New Error Sensitivity Model For The Analog Hardware Implementation Of Inner Products

• doi: 10.1109/ICIP.2006.313138
• title: New Error Sensitivity Model for the Analog Hardware Implementation of Inner Products
• publisher: IEEE
• isbn: 1-4244-0481-9
• issn: 2381-8549
• rank: 3104
• access_type: LOCKED
• content_type: Conferences
• abstract: We propose a new model for the analysis of the sensitivity of inner products to analog hardware implementation. This model is based on spice simulations of the circuits to be implemented, and is useful for the design of image compression systems for CMOS imaging sensors. By means of numerical simulations, the new model is compared with a previous simplified model, and shown to be equivalent to this previous model for 4-bit precision. For 6-bit precision, the results differ from the theoretical predictions made by the previous model. Image compression results are presented.
• article_number: 4107284
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4107284
• html_url: https://ieeexplore.ieee.org/document/4107284/
• abstract_url: https://ieeexplore.ieee.org/document/4107284/
• publication_title: 2006 International Conference on Image Processing
• conference_location: Atlanta, GA, USA
• conference_dates: 8-11 Oct. 2006
• publication_number: 4106439
• is_number: 4106440
• publication_year: 2006
• publication_date: 8-11 Oct. 2006
• start_page: 3333
• end_page: 3336
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 34
• insert_date: 20070220
• index_terms:
  • ieee_terms:
    • Hardware
    • Image coding
    • Semiconductor device modeling
    • CMOS image sensors
    • Multilayer perceptrons
    • Circuit simulation
    • Optical imaging
    • Vector quantization
    • Pixel
    • Image converters
  • author_terms:
    • Image coding
    • Vector quantization
    • Multilayer perceptrons
    • CMOS analog integrated circuits
  • dynamic_index_terms:
    • Hardware Implementation
    • Implementation Of Production
    • Analog Hardware
    • Image Sensor
    • Camera Sensor
    • Image Compression
    • SPICE Simulations
    • Neural Network
    • Theoretical Framework
    • Theoretical Model
    • Quantum
    • Mean Square Error
    • Mean Square Deviation
    • Aspect Ratio
    • Fabrication Process
    • Input Vector
    • Multilayer Perceptron
    • Focal Plane
    • Back Focal Plane
    • Matrix Multiplication
    • Multiple Matrices
    • Matrix-vector Multiplication
    • Multiple Matrix
    • Production Operations
    • Self-organizing Map
    • Kohonen
    • Output Error
    • Drain Current
    • Vector Quantization
    • Mean Opinion Score
    • Pixel Block
    • Compression Quality
    • Error Scenarios
    • Average Luminance
• isbn_formats:
  • format: CD, value: 1-4244-0481-9, isbnType: Historical
  • format: Print ISBN, value: 1-4244-0480-0, isbnType: Historical
• authors:
  • Author Name: Jose Gabriel R.C. Gomes
    Affiliation: Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37285881800
    ID: 37285881800
    Order: 1
    Author Affiliations:
    • Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil
  • Author Name: Marcos J.C. de Mello
    Affiliation: Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37088624310
    ID: 37088624310
    Order: 2
    Author Affiliations:
    • Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil
  • Author Name: Hugo L. Haas
    Affiliation: Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37287002600
    ID: 37287002600
    Order: 3
    Author Affiliations:
    • Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil
  • Author Name: Antonio Petraglia
    Affiliation: Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil
    Author URL: https://ieeexplore.ieee.org/author/37270882400
    ID: 37270882400
    Order: 4
    Author Affiliations:
    • Electrical Engineering Department Analog and Digital Signal Processing Laboratory, Federal University of Rio de Janeiro/COPPE, Rio de Janeiro, Brazil

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Image compression systems for CMOS imaging sensors
• benefits: Enables digital imaging in various applications such as smartphones, medical devices, and automotive systems.

Supporting Organizations

• supported_by: Federal University of Rio de Janeiro, COPPE/Electrical Engineering Department

Manuscript Details

• publication_date: 8-11 Oct. 2006

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

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