Noise Model Of Indirectfeedback Sigmadelta Image Sensors
- doi: 10.1109/ISCAS.2013.6572311
-
title: Noise model of indirect-feedback sigma-delta
image sensors
- publisher: IEEE
- isbn: 978-1-4673-5761-6
- issn: 2158-1525
- rank: 3123
- access_type: LOCKED
- content_type: Conferences
-
abstract: A novel architecture for a CMOS image sensor
that incorporates a column-level sigma-delta (ΣΔ) analog-to-digital
converter is presented. An indirect-feedback readout architecture where
the digital output of the ΣΔ modulator is accumulated by a digital
counter and converted to an analog voltage that serves as the reference
voltage to which the buffered photodiode voltage is compared is shown. A
time-domain pixel simulator that enables assessment of major noise
contributors in this type of imager is also presented. Theoretical
calculations align with simulation results, showing a minimum readout
noise of 2.18e- and a dynamic range of over 100dB. A prototype chip has
been developed in TSMC's 0.35-μm technology and its performance will be
assessed.
- article_number: 6572311
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6572311
-
html_url:
https://ieeexplore.ieee.org/document/6572311/
-
abstract_url:
https://ieeexplore.ieee.org/document/6572311/
-
publication_title: 2013 IEEE International Symposium on
Circuits and Systems (ISCAS)
- conference_location: Beijing, China
- conference_dates: 19-23 May 2013
- publication_number: 6560459
- is_number: 6571764
- publication_year: 2013
- publication_date: 19-23 May 2013
- start_page: 2195
- end_page: 2198
- citing_paper_count: 1
- citing_patent_count: 0
- download_count: 227
- insert_date: 20130801
-
index_terms:
-
ieee_terms:
- Noise
- Integrated circuit modeling
- Photodiodes
- Image sensors
- Time-domain analysis
- Quantization (signal)
- Thermal noise
-
author_terms:
- Indirect-feedback ΣΔ image sensor
- high dynamic range
- time-domain simulator
- noise modeling
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Noise Model
- Simulation Results
- Electron Counting
- Digital Counting
- Readout Noise
- Time Domain
- Random Generation
- Random Number Generator
- Low Light
- System Architecture
- Noise Sources
- Thermal Noise
- Current Noise
- Comparable Yields
- Comparator Output
- Comparison Of Yield
- Comparison Of Outputs
- Bitstream
- Binary Sequence
- Shot Noise
- Poisson Noise
- Dark Current
- Filter Response
- Quantization Noise
- Start-up Phase
- Test Chip
- Readout Circuit
- Indirect Feedback
- Indirect Readout
- Reset Voltage
- Noise Behavior
-
isbn_formats:
-
format: CD,
value: 978-1-4673-5761-6,
isbnType: New-2005
-
format: Print ISBN,
value: 978-1-4673-5760-9,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-4673-5762-3,
isbnType: New-2005
-
authors:
Image Sensor
- sensor_type: CMOS
- resolution: 128x128
- dynamic_range: over 100dB
- pixel_size: not specified
- dark_current: 1fA
Optical Data
- focal_length: not specified
- aperture: not specified
- field_of_view: not specified
- distortion: not specified
Performance Metrics
Applications & Benefits
- cell_imaging: low-light imaging applications
-
benefits: Excellent noise performance, faster readout,
lower power consumption
Supporting Organizations
Manuscript Details
- publication_date: 19-23 May 2013
Relevancy Score
- score: 10
-
missing_fields:
- pixel_size
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
- noise
Processed JSON Filename
request_a83b9997-692f-41fa-8213-1c65cf0063c0-noise_model_of_indirectfeedback_sigmadelta_image_sensors.json