Optimization Of Deltasigma Adc For Columnlevel Data Conversion In Cmos Image Sensors

• doi: 10.1109/IMTC.2007.379253
• title: Optimization of Delta-Sigma ADC for Column-Level Data Conversion in CMOS Image Sensors
• publisher: IEEE
• isbn: 1-4244-0588-2
• issn: 1091-5281
• partnum: 07CH37834
• rank: 3201
• access_type: LOCKED
• content_type: Conferences
• abstract: A delta-sigma analog-to-digital-converter (ADC) is designed, optimized and simulated for column-level data conversion in a CMOS image sensor. For a 0.18μm process, the design achieves 80dB of signal-to-noise ratio (SNR), including a 10dB margin for kTC noise not simulated, and consumes 210μW of power at a 50kHz sampling rate. Low power is realized mainly by using a first-order architecture and minimizing the capacitors. For the modulator, a boosted-folded-cascode operational transconductance amplifier (OTA) is optimized to achieve a gain of 90dB with a unity-gain bandwidth of 300MHz. The decimator is also optimized by placing part of the circuit at the chip level. Zero distortion is possible in the decimator due to the discrete-time nature of the input signal. The proposed ADC allows a reduction in the read-out nonlinearity of a CMOS image sensor, enabling a high SNR to be realized.
• article_number: 4258383
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4258383
• html_url: https://ieeexplore.ieee.org/document/4258383/
• abstract_url: https://ieeexplore.ieee.org/document/4258383/
• publication_title: 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007
• conference_location: Warsaw, Poland
• conference_dates: 1-3 May 2007
• publication_number: 4258011
• is_number: 4258012
• publication_year: 2007
• publication_date: 1-3 May 2007
• start_page: 1
• end_page: 6
• citing_paper_count: 8
• citing_patent_count: 3
• download_count: 559
• insert_date: 20070625
• index_terms:
  • ieee_terms:
    • Data conversion
    • CMOS image sensors
    • Signal to noise ratio
    • Design optimization
    • Process design
    • Signal design
    • Image sampling
    • Signal sampling
    • Capacitors
    • Transconductance
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Data Conversion
    • Conversational Data
    • Delta-sigma Analog-to-digital Converter
    • Input Signal
    • Operational Amplifier
    • Op-amp
    • Time Constant
    • Dynamic Range
    • Power Consumption
    • Impulse Response
    • Input Voltage
    • Thermal Noise
    • Current Noise
    • Cadence
    • Low Power Consumption
    • Bitstream
    • Binary Sequence
    • Optimal Filter
    • Quantization Noise
    • Slew Rate
    • Integral Gain
    • Integration Interval
    • Flicker Noise
    • Input-referred Noise
    • Gain Error
    • Temporal Noise
    • Integrator Output
    • Nyquist Rate
    • Nyquist Sampling Rate
    • Charge Injection
    • Module Design
    • Total Noise
    • Quantum
    • Simulation Results
• isbn_formats:
  • format: Print ISBN, value: 1-4244-0588-2, isbnType: Historical
• authors:
  • Author Name: Alireza Mahmoodi
    Affiliation: Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB, Canada
    Author URL: https://ieeexplore.ieee.org/author/37703541700
    ID: 37703541700
    Order: 1
    Author Affiliations:
    • Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB, Canada
  • Author Name: Dileepan Joseph
    Affiliation: Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB, Canada
    Author URL: https://ieeexplore.ieee.org/author/37274570400
    ID: 37274570400
    Order: 2
    Author Affiliations:
    • Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB, Canada

Image Sensor

• sensor_type: CMOS
• resolution: 0.7V
• dynamic_range: 80dB
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 50Hz
• signal_to_noise_ratio: 70-80dB
• power_consumption: 210uW

Applications & Benefits

• cell_imaging: Used in CMOS image sensors for high SNR and reduced nonlinearities.
• benefits: High signal-to-noise ratio achievable, low power consumption, reduced read-out nonlinearity.

Supporting Organizations

• supported_by: Natural Sciences and Engineering Research Council of Canada

Manuscript Details

• publication_date: 1-3 May 2007

Relevancy Score

• score: 9
• missing_fields:
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • sensitivity
  • shutter_speed
  • noise

Processed JSON Filename

request_3fdc5fec-8358-4535-ab8a-61266250cf79-optimization_of_deltasigma_adc_for_columnlevel_data_conversion_in_cmos_image_sensors.json