Mismatch Reduction For Dark Current Suppression

• doi: 10.1109/ICSENS.2010.5689925
• title: Mismatch reduction for dark current suppression
• publisher: IEEE
• isbn: 978-1-4244-8168-2
• issn: 1930-0395
• partnum: 10CH38272
• rank: 3013
• access_type: LOCKED
• content_type: Conferences
• abstract: In this paper we present a dark current suppression technique for low-light image sensor arrays fabricated in a standard CMOS process. It has been shown that reducing the reverse bias of a p-n junction minimizes the thermally generated dark current and increases the signal to noise ratio. While this work well for single sensors, arrays of sensors suffer from mismatch, which limits the ability to apply a consistent junction bias. In this work we show simulation results for a floating gate mismatch compensation technique which reduces this biasing mismatch. While simulations of an idealized structure provided a 40X reduction in mismatch compensation, a worst case simulation provided only a 6X reduction in mismatch. For the idealized simulation, the standard deviation of the input referred mismatch was reduced from 7.7 mV to 196 μV, while in the worst case simulation the standard deviation of the input referred mismatch was reduced to 1.4 mV, corresponding to an approximate dark current reduction of 10X and 5X respectively.
• article_number: 5689925
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5689925
• html_url: https://ieeexplore.ieee.org/document/5689925/
• abstract_url: https://ieeexplore.ieee.org/document/5689925/
• publication_title: SENSORS, 2010 IEEE
• conference_location: Waikoloa, HI, USA
• conference_dates: 1-4 Nov. 2010
• publication_number: 5678851
• is_number: 5689839
• publication_year: 2010
• publication_date: 1-4 Nov. 2010
• start_page: 1696
• end_page: 1700
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 275
• insert_date: 20110120
• index_terms:
  • ieee_terms:
    • Pixel
    • Dark current
    • Logic gates
    • Noise
    • Tunneling
    • Photodiodes
    • Transistors
  • dynamic_index_terms:
    • Dark Current
    • Dark Current Suppression
    • Image Sensor
    • Camera Sensor
    • Sensor Array
    • Thermal Power Plants
    • Thermal Generation
    • Thermal Plants
    • P-n Junction
    • Monte Carlo Simulation
    • Monte Carlo Method
    • Noise Sources
    • Photomultiplier Tube
    • Voltage Difference
    • Voltage Deviation
    • Training Sequences
    • Non-volatile Memory
    • Hot Electrons
    • Hot Carriers
    • Training Cycle
    • Charge Injection
    • Start Of Cycle
    • Start Of Each Cycle
    • Bias Conditions
    • Analog Output
    • Transimpedance Amplifier
    • Mode Of Integration
    • Net Current
    • Tunneling Process
    • Global Bias
    • Offset Correction
    • Reset Voltage
    • Hot Injection
    • Gate Electrode
    • Mapping Bias
    • Function Of Bias
• isbn_formats:
  • format: Online ISBN, value: 978-1-4244-8168-2, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-8170-5, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4244-8169-9, isbnType: New-2005
• authors:
  • Author Name: David Sander
    Affiliation: School of Electrical and Computer Engineering, University of Maryland, MD, USA
    Author URL: https://ieeexplore.ieee.org/author/37270818900
    ID: 37270818900
    Order: 1
    Author Affiliations:
    • School of Electrical and Computer Engineering, University of Maryland, MD, USA
  • Author Name: Pamela Abshire
    Affiliation: School of Electrical and Computer Engineering, University of Maryland, MD, USA
    Author URL: https://ieeexplore.ieee.org/author/37270824500
    ID: 37270824500
    Order: 2
    Author Affiliations:
    • School of Electrical and Computer Engineering, University of Maryland, MD, USA

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Minimized through offset correction technique

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• signal_to_noise_ratio: Maximized despite marginally lower quantum efficiency
• noise: Reset noise, readout noise, environmental noise, thermally generated dark current

Applications & Benefits

• cell_imaging: Suitable for lab-on-a-chip applications as an alternative to photo-multiplier tubes (PMTs)
• benefits: Low-cost, rugged, high sensitivity, low noise, and improved noise performance

Supporting Organizations

• supported_by: University of Maryland

Manuscript Details

• publication_date: 1-4 Nov. 2010

Relevancy Score

• score: 9
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_7957e8af-e65b-4005-83f5-20010ee46970-mismatch_reduction_for_dark_current_suppression.json