Radiation Effects On A Radiationtolerant Cmos Active Pixel Sensor

• doi: 10.1109/TNS.2004.835108
• title: Radiation effects on a radiation-tolerant CMOS active pixel sensor
• publisher: IEEE
• isbn:
• issn: 1558-1578
• rank: 3371
• access_type: LOCKED
• content_type: Journals
• abstract: A comprehensive cobalt60, proton, and heavy ion evaluation of the Fillfactory STAR-250 CMOS active pixel sensor has been performed for space applications up to 100 krd(Si). It was possible to eliminate image lag by adjustment of the bias voltage and this allowed a reduction in proton-induced dark signal. Both cobalt60 and proton irradiation produced a decrease in responsivity, which is thought to be due to total dose effects. There was also an increase in photoresponse nonuniformity (PRNU). No major single event effects (latch-up or functional interrupt) where seen at the maximum linear energy transfer (LET) of 68MeV/(mg/cm/sup 2/).
• article_number: 1344413
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1344413
• html_url: https://ieeexplore.ieee.org/document/1344413/
• abstract_url: https://ieeexplore.ieee.org/document/1344413/
• publication_title: IEEE Transactions on Nuclear Science
• conference_location:
• conference_dates:
• publication_number: 23
• is_number: 29605
• publication_year: 2004
• publication_date: Oct. 2004
• start_page: 2753
• end_page: 2762
• citing_paper_count: 37
• citing_patent_count: 0
• download_count: 681
• insert_date: 20041018
• index_terms:
  • ieee_terms:
    • Radiation effects
    • Protons
    • CMOS technology
    • CMOS image sensors
    • Testing
    • Voltage
    • Energy exchange
    • Pixel
    • Charge coupled devices
    • Clocks
  • dynamic_index_terms:
    • Heavy Ions
    • Heavy-ion Collisions
    • Linear Energy Transfer
    • Dark Signal
    • Factor 2
    • Changes In Response
    • CCD Camera
    • Charge-coupled Device
    • Integration Time
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Reduction In Response
    • Threshold Voltage
    • Saturation Effect
    • Dark Current
    • Reduction In Gain
    • Increase In Noise
    • Readout Noise
• authors:
  • Author Name: G.R. Hopkinson
    Affiliation: Sira Limited, Kent, UK
    Author URL: https://ieeexplore.ieee.org/author/37267628600
    ID: 37267628600
    Order: 1
    Author Affiliations:
    • Sira Limited, Kent, UK
  • Author Name: A. Mohammadzadeh
    Affiliation: European Space Agency, ESTEC, Noordwijk, Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37267625800
    ID: 37267625800
    Order: 2
    Author Affiliations:
    • European Space Agency, ESTEC, Noordwijk, Netherlands
  • Author Name: R. Harboe-Sorensen
    Affiliation: European Space Agency, ESTEC, Noordwijk, Netherlands
    Author URL: https://ieeexplore.ieee.org/author/38274180100
    ID: 38274180100
    Order: 3
    Author Affiliations:
    • European Space Agency, ESTEC, Noordwijk, Netherlands

Image Sensor

• sensor_type: CMOS Active Pixel Sensor (APS)
• resolution: 512 x 512
• dynamic_range: Not specified
• pixel_size: 25 um
• dark_current: 5 electrons/pixel/s (maximum after radiation)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 5 MHz
• signal_to_noise_ratio: 60-70 electrons rms
• power_consumption: Approx. 29 mA during irradiation

Applications & Benefits

• cell_imaging: CMOS image sensors applied in space applications and potentially in smartphones and medical devices.
• benefits: Lower power consumption, reduced complexity by integrating additional functionality on-chip, improved radiation tolerance over CCDs.

Supporting Organizations

• supported_by: European Space Agency

Manuscript Details

• publication_date: Oct. 2004

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • sensitivity
  • shutter_speed
  • noise

Processed JSON Filename

request_34cde548-28b2-44f2-8704-b4d982576465-radiation_effects_on_a_radiationtolerant_cmos_active_pixel_sensor.json