Performance Limits In Visible And Infrared Imager Sensors

• doi: 10.1109/IEDM.1999.824286
• title: Performance limits in visible and infrared imager sensors
• publisher: IEEE
• isbn: 0-7803-5410-9
• issn:
• partnum: 99CH36318
• rank: 3238
• access_type: LOCKED
• content_type: Conferences
• abstract: Emerging CMOS image sensors are fundamentally superior to CCD imagers with respect to read noise and sensitivity at video data rates. We discuss each technology's performance limits, show that CMOS's advantages increase with the number of pixels, report supporting data and conclude that CMOS will likely supplant CCDs for megapixel imagers. CCDs can perform at their theoretical limit with minimum read noise of /spl sim/1 e- at 20 kHz data rate and 10-20 e- at /spl sim/10 MHz. CMOS-based image sensors, on the other hand, can provide higher sensitivity and lower read noise at /spl ges/10 MHz via pixel-based amplification and narrow noise bandwidth.
• article_number: 824286
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=824286
• html_url: https://ieeexplore.ieee.org/document/824286/
• abstract_url: https://ieeexplore.ieee.org/document/824286/
• publication_title: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318)
• conference_location: Washington, DC, USA
• conference_dates: 5-8 Dec. 1999
• publication_number: 6669
• is_number: 17838
• publication_year: 1999
• publication_date: 5-8 Dec. 1999
• start_page: 867
• end_page: 870
• citing_paper_count: 12
• citing_patent_count: 1
• download_count: 295
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Infrared image sensors
    • Charge coupled devices
    • CMOS technology
    • Pixel
    • CMOS image sensors
    • Charge-coupled image sensors
    • Sensor arrays
    • Electrons
    • Voltage
    • Bandwidth
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Vision Sensors
    • Data Rate
    • Data Evaluation
    • CCD Camera
    • Charge-coupled Device
    • Low Noise
    • Theoretical Limit
    • Minimum Noise
    • Noise Bandwidth
    • Denoising
    • Noise Reduction
    • White Noise
    • Noise Sources
    • Thermal Noise
    • Current Noise
    • Array Size
    • Small Capacity
    • Small Capacitance
    • Video Rate
    • Video Evaluation
    • Transimpedance Amplifier
    • Microlenses
    • Micro Lens
    • Amplifier Output
    • Output Buffer
    • Sensor Pixel
    • Temporal Noise
• isbn_formats:
  • format: Print ISBN, value: 0-7803-5410-9, isbnType: Historical
• authors:
  • Author Name: L.J. Kozlowski
    Affiliation: Rockwell Science Center, Inc., Thousand Oaks, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37436066900
    ID: 37436066900
    Order: 1
    Author Affiliations:
    • Rockwell Science Center, Inc., Thousand Oaks, CA, USA
  • Author Name: J. Luo
    Affiliation: Rockwell Science Center, Inc., Thousand Oaks, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37440049300
    ID: 37440049300
    Order: 2
    Author Affiliations:
    • Rockwell Science Center, Inc., Thousand Oaks, CA, USA
  • Author Name: A. Tomasini
    Affiliation: Rockwell Science Center, Inc., Thousand Oaks, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37089054158
    ID: 37089054158
    Order: 3
    Author Affiliations:
    • Rockwell Science Center, Inc., Thousand Oaks, CA, USA

Image Sensor

• sensor_type: CMOS
• resolution: 1280x1024 and 1024x768
• dynamic_range: Not explicitly mentioned in the text
• pixel_size: 4µm
• dark_current: <10 e- for infrared sensors and dark current varies in the paper with different CCD references (but specific values for CMOS not detailed)

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: Up to 40 MHz for SXGA
• signal_to_noise_ratio: <30 e- at certain frequencies
• sensitivity: -30µV/e
• noise: <30 e- at 16 MHz data rate on an infrared 1024x1024 image sensor

Applications & Benefits

• cell_imaging: CMOS image sensors can be used in medical applications for digital imaging.
• benefits: Lower read noise, higher sensitivity, on-chip amplification, and reduced vulnerability to EM interference.

Supporting Organizations

• supported_by: Rockwell Science Center, Thousand Oaks, CA, USA

Manuscript Details

• publication_date: 5-8 Dec. 1999

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • specific_dynamic_range
  • specific_power_consumption
  • specific_shutter_speed

Processed JSON Filename

request_ad385014-439e-455a-be18-cc60bf843e42-performance_limits_in_visible_and_infrared_imager_sensors.json