Pixel Optimizations And Digital Calibration Methods Of A Cmos Image Sensor Targeting High Linearity

• doi: 10.1109/TCSI.2018.2872627
• title: Pixel Optimizations and Digital Calibration Methods of a CMOS Image Sensor Targeting High Linearity
• publisher: IEEE
• isbn:
• issn: 1558-0806
• rank: 3265
• access_type: LOCKED
• content_type: Journals
• abstract: In this paper, different methodologies are employed to improve the linearity performance of a prototype CMOS image sensor (CIS). First, several pixel structures, including a novel pixel design based on a capacitive trans-impedance amplifier (CTIA), are proposed to achieve a higher pixel-level linearity. Furthermore, three types of digital linearity calibration methods are explored. A prototype image sensor designed in 0.18-μm, 1-poly, and 4-metal CIS technology with a pixel array of 128×160 is used to verify these linearity improvement techniques. The measurement results show that the proposed CTIA pixel has the best linearity result out of all pixel structures. Meanwhile, the proposed calibration methods further improved the linearity of the CIS without changing the pixel structure. The pixel mode method achieves the most significant improvement on the linearity. One type of 4T pixel attains a nonlinearity of 0.028% with pixel mode calibration, which is two times better than the state of the art. Voltage mode (VM) and current mode (CM) calibration methods get rid of the limitation on the illumination condition during calibration operation; especially, CM calibration can further suppress the nonlinearity caused by the integration capacitor CFD on the floating diffusion node, which is remnant in VM.
• article_number: 8490722
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8490722
• html_url: https://ieeexplore.ieee.org/document/8490722/
• abstract_url: https://ieeexplore.ieee.org/document/8490722/
• publication_title: IEEE Transactions on Circuits and Systems I: Regular Papers
• conference_location:
• conference_dates:
• publication_number: 8919
• is_number: 8635013
• publication_year: 2019
• publication_date: March 2019
• start_page: 930
• end_page: 940
• citing_paper_count: 15
• citing_patent_count: 0
• download_count: 1318
• insert_date: 20181012
• index_terms:
  • ieee_terms:
    • Linearity
    • Calibration
    • Transistors
    • Periodic structures
    • Capacitance
    • Optimization
    • Capacitors
  • author_terms:
    • CMOS image sensor
    • pixel
    • linearity
    • CTIA
    • calibration
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Calibration Method
    • Calibration Methods
    • Digital Methods
    • Digital Method
    • High Linearity
    • Voltage Mode
    • Pixel Array
    • Transimpedance Amplifier
    • Types Of Pixels
    • Current Source
    • Current Regulations
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Photocurrent
    • Digital Signal
    • Fill Factor
    • Operational Amplifier
    • Op-amp
    • Transfer Curves
    • Chip Area
    • Digital Output
    • Amplification Stage
    • Chip Size
    • Pixel Column
    • Readout Circuit
    • Nonlinear Error
    • Conversion Gain
    • Test Chip
    • Current Sink
    • Flicker Noise
    • Unity Gain
    • Bias Current
    • Transconductance
    • Conductive Transfer
• authors:
  • Author Name: Fei Wang
    Affiliation: Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37086451959
    ID: 37086451959
    Order: 1
    Author Affiliations:
    • Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands
  • Author Name: Albert J. P. Theuwissen
    Affiliation: Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37282956500
    ID: 37282956500
    Order: 2
    Author Affiliations:
    • Electronic Instrumentation Laboratory, Delft University of Technology, Delft, The Netherlands

Image Sensor

• sensor_type: CMOS
• resolution: 128x160 pixels
• dynamic_range: Not specified
• pixel_size: 12µm x 10µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• shutter_speed: Not applicable

Applications & Benefits

• cell_imaging: Medical and scientific imaging applications.
• benefits: High linearity and improved performance through pixel optimization and calibration methodologies.

Supporting Organizations

• supported_by: TowerJazz

Manuscript Details

• publication_date: March 2019

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • power_consumption
  • noise

Processed JSON Filename

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