Ramp Adc Speedup Techniques For Cmos Image Sensors With New Image Quality Metric

• doi: 10.1109/WMED49473.2021.9425179
• title: Ramp ADC Speed-up Techniques for CMOS Image Sensors with New Image Quality Metric
• publisher: IEEE
• isbn: 978-1-7281-6275-1
• issn: 1947-3834
• rank: 3375
• access_type: LOCKED
• content_type: Conferences
• abstract: Ramp analog-to-digital converters (ADC) used in column parallel complementary metal oxide semiconductors (CMOS) image sensors (CIS) trade conversion speed with size, power, and complexity to achieve optimal performance. Single slope look-ahead ramp (SSLAR) ADC was introduced to solve the speed problem of ramp ADCs used in CIS trading image quality. An enhancement technique for SSLAR speed is introduced in this paper. It uses accelerated ramp based on shot noise limitations to replace SSLAR linear ramp generator for better speed performance and image quality. Moreover, a new image quality metric is proposed to be used as a reference of performance comparison of different CIS ADCs. This metric called conversion complexity metric (CCM). Accelerated SSLAR ADC technique (A-SSLAR) provides speed improvement up to average of two times (2x) of SSLAR for same CCM and threshold.
• article_number: 9425179
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9425179
• html_url: https://ieeexplore.ieee.org/document/9425179/
• abstract_url: https://ieeexplore.ieee.org/document/9425179/
• publication_title: 2021 IEEE Workshop on Microelectronics and Electron Devices (WMED)
• conference_location: Boise, ID, USA
• conference_dates: 23-23 April 2021
• publication_number: 9424930
• is_number: 9425065
• publication_year: 2021
• publication_date: 23-23 April 2021
• start_page: 1
• end_page: 4
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 1016
• insert_date: 20210510
• index_terms:
  • ieee_terms:
    • Image quality
    • Measurement
    • Metals
    • CMOS image sensors
    • Market research
    • Complexity theory
    • Parallel architectures
  • author_terms:
    • Analog-digital conversion
    • CMOS integrated circuits
    • CMOS image sensors
    • Image quality assessment
    • Integrating ADC
    • Column parallel architecture.
  • dynamic_index_terms:
    • Image Quality
    • Image Sensor
    • Camera Sensor
    • Quality Metrics
    • Image Quality Metrics
    • Image-quality Metrics
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Speed Performance
    • Shot Noise
    • Poisson Noise
    • Shot-noise
    • High-resolution
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Signal To Noise
    • Signal To Noise Ratio
    • Step Size
    • Step-size
    • Power Consumption
    • Parallelization
    • Parallel Computing
    • Frame Rate
    • Problem Size
    • Phase-locked Loop
    • Phase Locked Loop
    • Conversion Time
    • Least Significant Bit
    • Low Bit
    • High Frame Rate
    • Electron Counting
    • Digital Counting
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-7281-6275-1, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-7281-6274-4, isbnType: New-2005
• authors:
  • Author Name: Mohamed R. Elmezayen
    Affiliation: Electrical and Computer Engineering department, The University of Idaho, Moscow, ID, USA
    Author URL: https://ieeexplore.ieee.org/author/37088490605
    ID: 37088490605
    Order: 1
    Author Affiliations:
    • Electrical and Computer Engineering department, The University of Idaho, Moscow, ID, USA
  • Author Name: Suat U. Ay
    Affiliation: Electrical and Computer Engineering department, The University of Idaho, Moscow, ID, USA
    Author URL: https://ieeexplore.ieee.org/author/37326790500
    ID: 37326790500
    Order: 2
    Author Affiliations:
    • Electrical and Computer Engineering department, The University of Idaho, Moscow, ID, USA

Image Sensor

• sensor_type: CMOS
• resolution: (not specified in the abstract)
• dynamic_range: (not specified in the abstract)
• pixel_size: (not specified in the abstract)
• dark_current: (not specified in the abstract)

Optical Data

• focal_length: (not specified in the abstract)
• aperture: (not specified in the abstract)
• field_of_view: (not specified in the abstract)
• distortion: (not specified in the abstract)

Performance Metrics

• frame_rate: (not explicitly mentioned, but references high frame rate demands)
• signal_to_noise_ratio: (not specified in the abstract)
• sensitivity: (not specified in the abstract)
• shutter_speed: (not specified in the abstract)
• power_consumption: (not explicitly mentioned, but references low power consumption demands)
• noise: (references noise sources such as shot noise and fixed-pattern noise)

Applications & Benefits

• cell_imaging: (not specified in the abstract, but implies usage in medical devices and smartphones)
• benefits: High image quality, high frame rate, high bit resolution, low-noise, low-power consumption.

Supporting Organizations

• supported_by: University of Idaho

Manuscript Details

• publication_date: 23-23 April 2021

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed

Processed JSON Filename

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