New Method Of Onsensor Ad Conversion

• doi: 10.1109/ISCAS.2001.922363
• title: New method of on-sensor A/D conversion
• publisher: IEEE
• isbn: 0-7803-6685-9
• issn:
• partnum: 01CH37196
• rank: 3111
• access_type: LOCKED
• content_type: Conferences
• abstract: We describe a CMOS image sensor with column parallel Analog to Digital Conversion circuits. In this method, we use small 1 bit comparator which detects each bit during integration 8 bit value is determined when the integration is finished. Consequently, both the A/D conversion and the integration of the pixel value can be done in parallel. We have designed a prototype by using column parallel architecture. The prototype outputs analog value and 8 bit digital value of pixel data. It has 32/spl times/16 pixels and digital memory for each pixel. We describe the processing scheme of our ADC and the circuit and layout design of the prototype. We show results of some experiments.
• article_number: 922363
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=922363
• html_url: https://ieeexplore.ieee.org/document/922363/
• abstract_url: https://ieeexplore.ieee.org/document/922363/
• publication_title: ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems (Cat. No.01CH37196)
• conference_location: Sydney, NSW, Australia
• conference_dates: 6-9 May 2001
• publication_number: 7344
• is_number: 19936
• publication_year: 2001
• publication_date: 6-9 May 2001
• start_page: 818
• end_page: 821 vol. 4
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 74
• insert_date: 20020807
• index_terms:
  • ieee_terms:
    • Circuit simulation
  • dynamic_index_terms:
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Image Sensor
    • Camera Sensor
    • Circuit Design
    • Digital Memory
    • Converter Circuit
    • Results Of Method
    • Integration Time
    • Random Noise
    • Channel Noise
    • Most Significant Bit
    • High Bit
    • Highest Bit
    • Processing Circuit
• isbn_formats:
  • format: Print ISBN, value: 0-7803-6685-9, isbnType: Historical
• authors:
  • Author Name: T. Hamamoto
    Affiliation: Dept. of Elec. Eng., Science University of Tokyo, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37285218100
    ID: 37285218100
    Order: 1
    Author Affiliations:
    • Dept. of Elec. Eng., Science University of Tokyo, Tokyo, Japan
  • Author Name: T. Wakamatsu
    Affiliation: Dept. of Elec. Eng., Science University of Tokyo, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087215515
    ID: 37087215515
    Order: 2
    Author Affiliations:
    • Dept. of Elec. Eng., Science University of Tokyo, Tokyo, Japan
  • Author Name: K. Aizawa
    Affiliation: Dept. of Fron. Infor, University of Tokyo, Bunkyo-ku, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37335828200
    ID: 37335828200
    Order: 3
    Author Affiliations:
    • Dept. of Fron. Infor, University of Tokyo, Bunkyo-ku, Tokyo, Japan

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Not specified
• benefits: Not specified

Supporting Organizations

• supported_by: Not specified

Manuscript Details

• publication_date: 6-9 May 2001

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits
  • supported_by
  • authors
  • publication_date

Processed JSON Filename

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