Microscale 3D Capacitance Tomography With A Cmos Sensor Array

• doi: 10.1109/BioCAS58349.2023.10388576
• title: Microscale 3-D Capacitance Tomography with a CMOS Sensor Array
• publisher: IEEE
• isbn: 979-8-3503-0027-7
• issn: 2163-4025
• rank: 3005
• access_type: LOCKED
• content_type: Conferences
• abstract: Electrical capacitance tomography (ECT) is a nonoptical imaging technique in which a map of the interior permittivity of a volume is estimated by making capacitance measurements at its boundary and solving an inverse problem. While previous ECT demonstrations have often been at centimeter scales, ECT is not limited to macroscopic systems. In this paper, we demonstrate ECT imaging of polymer microspheres and bacterial biofilms using a CMOS microelectrode array, achieving spatial resolution of 10 microns. Additionally, we propose a deep learning architecture and an improved multi-objective training scheme for reconstructing out-of-plane permittivity maps from the sensor measurements. Experimental results show that the proposed approach is able to resolve microscopic 3-D structures, achieving 91.5% prediction accuracy on the microsphere dataset and 82.7% on the biofilm dataset, including an average of 4.6% improvement over baseline computational methods.
• article_number: 10388576
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10388576
• html_url: https://ieeexplore.ieee.org/document/10388576/
• abstract_url: https://ieeexplore.ieee.org/document/10388576/
• publication_title: 2023 IEEE Biomedical Circuits and Systems Conference (BioCAS)
• conference_location: Toronto, ON, Canada
• conference_dates: 19-21 Oct. 2023
• publication_number: 10388488
• is_number: 10388438
• publication_year: 2023
• publication_date: 19-21 Oct. 2023
• start_page: 1
• end_page: 5
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 365
• insert_date: 20240118
• index_terms:
  • ieee_terms:
    • Training
    • Biofilms
    • Permittivity measurement
    • Deep architecture
    • Electrical capacitance tomography
    • Polymers
    • Spatial resolution
  • author_terms:
    • tomography
    • 3-D
    • capacitance
    • ECT
    • CMOS
    • biofilm
    • deep learning
    • transposed convolution
  • dynamic_index_terms:
    • CMOS Sensor Array
    • Deep Learning
    • Microspheres
    • Microbeads
    • Measure Of Capacity
    • Unit Capacity
    • Capacitance Measurements
    • Inverse Problem
    • Forward Problem
    • Microelectrode Arrays
    • Multi-electrode Array
    • Electrical Tomography
    • Electrical Imaging
    • Loss Function
    • Loss-of-function
    • Confocal Microscopy
    • Confocal Images
    • Image Reconstruction
    • Iterative Reconstruction
    • Tomographic Reconstruction
    • Intersection Over Union
    • Jaccard Similarity
    • Jaccard Distance
    • Jaccard Index
    • Batch Normalization
    • Capacitance Values
    • Capacity Values
    • Peak Signal-to-noise Ratio
    • PSNR
    • Focal Loss
    • Loss Of Focus
    • Ground Truth Image
    • Chip Surface
    • Electrical Impedance Tomography
    • Electrical Resistivity Tomography
    • Dice Loss
    • Transposed Convolution Layers
    • Structural Similarity Index Measure
    • Smooth L1 Loss
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3503-0027-7, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3503-0026-0, isbnType: New-2005
• authors:
  • Author Name: Manar Abdelatty
    Affiliation: Brown University, Providence, RI, USA
    Author URL: https://ieeexplore.ieee.org/author/37088835184
    ID: 37088835184
    Order: 1
    Author Affiliations:
    • Brown University, Providence, RI, USA
  • Author Name: Joseph Incandela
    Affiliation: Boston University, Boston, MA, USA
    Author URL: https://ieeexplore.ieee.org/author/37089382844
    ID: 37089382844
    Order: 2
    Author Affiliations:
    • Boston University, Boston, MA, USA
  • Author Name: Kangping Hu
    Affiliation: Brown University, Providence, RI, USA
    Author URL: https://ieeexplore.ieee.org/author/37087111690
    ID: 37087111690
    Order: 3
    Author Affiliations:
    • Brown University, Providence, RI, USA
  • Author Name: Joseph W. Larkin
    Affiliation: Boston University, Boston, MA, USA
    Author URL: https://ieeexplore.ieee.org/author/37089383122
    ID: 37089383122
    Order: 4
    Author Affiliations:
    • Boston University, Boston, MA, USA
  • Author Name: Sherief Reda
    Affiliation: Brown University, Providence, RI, USA
    Author URL: https://ieeexplore.ieee.org/author/37087988065
    ID: 37087988065
    Order: 5
    Author Affiliations:
    • Brown University, Providence, RI, USA
  • Author Name: Jacob K. Rosenstein
    Affiliation: Brown University, Providence, RI, USA
    Author URL: https://ieeexplore.ieee.org/author/37945044700
    ID: 37945044700
    Order: 6
    Author Affiliations:
    • Brown University, Providence, RI, USA

Image Sensor

• sensor_type: CMOS
• resolution: 512 × 256
• dynamic_range:
• pixel_size: 10 microns
• dark_current:

Optical Data

• focal_length:
• aperture:
• field_of_view:
• distortion:

Performance Metrics

• frame_rate:
• signal_to_noise_ratio:
• sensitivity:
• shutter_speed:
• power_consumption:
• noise:

Applications & Benefits

• cell_imaging: Non-optical label-free 3-D monitoring of cell cultures.
• benefits: High spatial resolution of 10 microns, robustness to noise in experimental data.

Supporting Organizations

• supported_by: National Science Foundation under Grant No. 2027108; additional support from NIGMS 1R35GM142584-01 and Burroughs Wellcome Fund.

Manuscript Details

• publication_date: 19-21 Oct. 2023

Relevancy Score

• score: 9
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_1eff0fc0-8950-4be6-ab1b-74d423179171-microscale_3d_capacitance_tomography_with_a_cmos_sensor_array.json