Probing Dark Current Random Telegraph Signal In A Small Pitch Vertically Pinned Photodiode Cmos Image Sensor After Proton Irradiation

• doi: 10.1109/TNS.2022.3160056
• title: Probing Dark Current Random Telegraph Signal in a Small Pitch Vertically Pinned Photodiode CMOS Image Sensor After Proton Irradiation
• publisher: IEEE
• isbn:
• issn: 1558-1578
• rank: 3309
• access_type: LOCKED
• content_type: Journals
• abstract: The dark current degradation and dark current random telegraph signal (DC-RTS) after proton irradiation are studied in new scale silicon microvolumes by using a commercial CMOS image sensor. Results show that previously reported empirical models describing the displacement damage-induced degradations are still valid despite the 10–100 times smaller depletion volume used. In addition, no evidence of significant total ionizing dose effects is observed. Finally, the reduction of the fraction of RTS pixels detected and the fraction of multilevel RTS pixels is directly linked to the reduction in pixel volume.
• article_number: 9737285
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9737285
• html_url: https://ieeexplore.ieee.org/document/9737285/
• abstract_url: https://ieeexplore.ieee.org/document/9737285/
• publication_title: IEEE Transactions on Nuclear Science
• conference_location:
• conference_dates:
• publication_number: 23
• is_number: 9830888
• publication_year: 2022
• publication_date: July 2022
• start_page: 1506
• end_page: 1514
• citing_paper_count: 7
• citing_patent_count: 0
• download_count: 709
• insert_date: 20220317
• index_terms:
  • ieee_terms:
    • Dark current
    • Temperature measurement
    • Radiation effects
    • Temperature sensors
    • Protons
    • Silicon
    • Clamps
  • author_terms:
    • CMOS image sensor (CIS)
    • dark current random telegraph signal (DC-RTS)
    • displacement damage dose (DDD)
    • pinned photodiode (PPD)
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Dark Current
    • Random Signal
    • Small Pitch
    • PIN Photodiode
    • Telegraph Signal
    • Random Telegraph Signal
    • Empirical Model
    • Dose Concentration
    • Absorbed Dose
    • Total Ionizing Dose
    • Fraction Of Pixels
    • Activation Energy
    • Additional Measures
    • Poisson Distribution
    • Poissonian
    • Integration Time
    • Maximum Amplitude
    • Exponential Distribution
    • Number Of Centers
    • Damage Factors
    • Percentage Of Pixels
    • Weeks Of Storage
    • Sensitive Volume
    • Intensity Sensitivity
    • Small Pixel
    • Linear Energy Transfer
    • Electric Field Enhancement
    • Conversion Gain
    • Radiation Profile
    • Irradiance Profile
    • Pixel Pitch
    • Transition Amplitude
    • Probability Amplitude
    • Technology Node
    • Large Pixel
• authors:
  • Author Name: Aubin Antonsanti
    Affiliation: ISAE-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37089451975
    ID: 37089451975
    Order: 1
    Author Affiliations:
    • ISAE-SUPAERO, Université de Toulouse, Toulouse, France
  • Author Name: Cédric Virmontois
    Affiliation: Centre National d’Études Spatiales (CNES), Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/38327725000
    ID: 38327725000
    Order: 2
    Author Affiliations:
    • Centre National d’Études Spatiales (CNES), Toulouse, France
  • Author Name: Jean-Marie Lauenstein
    Affiliation: NASA Goddard Space Flight Center (NASA GSFC), Greenbelt, MD, USA
    Author URL: https://ieeexplore.ieee.org/author/37270794700
    ID: 37270794700
    Order: 3
    Author Affiliations:
    • NASA Goddard Space Flight Center (NASA GSFC), Greenbelt, MD, USA
  • Author Name: Alexandre Le Roch
    Affiliation: NASA Postdoctoral Program (NPP), NASA Goddard Space Flight Center (NASA GSFC), Greenbelt, MD, USA
    Author URL: https://ieeexplore.ieee.org/author/37086270369
    ID: 37086270369
    Order: 4
    Author Affiliations:
    • NASA Postdoctoral Program (NPP), NASA Goddard Space Flight Center (NASA GSFC), Greenbelt, MD, USA
  • Author Name: Hugo Dewitte
    Affiliation: ISAE-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37088443281
    ID: 37088443281
    Order: 5
    Author Affiliations:
    • ISAE-SUPAERO, Université de Toulouse, Toulouse, France
  • Author Name: Vincent Goiffon
    Affiliation: ISAE-SUPAERO, Université de Toulouse, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37593862700
    ID: 37593862700
    Order: 6
    Author Affiliations:
    • ISAE-SUPAERO, Université de Toulouse, Toulouse, France

Image Sensor

• sensor_type: CMOS
• resolution: 3280x2464
• dynamic_range: Not specified
• pixel_size: 1.12μm
• dark_current: 6 e-/s at 60°C

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 15 fps
• signal_to_noise_ratio: 10.4 e-
• noise: 1.87 ADU (equivalent to 10.4 e-)

Applications & Benefits

• cell_imaging: Useful in space and nuclear applications, where sensors are exposed to radiation.
• benefits: Cost reduction and fast development provided by commercial-off-the-shelf (COTS) image sensors.

Supporting Organizations

• supported_by: ISAE-SUPAERO, Université de Toulouse; Centre National d’Études Spatiales (CNES); NASA Goddard Space Flight Center (NASA GSFC); NASA Postdoctoral Program (NPP).

Manuscript Details

• publication_date: July 2022

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • temporal noise
  • fixed-pattern noise
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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