Practical True Random Number Generator Using Cmos Image Sensor Dark Noise

• doi: 10.1109/ACCESS.2019.2926825
• title: Practical True Random Number Generator Using CMOS Image Sensor Dark Noise
• publisher: IEEE
• isbn:
• issn: 2169-3536
• rank: 3300
• access_type: CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.
• content_type: Journals
• abstract: We present a true random number generator (TRNG) using dark noise of a CMOS image sensor. Because the proposed TRNG is based on the dark characteristics of the CMOS image sensor, it does not require any additional hardware, such as light source and optics, for providing true randomness. Therefore, it can be a promising solution for compact and low-cost mobile application. By using NIST SP 800-90B entropy assessment suite, we evaluate the min-entropy for the raw outputs of our original noise source and the final random numbers including post-processing as well. We also adopt NIST SP 800-22 statistical randomness test suite for the evaluation of the random numbers. The test results demonstrate that the generated random numbers pass all the statistical tests and have high entropy.
• article_number: 8755833
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8755833
• html_url: https://ieeexplore.ieee.org/document/8755833/
• abstract_url: https://ieeexplore.ieee.org/document/8755833/
• publication_title: IEEE Access
• conference_location:
• conference_dates:
• publication_number: 6287639
• is_number: 8600701
• publication_year: 2019
• publication_date: 2019
• start_page: 91407
• end_page: 91413
• citing_paper_count: 20
• citing_patent_count: 0
• download_count: 3304
• insert_date: 20190705
• index_terms:
  • ieee_terms:
    • Dark current
    • Generators
    • CMOS image sensors
    • Hardware
    • Entropy
    • Photonics
    • Noise level
  • author_terms:
    • Random number generation
    • CMOS image sensors
    • dark current
  • dynamic_index_terms:
    • Random Number
    • Random Generation
    • Random Number Generator
    • True Number
    • Dark Noise
    • True Randomness
    • True Random Number Generator
    • TRNG
    • Statistical Tests
    • Light Source
    • Mobile App
    • Mobile Application
    • Smartphone Application
    • Smartphone App
    • Mobile Apps
    • Smartphone Apps
    • Noise Sources
    • Poisson Distribution
    • Poissonian
    • Random Sequence
    • Hash Function
    • Hash Table
    • Hash Value
    • Hash Codes
    • Output Sequence
    • Sequencing Yield
    • Bitrate
    • Shot Noise
    • Poisson Noise
    • Shot-noise
    • Noise Distribution
    • Dark Current
    • Raw Number
    • Least Significant Bit
    • Low Bit
    • Dominant Noise Source
    • Digital Value
    • Source Of Randomness
    • Entropy Rate
    • Entropy Evaluation
    • Noise Rate
    • Noise Evaluation
    • Technical Noise
    • Pseudo-random Number Generator
    • Statistical Distance
    • Readout Noise
    • Random Bits
• authors:
  • Author Name: Byung Kwon Park
    Affiliation: Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37086498058
    ID: 37086498058
    Order: 1
    Author Affiliations:
    • Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea
  • Author Name: Hojoong Park
    Affiliation: Department of Mathematics and Financial Information Security, Kookmin University, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37086311584
    ID: 37086311584
    Order: 2
    Author Affiliations:
    • Department of Mathematics and Financial Information Security, Kookmin University, Seoul, South Korea
  • Author Name: Yong-Su Kim
    Affiliation: Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37406992000
    ID: 37406992000
    Order: 3
    Author Affiliations:
    • Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea
  • Author Name: Ju-Sung Kang
    Affiliation: Department of Mathematics and Financial Information Security, Kookmin University, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37981241000
    ID: 37981241000
    Order: 4
    Author Affiliations:
    • Department of Mathematics and Financial Information Security, Kookmin University, Seoul, South Korea
  • Author Name: Yongjin Yeom
    Affiliation: Department of Mathematics and Financial Information Security, Kookmin University, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/38081065500
    ID: 38081065500
    Order: 5
    Author Affiliations:
    • Department of Mathematics and Financial Information Security, Kookmin University, Seoul, South Korea
  • Author Name: Changhui Ye
    Affiliation: Pixelplus Company Ltd., Suwon, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37086920866
    ID: 37086920866
    Order: 6
    Author Affiliations:
    • Pixelplus Company Ltd., Suwon, South Korea
  • Author Name: Sung Moon
    Affiliation: Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37416630500
    ID: 37416630500
    Order: 7
    Author Affiliations:
    • Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea
  • Author Name: Sang-Wook Han
    Affiliation: Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37085672486
    ID: 37085672486
    Order: 8
    Author Affiliations:
    • Center for Quantum Information, Korea Institute of Science and Technology, Seoul, South Korea

Image Sensor

• sensor_type: CMOS
• resolution: 1280x720
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: <2 electrons (e-) per pixel due to innovations in low noise readout circuits, average dark current of hot pixel approximately 180 electrons, cold pixel approximately 12 electrons per 270 ms exposure time (with analog gain of 8)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• shutter_speed: 270 ms exposure time
• noise: <2 electrons (e-)

Applications & Benefits

• cell_imaging: Can be used for simultaneous color image and random number generation, high-quality random numbers through optical black pixels.
• benefits: No additional hardware required; can be easily implemented in smartphones and portable devices.

Supporting Organizations

• supported_by: National Research Foundation of Korea (NRF), Korea Institute of Science and Technology (KIST)

Manuscript Details

• publication_date: 2019

Relevancy Score

• score: 9
• missing_fields:
  • fill factor
  • quantum efficiency
  • readout speed
  • temporal noise
  • fixed-pattern noise
  • analog-to-digital conversion techniques
  • use of microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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