Methods For Predicting Darkcurrent Distribution Of Cmos Image Sensor In Radiation Environment

• doi: 10.1109/ICSPCC.2016.7753687
• title: Methods for predicting dark-current distribution of CMOS image sensor in radiation environment
• publisher: IEEE
• isbn: 978-1-5090-2709-5
• issn:
• rank: 2995
• access_type: LOCKED
• content_type: Conferences
• abstract: Nowadays, CMOS image sensors are more and more used in a wide variety of applications, especially in satellite systems, where they are exposed to space radiation environment. In-orbit sensors suffer from radiation induced dark-current degradation that the dark-current mean value and non-uniformity increase, which results in the signal-to-noise-ratio decrease affecting the image quality. Based on the principle of radiation effects on semiconductor devices, this paper analyzes the ionizing and displacement damage effects in CMOS image sensors due to γ-rays and protons radiation, and proposes a method for dark-current distribution modeling in the mixed radiation environment. Simulation results proves that the proposed method is well adapted to predict the dark-current distributions for a device which is exposed to both γ-rays and protons radiation at the same time.
• article_number: 7753687
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7753687
• html_url: https://ieeexplore.ieee.org/document/7753687/
• abstract_url: https://ieeexplore.ieee.org/document/7753687/
• publication_title: 2016 IEEE International Conference on Signal Processing, Communications and Computing (ICSPCC)
• conference_location: Hong Kong, China
• conference_dates: 5-8 Aug. 2016
• publication_number: 7744430
• is_number: 7753583
• publication_year: 2016
• publication_date: 5-8 Aug. 2016
• start_page: 1
• end_page: 5
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 452
• insert_date: 20161124
• index_terms:
  • ieee_terms:
    • Protons
    • Degradation
    • Dark current
    • Radiation effects
    • CMOS image sensors
    • Neutrons
    • Data models
  • author_terms:
    • Dark-current distribution
    • Modeling
    • Protons
    • γ rays
    • Space radiation
  • dynamic_index_terms:
    • Background Radiation
    • Ambient Radiation
    • Radiation Environment
    • Modeling Method
    • Effects Of Radiation
    • Effects Of Radiotherapy
    • Effect Of Irradiation
    • Wide Variety Of Applications
    • Semiconductor Devices
    • CCD Camera
    • Charge-coupled Device
    • Probability Density Function
    • Photodiode
    • Depletion Region
    • Space Charge Region
    • Depletion Layer
    • Depletion Zone
    • Dose Concentration
    • Absorbed Dose
    • Total Ionizing Dose
    • Space Environment
    • Gamma Rays
    • Dark Current
    • Interface States
    • Interface Conditions
    • Space Applications
    • Dark Images
    • Design Knowledge
    • Design Cognition
    • Linear Energy Transfer
    • Pixel Array
    • Proton Energy
    • Ray Irradiation
    • Ray Radiation
    • Neutron Irradiation
    • Neutron Radiation
    • PIN Photodiode
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-5090-2709-5, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-5090-2708-8, isbnType: New-2005
• authors:
  • Author Name: Ran Zheng
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37087250458
    ID: 37087250458
    Order: 1
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
  • Author Name: Xiangli Hui
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37087988484
    ID: 37087988484
    Order: 2
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
  • Author Name: Jia Wang
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37087074434
    ID: 37087074434
    Order: 3
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
  • Author Name: Ruiguang Zhao
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37086205103
    ID: 37086205103
    Order: 4
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
  • Author Name: Xiaomin Wei
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37087987384
    ID: 37087987384
    Order: 5
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
  • Author Name: Yongcai Hu
    Affiliation: School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China
    Author URL: https://ieeexplore.ieee.org/author/37087987550
    ID: 37087987550
    Order: 6
    Author Affiliations:
    • School of Computer Science and Technology, Northwestern Polytechnical University, Xian, P.R. China

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: mean dark current increases and non-uniformity due to radiation exposure

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• signal_to_noise_ratio: decreases due to radiation-induced dark current degradation
• noise: temporal noise and fixed-pattern noise identified as noise sources

Applications & Benefits

• cell_imaging: used in medical imaging and other applications
• benefits: low cost, low power consumption, high speed, good performance on radiation tolerance

Supporting Organizations

• supported_by: National Natural Science Foundation of China, National Key Scientific Instrument and Equipment Development Project, Fundamental Research Funds for the Central Universities

Manuscript Details

• publication_date: 5-8 Aug. 2016

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_016f3dcf-217d-4a4b-9d09-e23b448da842-methods_for_predicting_darkcurrent_distribution_of_cmos_image_sensor_in_radiation_environment.json