Metamaterialbased Terahertz Imaging

• doi: 10.1109/TTHZ.2015.2463673
• title: Metamaterial-Based Terahertz Imaging
• publisher: IEEE
• isbn:
• issn: 2156-3446
• rank: 2993
• access_type: LOCKED
• content_type: Journals
• abstract: This paper presents the design of an innovative, low-cost, uncooled, metamaterial-based terahertz (THz) focal plane array (FPA). A single pixel is composed of a resonant metamaterial absorber and micro-bolometer sensor integrated in a standard 180 nm CMOS process. The metamaterial is made directly in the metallic and insulating layers available in the six metal layer CMOS foundry process. THz absorption is determined by the geometry of the metamaterial absorber which can be customized for different frequencies. The initial prototype consists of a 5 ×5 pixel array with a pixel size of 30 μm ×30 μm and is readily scalable to more commercially viable array sizes. The FPA imaging capability is demonstrated in a transmission and reflection mode experiment by scanning a metallic object hidden in a manila envelope.
• article_number: 7217855
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7217855
• html_url: https://ieeexplore.ieee.org/document/7217855/
• abstract_url: https://ieeexplore.ieee.org/document/7217855/
• publication_title: IEEE Transactions on Terahertz Science and Technology
• conference_location:
• conference_dates:
• publication_number: 5503871
• is_number: 7334623
• publication_year: 2015
• publication_date: Nov. 2015
• start_page: 892
• end_page: 901
• citing_paper_count: 52
• citing_patent_count: 0
• download_count: 1774
• insert_date: 20150821
• index_terms:
  • ieee_terms:
    • Arrays
    • Voltage measurement
    • CMOS integrated circuits
    • Absorption
    • Detectors
    • Imaging
    • Metals
  • author_terms:
    • Imaging
    • metamaterial
    • Terahertz
  • dynamic_index_terms:
    • Terahertz Imaging
    • Transmission Mode
    • Metal Layer
    • Reflection Mode
    • Imaging Capability
    • Single Pixel
    • Transmission Experiments
    • CMOS Process
    • Pixel Array
    • Metamaterial Absorber
    • Response Data
    • Ground Plane
    • Floor Plan
    • Spectral Response
    • Maximum Voltage
    • Voltage Difference
    • Voltage Deviation
    • Common Materials
    • Post Processing
    • Finite-difference Time-domain
    • FDTD
    • Finite-difference Time-domain Method
    • Incident Power
    • Lock-in Amplifier
    • Temperature Coefficient Of Resistance
    • Vanadium Oxide
    • Noise Equivalent Power
    • Device Thickness
    • Atmospheric Window
    • Quantum Cascade Lasers
    • Source Measure Unit
    • Bias Current
    • Bolometer
    • Standoff Distance
• authors:
  • Author Name: Ivonne Escorcia Carranza
    Affiliation: Microsystems Technology Group, University of Glasgow, Glasgow, Scotland, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37085412392
    ID: 37085412392
    Order: 1
    Author Affiliations:
    • Microsystems Technology Group, University of Glasgow, Glasgow, Scotland, U.K.
  • Author Name: James Grant
    Affiliation: Microsystems Technology Group, University of Glasgow, Glasgow, Scotland, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37393656300
    ID: 37393656300
    Order: 2
    Author Affiliations:
    • Microsystems Technology Group, University of Glasgow, Glasgow, Scotland, U.K.
  • Author Name: John Gough
    Affiliation: Texas Instruments, Greenock, Scotland, U.K.
    Author URL: https://ieeexplore.ieee.org/author/38557363600
    ID: 38557363600
    Order: 3
    Author Affiliations:
    • Texas Instruments, Greenock, Scotland, U.K.
  • Author Name: David R. S. Cumming
    Affiliation: Microsystems Technology Group, University of Glasgow, Glasgow, Scotland, U.K.
    Author URL: https://ieeexplore.ieee.org/author/37276149400
    ID: 37276149400
    Order: 4
    Author Affiliations:
    • Microsystems Technology Group, University of Glasgow, Glasgow, Scotland, U.K.

Image Sensor

• sensor_type: CMOS
• resolution: 30m x 30m per pixel
• dynamic_range: Not Specified
• pixel_size: 30µm x 30µm
• dark_current: Not Specified

Optical Data

• focal_length: Not Specified
• aperture: Not Specified
• field_of_view: Not Specified
• distortion: Not Specified

Performance Metrics

• frame_rate: Not Specified
• signal_to_noise_ratio: Not Specified
• sensitivity: Not Specified
• shutter_speed: Not Specified
• power_consumption: Not Specified
• noise: Not Specified

Applications & Benefits

• cell_imaging: Used in Terahertz imaging for non-destructive testing and material identification.
• benefits: Low-cost, room temperature operation, high sensitivity for various applications.

Supporting Organizations

• supported_by: Engineering and Physical Sciences Research Council (EPSRC), CONACyT—Mexico

Manuscript Details

• publication_date: Nov. 2015

Relevancy Score

• score: 8
• missing_fields:
  • dynamic_range
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise

Processed JSON Filename

request_0893fcda-9f9c-4134-bf55-df7eae5dd620-metamaterialbased_terahertz_imaging.json