Research Of Designfortestability Of Cmos Image Sensor

• doi: 10.1109/ICEPT.2008.4607033
• title: Research of design-for-testability of CMOS image sensor
• publisher: IEEE
• isbn: 978-1-4244-2740-6
• issn:
• partnum: 08EX2482
• rank: 3452
• access_type: LOCKED
• content_type: Conferences
• abstract: CMOS image sensor has experienced explosive growth in recent years. As increasing of number of pixel scale and complexities of circuit, testability of image sensor chip has become an important problem that must be dealt with by both design and test engineers. A systematic approach to handle testability of CMOS image sensor circuits is urgently needed, because current test methods less address this domain. In this paper, a uniform and systematic approach is explored to the testability problem of CMOS image sensor, and it covers the image sensor defect analysis, fault model definition and test system design. The experimental data shows the fault coverage can be up to 99.3%.
• article_number: 4607033
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4607033
• html_url: https://ieeexplore.ieee.org/document/4607033/
• abstract_url: https://ieeexplore.ieee.org/document/4607033/
• publication_title: 2008 International Conference on Electronic Packaging Technology & High Density Packaging
• conference_location: Shanghai
• conference_dates: 28-31 July 2008
• publication_number: 4599585
• is_number: 4606930
• publication_year: 2008
• publication_date: 28-31 July 2008
• start_page: 1
• end_page: 4
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 245
• insert_date: 20080822
• index_terms:
  • ieee_terms:
    • Pixel
    • CMOS image sensors
    • Image sensors
    • Circuit faults
    • System-on-a-chip
    • Photodiodes
    • Noise
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Test System
    • Defect Model
    • Fault Model
    • Growth In Recent Years
    • Current Testing Methods
    • Silicon
    • Image Pixels
    • Photodiode
    • External Control
    • Test Pattern
    • Test Card
    • Electronic Signal
    • Memory Block
    • Sensor Pixel
    • Temporal Noise
• isbn_formats:
  • format: CD, value: 978-1-4244-2740-6, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-2739-0, isbnType: New-2005
• authors:
  • Author Name: Zhaohui Ou
    Affiliation: Microelectronics Research & Development center, Key Laboratory of Advanced Display and System Applications (Shanghai University) Ministry of Education, Shanghai University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37087566166
    ID: 37087566166
    Order: 1
    Author Affiliations:
    • Microelectronics Research & Development center, Key Laboratory of Advanced Display and System Applications (Shanghai University) Ministry of Education, Shanghai University, Shanghai, China
  • Author Name: Feng Lin
    Affiliation: Microelectronics Research & Development center, Key Laboratory of Advanced Display and System Applications (Shanghai University) Ministry of Education, Shanghai University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37087202501
    ID: 37087202501
    Order: 2
    Author Affiliations:
    • Microelectronics Research & Development center, Key Laboratory of Advanced Display and System Applications (Shanghai University) Ministry of Education, Shanghai University, Shanghai, China

Image Sensor

• sensor_type: CMOS
• resolution: 64x64 pixels
• dynamic_range: not specified
• pixel_size: 30 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 2000 to 5000 fps

Applications & Benefits

• cell_imaging: Used in applications such as smartphones, medical devices, and automotive systems; enables digital imaging.
• benefits: High fault coverage rate of 99.3% with low area overhead.

Supporting Organizations

• supported_by: Microelectronics R&D center, Shanghai University; Key Laboratory of Advanced Display and System Applications.

Manuscript Details

• publication_date: 28-31 July 2008

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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