Novel Photodetectors And Image Sensors Based On Silicononinsulator Substrate

• doi: 10.1109/ICICDT.2019.8790932
• title: Novel photodetectors and image sensors based on silicon-on-insulator substrate
• publisher: IEEE
• isbn: 978-1-7281-1854-3
• issn: 2381-3555
• rank: 3152
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper, we review our recent work on several novel photodetectors and image sensors based on silicon-on-insulator substrate (SOI). Interface coupled photodetector (ICPD) is demonstrated to largely improve the responsivity of the SOI photodetector by interface coupling effect. In order to tune the response spectrum, a MoS2/SOI heterogenous ICPD is developed, where the MoS2 gate is used as sensitizer to tune the response spectrum of the device from UV-band to visible/near-infrared band. Besides, a novel one-transistor active pixel sensor (1T-APS) is presented, which uses deep depletion effect in SOI substrate to collect photoelectrons and the MOSFET on top Si layer to sense the accumulated photoelectron. The 1T-APS in-situ integrates photosensing, charge integration, buffer amplification and random access in only one transistor. This is very attractive for image sensing application thanks to it’s much more compact pixel structure compared to conventional CMOS APS.
• article_number: 8790932
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8790932
• html_url: https://ieeexplore.ieee.org/document/8790932/
• abstract_url: https://ieeexplore.ieee.org/document/8790932/
• publication_title: 2019 International Conference on IC Design and Technology (ICICDT)
• conference_location: Suzhou, China
• conference_dates: 17-19 June 2019
• publication_number: 8784132
• is_number: 8790825
• publication_year: 2019
• publication_date: 17-19 June 2019
• start_page: 1
• end_page: 2
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 399
• insert_date: 20190808
• index_terms:
  • author_terms:
    • Silicon-on-insulator (SOI)
    • photodetector
    • interface coupling effect
    • one-transistor active pixel sensor
  • dynamic_index_terms:
    • Photodetector
    • Image Sensor
    • Camera Sensor
    • Silicon-on-insulator
    • Buried Oxide
    • Silicon On Insulator
    • Photoelectron
    • Photoelectric
    • Active Sensors
    • Random Access
    • Response Spectrum
    • Interfacial Coupling
    • Sensor Pixel
    • CCD Camera
    • Charge-coupled Device
    • Charge Coupled Device
    • Quantum Efficiency
    • Photocurrent
    • Top Channel
    • UV Band
    • Bulk Si
    • bulk-Si
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-7281-1854-3, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-7281-1853-6, isbnType: New-2005
• authors:
  • Author Name: J. Wan
    Affiliation: State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37586866700
    ID: 37586866700
    Order: 1
    Author Affiliations:
    • State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
  • Author Name: WZ. Bao
    Affiliation: State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37086265013
    ID: 37086265013
    Order: 2
    Author Affiliations:
    • State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
  • Author Name: JN. Deng
    Affiliation: State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37086346661
    ID: 37086346661
    Order: 3
    Author Affiliations:
    • State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
  • Author Name: J. Liu
    Affiliation: State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37085851276
    ID: 37085851276
    Order: 4
    Author Affiliations:
    • State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
  • Author Name: M. Arsalan
    Affiliation: State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37086523727
    ID: 37086523727
    Order: 5
    Author Affiliations:
    • State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
  • Author Name: ZX. Guo
    Affiliation: State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37086537567
    ID: 37086537567
    Order: 6
    Author Affiliations:
    • State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
  • Author Name: XY. Cao
    Affiliation: State Key Laboratory of ASIC and System, Fudan University, Shanghai, China
    Author URL: https://ieeexplore.ieee.org/author/37086364511
    ID: 37086364511
    Order: 7
    Author Affiliations:
    • State Key Laboratory of ASIC and System, Fudan University, Shanghai, China

Image Sensor

• sensor_type: CMOS
• resolution: (not specified in text)
• dynamic_range: (not specified in text)
• pixel_size: (not specified in text)
• dark_current: (not specified in text)

Optical Data

• focal_length: (not specified in text)
• aperture: (not specified in text)
• field_of_view: (not specified in text)
• distortion: (not specified in text)

Performance Metrics

• frame_rate: (not specified in text)
• signal_to_noise_ratio: (not specified in text)
• sensitivity: (not specified in text)
• shutter_speed: (not specified in text)
• power_consumption: (not specified in text)
• noise: (not specified in text)

Applications & Benefits

• cell_imaging: (not specified in text)
• benefits: (not specified in text)

Supporting Organizations

• supported_by: Program of Shanghai Rising-star (19QA1401100)

Manuscript Details

• publication_date: 17-19 June 2019

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • publication_date

Processed JSON Filename

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