Noise Analysis And Simulation Method For A Singleslope Adc With Cds In A Cmos Image Sensor

• doi: 10.1109/TCSI.2008.923434
• title: Noise Analysis and Simulation Method for a Single-Slope ADC With CDS in a CMOS Image Sensor
• publisher: IEEE
• isbn:
• issn: 1558-0806
• rank: 3115
• access_type: LOCKED
• content_type: Journals
• abstract: Many mixed-signal circuits are nonlinear time-varying systems whose noise estimation cannot be obtained from the conventional frequency domain noise simulation (FNS). Although the transient noise simulation (TNS) supported by a commercial simulator takes into account nonlinear time-varying characteristics of the circuit, its simulation time is unacceptably long to obtain meaningful noise estimation results. Since the single-slope analog-to-digital converter with correlated double sampling (CDS/SS-ADC) in a CMOS image sensor (CIS) is composed of several operation phases in which the circuit topologies are different from each other, the noise cannot be estimated by the conventional FNS. This paper presents a noise estimation method for the CDS/SS-ADC that uses the FNS results while the transient noise behavior is taken into account. The proposed method provides noise estimation results closer to that of the TNS than the conventional FNS, whereas the simulation time is about the same as that of the FNS.
• article_number: 4490283
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4490283
• html_url: https://ieeexplore.ieee.org/document/4490283/
• abstract_url: https://ieeexplore.ieee.org/document/4490283/
• publication_title: IEEE Transactions on Circuits and Systems I: Regular Papers
• conference_location:
• conference_dates:
• publication_number: 8919
• is_number: 4684845
• publication_year: 2008
• publication_date: Nov. 2008
• start_page: 2980
• end_page: 2987
• citing_paper_count: 39
• citing_patent_count: 0
• download_count: 4927
• insert_date: 20080418
• index_terms:
  • ieee_terms:
    • Image analysis
    • Analytical models
    • CMOS image sensors
    • Circuit noise
    • Circuit simulation
    • Time varying systems
    • Frequency estimation
    • Frequency domain analysis
    • Analog-digital conversion
    • Image sampling
  • author_terms:
    • CMOS image sensor
    • correlated double sampling
    • noise observation time
    • noise simulation
    • single-slope ADC
    • CMOS image sensor
    • correlated double sampling
    • noise observation time
    • noise simulation
    • single-slope ADC
  • dynamic_index_terms:
    • Noise Analysis
    • Simulated Noise
    • Simulation Time
    • Noise Estimation
    • Transient Simulation
    • Commercial Simulation
    • Conventional Domain
    • Noise Behavior
    • Effect Of Noise
    • Stochastic Events
    • Stochastic Effects
    • Observation Time
    • Total Power
    • Sample Holder
    • Power Spectral Density
    • Spectral Function
    • Noise Sources
    • Noise Power
    • Noise Spectrum
    • Colored Noise
    • Circuit Simulation
    • Clock Frequency
    • Choice Of Time
    • Total Noise
    • Noise Power Spectral Density
    • Phase Ramp
    • Pixel Noise
    • Wide-sense Stationary
    • Covariance Stationary
    • Weak Stationarity
    • Input-referred Noise
    • Flicker Noise
    • Circuit Behavior
    • Equivalent Power
    • Phase Time
    • Linear Time-invariant
• authors:
  • Author Name: Jimin Cheon
    Affiliation: Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37579920800
    ID: 37579920800
    Order: 1
    Author Affiliations:
    • Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea
  • Author Name: Gunhee Han
    Affiliation: Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37270066200
    ID: 37270066200
    Order: 2
    Author Affiliations:
    • Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• signal_to_noise_ratio: lower than CCD
• power_consumption: low power consumption (specific value not provided)

Applications & Benefits

• cell_imaging: used in CMOS image sensors for digital imaging applications
• benefits: low cost, flexible system integration, and low power consumption

Supporting Organizations

• supported_by: Ministry of Information and Communications, Korea; Samsung Electronics Co., Ltd.

Manuscript Details

• publication_date: Nov. 2008

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • noise

Processed JSON Filename

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