Neutron Radiation Hardness Of Singlephoton Avalanche Diodes For Future Rich Detectors

• doi: 10.1109/NSSMICRTSD49126.2023.10337871
• title: Neutron radiation hardness of single-photon avalanche diodes for future RICH detectors
• publisher: IEEE
• isbn: 979-8-3503-3867-6
• issn: 1082-3654
• rank: 3102
• access_type: LOCKED
• content_type: Conferences
• abstract: The next generation of experiments in high energy particle physics will require a large increase in interaction density, which presents a challenge for particle detectors. Ring imaging Cherenkov detectors (RICH), planned for future upgrades of the LHCb, Belle II and ALICE 3 experiments, will have to operate at increased channel occupancy and background radiation, and currently no photodetector can fulfill all planned requirements. Analog silicon photomultipliers (SiPMs) would be an attractive photodetector candidate, if only their radiation hardness could be improved. To achieve the targeted radiation tolerance, as well as other RICH detector requirements, dedicated developments and a combination of radiation damage reduction and mitigation techniques are needed. We propose a dedicated digital analog SiPM design, achieving the required radiation hardness by using compensating electronics to adjust the sensor response, together with an optimized single-photon avalanche diode (SPAD) array architecture. In order to guide future SPAD designs, we studied the performance of 180 nm actively recharged CMOS SPADs irradiated with neutron fluxes up to 1012 1-MeV neutron equivalent/cm2. We report on dark count rates and afterpulsing probability before and after irradiation, with results also for room temperature annealing and cooling down to -60°C.
• article_number: 10337871
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10337871
• html_url: https://ieeexplore.ieee.org/document/10337871/
• abstract_url: https://ieeexplore.ieee.org/document/10337871/
• publication_title: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD)
• conference_location: Vancouver, BC, Canada
• conference_dates: 4-11 Nov. 2023
• publication_number: 10337770
• is_number: 10337807
• publication_year: 2023
• publication_date: 4-11 Nov. 2023
• start_page: 1
• end_page: 1
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 51
• insert_date: 20231213
• index_terms:
  • ieee_terms:
    • Photomultipliers
    • Temperature distribution
    • Radiation effects
    • Semiconductor detectors
    • Neutrons
    • Photodetectors
    • Silicon
  • dynamic_index_terms:
    • Radiation Tolerance
    • Radiation Hardness
    • Neutron Irradiation
    • Neutron Radiation
    • Avalanche Diode
    • Single-photon Avalanche Diode
    • Background Radiation
    • Ambient Radiation
    • Radiation Environment
    • Generation Experiments
    • Propagation Experiments
    • Neutron Flux
    • Neutron Fluence
    • Silicon Photomultiplier
    • SiPM
    • Array Architecture
    • Dark Count Rate
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-3867-6, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3503-3866-9, isbnType: New-2005
• authors:
  • Author Name: R. Dolenec
    Affiliation: Jožef Stefan Institute, Ljubljana, Slovenia
    Author URL: https://ieeexplore.ieee.org/author/37398052700
    ID: 37398052700
    Order: 1
    Author Affiliations:
    • Jožef Stefan Institute, Ljubljana, Slovenia
    • Department of Physics, University of Ljubljana, Ljubljana, Slovenia
  • Author Name: M.-L. Wu
    Affiliation: École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/880724552788243
    ID: 880724552788243
    Order: 2
    Author Affiliations:
    • École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
  • Author Name: C. Bruschini
    Affiliation: École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/363051070183476
    ID: 363051070183476
    Order: 3
    Author Affiliations:
    • École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
  • Author Name: E. Charbon
    Affiliation: École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/168748694264189
    ID: 168748694264189
    Order: 4
    Author Affiliations:
    • École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
  • Author Name: D. Consuegra Rodríguez
    Affiliation: Jožef Stefan Institute, Ljubljana, Slovenia
    Author URL: https://ieeexplore.ieee.org/author/192688330030586
    ID: 192688330030586
    Order: 5
    Author Affiliations:
    • Jožef Stefan Institute, Ljubljana, Slovenia
  • Author Name: F. Gramuglia
    Affiliation: École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/172068583102245
    ID: 172068583102245
    Order: 6
    Author Affiliations:
    • École Polytechnique Fédérale de Lausanne, Neuchâtel, Neuchâtel, Switzerland
  • Author Name: P. Križan
    Affiliation: Jožef Stefan Institute, Ljubljana, Slovenia
    Author URL: https://ieeexplore.ieee.org/author/37375352600
    ID: 37375352600
    Order: 7
    Author Affiliations:
    • Jožef Stefan Institute, Ljubljana, Slovenia
    • Department of Physics, University of Ljubljana, Ljubljana, Slovenia
  • Author Name: A. Seljak
    Affiliation: Jožef Stefan Institute, Ljubljana, Slovenia
    Author URL: https://ieeexplore.ieee.org/author/38016778300
    ID: 38016778300
    Order: 8
    Author Affiliations:
    • Jožef Stefan Institute, Ljubljana, Slovenia
  • Author Name: R. Pestotnik
    Affiliation: Jožef Stefan Institute, Ljubljana, Slovenia
    Author URL: https://ieeexplore.ieee.org/author/37272229700
    ID: 37272229700
    Order: 9
    Author Affiliations:
    • Jožef Stefan Institute, Ljubljana, Slovenia
  • Author Name: S. Korpar
    Affiliation: Jožef Stefan Institute, Ljubljana, Slovenia
    Author URL: https://ieeexplore.ieee.org/author/37278107000
    ID: 37278107000
    Order: 10
    Author Affiliations:
    • Jožef Stefan Institute, Ljubljana, Slovenia
    • Faculty of Chemistry and Chemical Engineering, University of Maribor, Maribor, Slovenia

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

Applications & Benefits

• cell_imaging: not specified
• benefits: not specified

Supporting Organizations

• supported_by: Swiss National Science Foundation

Manuscript Details

• publication_date: 4-11 Nov. 2023

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • cell_imaging
  • benefits

Processed JSON Filename

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