Noise Performance Improvements Of 2Layer Transistor Pixel Stacked Cmos Image Sensor With Nondoped Pixelfinfets

• doi: 10.23919/VLSITechnologyandCir57934.2023.10185422
• title: Noise Performance Improvements of 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Non-doped Pixel-FinFETs
• publisher: IEEE
• isbn: 979-8-3503-4669-5
• issn: 0743-1562
• rank: 3118
• access_type: LOCKED
• content_type: Conferences
• abstract: For the first time, 2-Fin non-doped Pixel-Fin field-effect-transistors are introduced into a 2-Layer Transistor Pixel stacked CMOS image sensor for better noise performance. Thanks to the non-doped channel and wider channel width, a 2.42-time transconductance improvement, 15% random noise and 99.3% random telegraph signal reductions are obtained.
• article_number: 10185422
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10185422
• html_url: https://ieeexplore.ieee.org/document/10185422/
• abstract_url: https://ieeexplore.ieee.org/document/10185422/
• publication_title: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
• conference_location: Kyoto, Japan
• conference_dates: 11-16 June 2023
• publication_number: 10185199
• is_number: 10185158
• publication_year: 2023
• publication_date: 11-16 June 2023
• start_page: 1
• end_page: 2
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 949
• insert_date: 20230724
• index_terms:
  • ieee_terms:
    • Performance evaluation
    • Impurities
    • Field effect transistors
    • Noise reduction
    • Prototypes
    • CMOS image sensors
    • Very large scale integration
  • dynamic_index_terms:
    • Noise Performance
    • Random Noise
    • Channel Width
    • Pixel Size
    • Fabrication Process
    • Increase In Width
    • Gate Oxide
    • Device Concept
    • 2nd Layer
    • Taper Angle
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-4669-5, isbnType: New-2005
  • format: Electronic ISBN, value: 978-4-86348-806-9, isbnType: New-2005
• authors:
  • Author Name: Y. Kikuchi
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089925911
    ID: 37089925911
    Order: 1
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: M. Tomita
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089925257
    ID: 37089925257
    Order: 2
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: T. Hayashi
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089927384
    ID: 37089927384
    Order: 3
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: H. Chiba
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089925521
    ID: 37089925521
    Order: 4
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: T. Ogita
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088731972
    ID: 37088731972
    Order: 5
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: T. Okawa
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089926527
    ID: 37089926527
    Order: 6
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: K. Nishida
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089923326
    ID: 37089923326
    Order: 7
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: M. Sugimoto
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089926629
    ID: 37089926629
    Order: 8
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: D. Yoneyama
    Affiliation: Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088728533
    ID: 37088728533
    Order: 9
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
  • Author Name: T. Umeki
    Affiliation: Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089923524
    ID: 37089923524
    Order: 10
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
  • Author Name: H. Oishi
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089923688
    ID: 37089923688
    Order: 11
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: S. Miyake
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089927370
    ID: 37089927370
    Order: 12
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: K. Hiramatsu
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089325080
    ID: 37089325080
    Order: 13
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: H. Kumano
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089324011
    ID: 37089324011
    Order: 14
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: H. Kawashima
    Affiliation: Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37329175700
    ID: 37329175700
    Order: 15
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
  • Author Name: N. Yamada
    Affiliation: Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089925155
    ID: 37089925155
    Order: 16
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
  • Author Name: M. Tamura
    Affiliation: Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089922931
    ID: 37089922931
    Order: 17
    Author Affiliations:
    • Sony Semiconductor Manufacturing Corporation, 1883-43, Tsukuba-machi, Isahaya, Nagasaki, Japan
  • Author Name: H. Ohnuma
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089326912
    ID: 37089326912
    Order: 18
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
  • Author Name: K. Tatani
    Affiliation: Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37086017179
    ID: 37086017179
    Order: 19
    Author Affiliations:
    • Sony Semiconductor Solutions Corporation, 4-14-1 Asahi-cho, Atsugi, Kanagawa, Japan

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: 0.6 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• noise: improvements in random noise (RN) by 15%, 99.3% reduction in random telegraph signal (RTS)

Applications & Benefits

• cell_imaging: Applicable in digital imaging applications in smartphones, medical devices, and automotive systems.
• benefits: Noise performance improvements, better signal quality due to increased transconductance (gm) and reduction in random noise.

Supporting Organizations

• supported_by: Sony Semiconductor Solutions Corporation, Sony Semiconductor Manufacturing Corporation

Manuscript Details

• publication_date: 11-16 June 2023

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_1430ce75-4049-44e4-9c9b-05157a064248-noise_performance_improvements_of_2layer_transistor_pixel_stacked_cmos_image_sensor_with_nondoped_pixelfinfets.json