Mixedlevel Simulation Of Optoelectronic Devices

• doi: 10.1109/NUSOD.2016.7547050
• title: Mixed-level simulation of opto-electronic devices
• publisher: IEEE
• isbn: 978-1-4673-8604-3
• issn: 2158-3242
• rank: 3015
• access_type: LOCKED
• content_type: Conferences
• abstract: Presented here are two important devices that cannot be modeled accurately and/or tractably by a single simulation technique. Simulation flows to address each device are presented. The first is a patterned Light Emitting Diode (LED), the optical modeling of which requires a mixed-level simulation approach combining FDTD (or RCWA) and Ray Tracing. The second is a CMOS Image Sensors (CIS), which requires process, optical and electrical simulation techniques.
• article_number: 7547050
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7547050
• html_url: https://ieeexplore.ieee.org/document/7547050/
• abstract_url: https://ieeexplore.ieee.org/document/7547050/
• publication_title: 2016 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)
• conference_location: Sydney, NSW, Australia
• conference_dates: 11-15 July 2016
• publication_number: 7537195
• is_number: 7546886
• publication_year: 2016
• publication_date: 11-15 July 2016
• start_page: 101
• end_page: 102
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 133
• insert_date: 20160818
• index_terms:
  • ieee_terms:
    • Semiconductor device modeling
    • Semiconductor process modeling
    • Optical imaging
    • Optical sensors
    • Finite difference methods
    • Time-domain analysis
    • Atmospheric modeling
  • dynamic_index_terms:
    • Simulation Process
    • Finite-difference Time-domain
    • FDTD
    • Finite-difference Time-domain Method
    • Ray Tracing
    • Optical Simulation
    • Electric Simulation
    • Flow Simulation
    • Complex Refractive Index
    • Complex Refractive Indices
    • Extraction Ratio
    • Rigorous Techniques
    • Doping Profile
    • Ray-tracing Simulations
    • Incoherent Source
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-4673-8604-3, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4673-8603-6, isbnType: New-2005
• authors:
  • Author Name: M. Bahl
    Affiliation: Synopsys, Inc., USA
    Author URL: https://ieeexplore.ieee.org/author/37266374200
    ID: 37266374200
    Order: 1
    Author Affiliations:
    • Synopsys, Inc., USA
  • Author Name: E. Heller
    Affiliation: Synopsys, Inc., USA
    Author URL: https://ieeexplore.ieee.org/author/37322041500
    ID: 37322041500
    Order: 2
    Author Affiliations:
    • Synopsys, Inc., USA
  • Author Name: J. S. Ayubi-Moak
    Affiliation: Synopsys, Inc., USA
    Author URL: https://ieeexplore.ieee.org/author/38277798900
    ID: 38277798900
    Order: 3
    Author Affiliations:
    • Synopsys, Inc., USA
  • Author Name: W.-C. Ng
    Affiliation: Synopsys Inc, Mountain View, CA, US
    Author URL: https://ieeexplore.ieee.org/author/37087655380
    ID: 37087655380
    Order: 4
    Author Affiliations:
    • Synopsys Inc, Mountain View, CA, US
  • Author Name: R. Scarmozzino
    Affiliation: Synopsys Inc, Mountain View, CA, US
    Author URL: https://ieeexplore.ieee.org/author/37267792800
    ID: 37267792800
    Order: 5
    Author Affiliations:
    • Synopsys Inc, Mountain View, CA, US
  • Author Name: G. Letay
    Affiliation: Synopsys, LCC, Zurich, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37085872688
    ID: 37085872688
    Order: 6
    Author Affiliations:
    • Synopsys, LCC, Zurich, Switzerland
  • Author Name: L. Schneider
    Affiliation: Synopsys, LCC, Zurich, Switzerland
    Author URL: https://ieeexplore.ieee.org/author/37085873962
    ID: 37085873962
    Order: 7
    Author Affiliations:
    • Synopsys, LCC, Zurich, Switzerland

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: 2x2x5 µm³
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• shutter_speed: 10-110 µs

Applications & Benefits

• cell_imaging: The use of CMOS image sensors in applications like cell imaging is implied but not detailed.
• benefits: The advantages of CMOS image sensors include reduced power consumption and integration capabilities.

Supporting Organizations

• supported_by: Synopsys, Inc.

Manuscript Details

• publication_date: 11-15 July 2016

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • power_consumption
  • noise

Processed JSON Filename

request_9210349e-44bc-4d9f-b70c-077aaad210c8-mixedlevel_simulation_of_optoelectronic_devices.json