA
  • Author Name: Angelo Dragone
    Affiliation: SLAC National Accelerator Laboratory, Menlo Park, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/487039101509900
    ID: 487039101509900
    Order: 13
    Author Affiliations:
    • SLAC National Accelerator Laboratory, Menlo Park, CA, USA
  • Author Name: Shaorui Li
    Affiliation: Fermi National Accelerator Laboratory, Batavia, IL, USA
    Author URL: https://ieeexplore.ieee.org/author/37087182879
    ID: 37087182879
    Order: 14
    Author Affiliations:
    • Fermi National Accelerator Laboratory, Batavia, IL, USA
  • Author Name: Davide Braga
    Affiliation: Fermi National Accelerator Laboratory, Batavia, IL, USA
    Author URL: https://ieeexplore.ieee.org/author/38274232200
    ID: 38274232200
    Order: 15
    Author Affiliations:
    • Fermi National Accelerator Laboratory, Batavia, IL, USA
  • Author Name: Amos Fenigstein
    Affiliation: Tower Semiconductor, Migdal Haaemek, Israel
    Author URL: https://ieeexplore.ieee.org/author/855165864612180
    ID: 855165864612180
    Order: 16
    Author Affiliations:
    • Tower Semiconductor, Migdal Haaemek, Israel
  • Author Name: Juan Estrada
    Affiliation: Fermi National Accelerator Laboratory, Batavia, IL, USA
    Author URL: https://ieeexplore.ieee.org/author/37085772512
    ID: 37085772512
    Order: 17
    Author Affiliations:
    • Fermi National Accelerator Laboratory, Batavia, IL, USA
  • Author Name: Farah Fahim
    Affiliation: Fermi National Accelerator Laboratory, Batavia, IL, USA
    Author URL: https://ieeexplore.ieee.org/author/37085411885
    ID: 37085411885
    Order: 18
    Author Affiliations:
    • Fermi National Accelerator Laboratory, Batavia, IL, USA

Image Sensor

• sensor_type: CMOS
• resolution: 200 x 200 pixels
• dynamic_range: Not specifically stated
• pixel_size: 15 µm
• dark_current: < 0.02 e−/s

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 1000 fps
• signal_to_noise_ratio: High, not quantified
• noise: 0.15 e−

Applications & Benefits

• cell_imaging: Suitable for single photon detection and other advanced imaging applications.
• benefits: Nondestructive readout capability, low readout noise, single photon counting ability, advantages for dark matter and neutrino experiments, quantum imaging.

Supporting Organizations

• supported_by: DOE Office of Science Research Program, Fermi Research Alliance, Guillermo Fernandez Moroni’s DOE Early Career Research Program.

Manuscript Details

• publication_date: Nov. 2024

Relevancy Score

• score: 10

Processed JSON Filename

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