Nonstationary Noise Responses Of Some Fully Differential Onchip Readout Circuits Suitable For Cmos Image Sensors

• doi: 10.1109/82.809532
• title: Non-stationary noise responses of some fully differential on-chip readout circuits suitable for CMOS image sensors
• publisher: IEEE
• isbn:
• issn: 1558-125X
• rank: 3135
• access_type: LOCKED
• content_type: Journals
• abstract: CMOS active-pixel image sensors, as well as charge-coupled devices, generate both white noise and 1/f/sup /spl alpha//-noise over several decades depending on biasing current, operating temperature, and the characteristics of the process used, limiting the detector dynamic range. Three readout circuits, based on a fully differential cascode operational transconductance amplifier, designed and realized on a standard CMOS 0.7-/spl mu/m single polysilicon/double metal process, are proposed for CMOS active-pixel imagers. The first is an uncompensated switched capacitor (SC) voltage amplifier; the second, an offset compensated SC amplifier; and the third, a commutable bandpass filter. All three amplifiers allow correlated double sampling and double delta sampling for pixel and column fixed pattern noise suppression, respectively. The amplifiers offer up to 10-Mpixels/s readout rates. A detailed theoretical analysis of the amplifiers response to white noise and low-frequency excess noise is given, considering nonstationary nature of the output signals. An original method based on diffusive Markovian representation of 1/f/sup /spl alpha//-noise is used. The theoretical results are compared with experimental data.
• article_number: 809532
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=809532
• html_url: https://ieeexplore.ieee.org/document/809532/
• abstract_url: https://ieeexplore.ieee.org/document/809532/
• publication_title: IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
• conference_location:
• conference_dates:
• publication_number: 82
• is_number: 17573
• publication_year: 1999
• publication_date: Dec. 1999
• start_page: 1461
• end_page: 1474
• citing_paper_count: 13
• citing_patent_count: 0
• download_count: 593
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • CMOS process
    • White noise
    • Image sampling
    • Signal sampling
    • Low-frequency noise
    • CMOS image sensors
    • Image sensors
    • Character generation
    • Temperature dependence
    • Temperature distribution
  • dynamic_index_terms:
    • Non-stationary
    • Image Sensor
    • Camera Sensor
    • Readout Circuit
    • Non-stationary Noise
    • Differential Readout
    • Readout Of Differentiation
    • White Noise
    • Low-frequency Noise
    • Voltage Amplifier
    • Double Sampling
    • Impedance
    • Resistivity
    • Discretion
    • Transfer Function
    • Brownian Motion
    • Random Motion
    • Brownian Diffusion
    • Equation Of State
    • Noise Sources
    • Rise Time
    • Noise Power
    • Pixel Level
    • Stochastic Equations
    • Stochastic Differential Equations
    • Input Noise
    • Integrated Circuit Design
    • IC Design
    • Microchip Design
    • Low Pixel
    • Feedback Circuit
    • polySia
    • Polysilicon
    • Polycrystalline Silicon
    • Discrete Process
    • Intrinsic Noise
    • Intrinsic Stochasticity
    • Intrinsic Randomness
• authors:
  • Author Name: Y. Degerli
    Affiliation: The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/38348452900
    ID: 38348452900
    Order: 1
    Author Affiliations:
    • The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France
  • Author Name: F. Lavernhe
    Affiliation: The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37355398900
    ID: 37355398900
    Order: 2
    Author Affiliations:
    • The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France
  • Author Name: P. Magnan
    Affiliation: The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37400751600
    ID: 37400751600
    Order: 3
    Author Affiliations:
    • The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France
  • Author Name: J. Farre
    Affiliation: The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France
    Author URL: https://ieeexplore.ieee.org/author/37355408000
    ID: 37355408000
    Order: 4
    Author Affiliations:
    • The CIMI Research Group, Department of Electronics, Ecole Nationale Superieure de L''Aeronautique et de l''ESpace, Toulouse, France

Image Sensor

• sensor_type: CMOS
• resolution: 256x256
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: up to 10 Mpixels/s
• noise: characterized by white and 1/f noise

Applications & Benefits

• cell_imaging: optimized for low-light levels and active pixel imaging
• benefits: lower cost, higher pixel readout rates, random accessibility, lower power consumption, integration capabilities

Supporting Organizations

• supported_by: CIMI Research Group, Ecole Nationale Supérieure de l’Aéronautique et de l'Espace (SUPAERO)

Manuscript Details

• publication_date: Dec. 1999

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • design considerations like microlenses, color filters, global or rolling shutters, backside illumination

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