Noise Power Spectrum Estimation Of Column Fixed Pattern Noise In Cmos Image Sensors Based On Ar Model

• doi: 10.1109/PHM-Qingdao46334.2019.8943035
• title: Noise Power Spectrum Estimation of Column Fixed Pattern Noise in CMOS Image Sensors Based on AR Model
• publisher: IEEE
• isbn: 978-1-7281-0862-9
• issn:
• rank: 3119
• access_type: LOCKED
• content_type: Conferences
• abstract: CMOS image sensors are extensively utilized in digital imaging systems for their excellent performance and low power consumption. As an essential components in the system, CMOS image sensors are expected with low noise levels. The images captured by CMOS image sensor contain random noise (RN), digital noise (DN), and fixed pattern noise (FPN). FPN of CMOS image sensors has a greater impact on the perceived image quality than random noise, which seriously restricts the development and application of CMOS image sensors. This paper proposed a noise power spectrum (NPS) method for estimating column FPN of CMOS image sensor based on AR model. First, dozens of images under uniform illumination are acquired by established test vehicle. Second, random noise of the images is restrained by using the multi-frame averaging method. Then, column FPN is modeled by an autoregressive (AR) random process subsequently. Ultimately, column FPN is estimated by calculating NPS of the image based on the AR model. A case application was proposed by using this method.
• article_number: 8943035
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8943035
• html_url: https://ieeexplore.ieee.org/document/8943035/
• abstract_url: https://ieeexplore.ieee.org/document/8943035/
• publication_title: 2019 Prognostics and System Health Management Conference (PHM-Qingdao)
• conference_location: Qingdao, China
• conference_dates: 25-27 Oct. 2019
• publication_number: 8936048
• is_number: 8942805
• publication_year: 2019
• publication_date: 25-27 Oct. 2019
• start_page: 1
• end_page: 5
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 434
• insert_date: 20191227
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Mathematical model
    • Semiconductor device modeling
    • Light fields
    • Standards
  • author_terms:
    • CMOS image sensor
    • noise power spectrum
    • column FPN
    • AR model
    • noise
    • images
  • dynamic_index_terms:
    • Autoregressive Model
    • AR Model
    • Autoregressive Process
    • Image Sensor
    • Camera Sensor
    • Noise Power Spectrum
    • Fixed Pattern Noise
    • Fixed-pattern Noise
    • Imaging System
    • Image Quality
    • Random Noise
    • Channel Noise
    • Low Noise Levels
    • Test Vehicle
    • Perceptual Image Quality
    • Exposure Time
    • Light Source
    • Autocorrelation Function
    • Optical Power
    • Lens Power
    • Refractive Power
    • Light Field
    • Uniform Field
    • Light System
    • Power Meter
    • Imaging Variables
    • Uniform Light
    • Optical Power Meter
    • Uniform System
    • Noisy Images
    • Autoregressive Model Of Order
    • White Noise Sequence
    • White-noise Sequence
    • Sensor Values
    • Temporal Noise
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-7281-0862-9, isbnType: New-2005
  • format: USB ISBN, value: 978-1-7281-0860-5, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-7281-0861-2, isbnType: New-2005
• authors:
  • Author Name: Ting Yu
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37087137297
    ID: 37087137297
    Order: 1
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • Author Name: Guicui Fu
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37709761000
    ID: 37709761000
    Order: 2
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • Author Name: Yao Qiu
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37086178597
    ID: 37086178597
    Order: 3
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China
  • Author Name: Ye Wang
    Affiliation: School of Reliability and Systems Engineering, Beihang University, Beijing, China
    Author URL: https://ieeexplore.ieee.org/author/37086325308
    ID: 37086325308
    Order: 4
    Author Affiliations:
    • School of Reliability and Systems Engineering, Beihang University, Beijing, China

Image Sensor

• sensor_type: CMOS
• resolution: 2048x2048
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: not specified

Supporting Organizations

• supported_by: Fund of China (Grant No. 1707WK0013)

Manuscript Details

• publication_date: 25-27 Oct. 2019

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits

Processed JSON Filename

request_42510263-abe9-49a1-9cf7-034521c5f142-noise_power_spectrum_estimation_of_column_fixed_pattern_noise_in_cmos_image_sensors_based_on_ar_model.json