Prnu Estimation Of Linear Cmos Image Sensors That Allows Nonuniform Illumination

• doi: 10.1109/TIM.2021.3088484
• title: PRNU Estimation of Linear CMOS Image Sensors That Allows Nonuniform Illumination
• publisher: IEEE
• isbn:
• issn: 1557-9662
• rank: 3218
• access_type: LOCKED
• content_type: Journals
• abstract: Photo response nonuniformity (PRNU) is a crucial parameter in evaluating and choosing CMOS image sensors. The current methods and standards use the integrating sphere to illuminate the sensor and assume a known uniform illumination. And PRNU is calculated based on the spatial variance of images. In practice, the uniformity of illuminance can be hardly guaranteed. A slight nonuniformity will cause a significant increase in spatial variance and bring unacceptable evaluation errors. In this article, we present a novel method to estimate PRNU of linear CMOS image sensors. The method allows nonuniform illumination and does not require specific settings for the light source and sensors. First, an observation model is established for the data of nonuniformly exposed images. The model is composed of an irradiance model and a noise model. The irradiance model describes the original output, and the noise model depicts the noise variance as a function of local illuminance. PRNU is a parameter in the noise model to be estimated. Then, the model parameters including PRNU are estimated by a two-stage method based on maximum likelihood estimation. We also use simulations to validate the developed methods and demonstrate the robustness of the model under sensor misalignment. Finally, the proposed method is illustrated by a measurement experiment.
• article_number: 9452169
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9452169
• html_url: https://ieeexplore.ieee.org/document/9452169/
• abstract_url: https://ieeexplore.ieee.org/document/9452169/
• publication_title: IEEE Transactions on Instrumentation and Measurement
• conference_location:
• conference_dates:
• publication_number: 19
• is_number: 9259274
• publication_year: 2021
• publication_date: 2021
• start_page: 1
• end_page: 11
• citing_paper_count: 5
• citing_patent_count: 0
• download_count: 674
• insert_date: 20210611
• index_terms:
  • ieee_terms:
    • Lighting
    • Light sources
    • Standards
    • Photonics
    • Noise measurement
    • Dark current
    • Noise reduction
  • author_terms:
    • CMOS image sensors
    • denoising
    • noise measurement
    • noise modeling
    • nonuniformity
    • photo response nonuniformity (PRNU)
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Linear Sensor
    • Non-uniform Illumination
    • Photo-response Non-uniformity
    • Photo Response Non Uniformity
    • PRNU
    • Light Source
    • Maximum Likelihood Estimation
    • Noise Variance
    • Noise Model
    • Uniform Illumination
    • Irradiation
    • Parameter Estimates
    • Imaging Data
    • Large Errors
    • Linear Range
    • Model Parameter Estimates
    • Filtering Method
    • Filtering Methods
    • Original Signal
    • Light Images
    • Noise Components
    • Maximum Likelihood Estimation Method
    • Linear Response Range
    • Central Sensor
    • Dark Images
    • Average Image
    • Readout Noise
    • Dark Noise
    • Image Saturation
    • Sensor Area
    • Temporal Noise
    • Independent Noise
• authors:
  • Author Name: Ye Wang
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37089065498
    ID: 37089065498
    Order: 1
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • Author Name: Bo Wan
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37399205500
    ID: 37399205500
    Order: 2
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • Author Name: Guicui Fu
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37709761000
    ID: 37709761000
    Order: 3
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • Author Name: Yutai Su
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37085482651
    ID: 37085482651
    Order: 4
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China

Image Sensor

• sensor_type: CMOS
• resolution: 2048x2048
• dynamic_range: at least 10-bit
• pixel_size: not specified
• dark_current: 3.67 DN/e- per second (estimated)

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• noise: 3.67 DN (dark noise, estimated)

Applications & Benefits

• cell_imaging: Used in medical devices, smartphones, and automotive systems.
• benefits: High PRNU, accurate estimation of image quality.

Supporting Organizations

• supported_by: Beihang University, other unspecified organizations.

Manuscript Details

• publication_date: 2021

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_1f34e6a6-1028-4c00-aa2b-9eb1d2e0ac29-prnu_estimation_of_linear_cmos_image_sensors_that_allows_nonuniform_illumination.json